TIDUF85A August   2024  – December 2024

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
      1. 2.1.1 Subsystems
        1. 2.1.1.1 Arc Detection Channels
          1. 2.1.1.1.1 Isolated Current Measurement
          2. 2.1.1.1.2 Band-Pass Filter
          3. 2.1.1.1.3 Analog-to-Digital Conversion
          4. 2.1.1.1.4 Arc Detection Using Embedded AI Models
        2. 2.1.1.2 Arc Labeling Circuit
          1. 2.1.1.2.1 Isolated String Voltage Measurement
          2. 2.1.1.2.2 Isolated Arc Voltage Measurement With Isolated Comparator
          3. 2.1.1.2.3 Window Comparator for Advanced Labeling
    2. 2.2 Design Considerations
      1. 2.2.1 Current Sensor and Input Stage
      2. 2.2.2 Analog Band-Pass Filter
      3. 2.2.3 Arc-Labeling Circuit
        1. 2.2.3.1 String Voltage Sensing
        2. 2.2.3.2 Arc Gap Voltage Sensing
        3. 2.2.3.3 Differential to Single-Ended Conversion
        4. 2.2.3.4 Window Comparator for Arc Labeling
      4. 2.2.4 Auxiliary Power Supply
      5. 2.2.5 controlCard and Debug Interface
    3. 2.3 Highlighted Products
      1. 2.3.1 TIEVM-ARC-AFE
      2. 2.3.2 TMDSCNCD28P55X – TMDSCNCD28P55X controlCARD Evaluation Module
        1. 2.3.2.1 Hardware Features
      3. 2.3.3 OPA4323 – Quad, 5.5V, 20MHz, Zero-Cross Low-Noise (6nV/√Hz) RRIO Operational Amplifier
      4. 2.3.4 OPA323 – Single, 5.5V, 20MHz, Zero-Cross Low-Noise (6nV/√Hz) RRIO Operational Amplifier
      5. 2.3.5 AMC3330 – ±1V Input, Precision Voltage Sensing Reinforced Isolated Amplifier With Integrated DC/DC
      6. 2.3.6 AMC23C11 – Fast-Response, Reinforced, Isolated Comparator With Adjustable Threshold and Latch Function
  9. 3Hardware, Testing Requirements, and Test Results
    1. 3.1 Signal Chain Verification
      1. 3.1.1 Hardware Requirements
      2. 3.1.2 Test Setup
      3. 3.1.3 Test Results
    2. 3.2 Arc Testing
  10. 4Design and Documentation Support
    1. 4.1 Design Files
      1. 4.1.1 Schematics
      2. 4.1.2 BOM
    2. 4.2 Tools and Software
    3. 4.3 Documentation Support
    4. 4.4 Support Resources
    5. 4.5 Trademarks
  11. 5About the Author
  12. 6Revision History

2.2.3 Arc-Labeling Circuit

The arc-labeling circuit consists of two isolated amplifiers, an isolated comparator, and an analog implemented window comparator. The arc-labeling circuit is design to gather and automatically label arc signatures in a controlled lab environment. The design uses the fact that in a lab environment, the string voltage and the arc gap voltage are available, which is not the case in the field. Figure 2-5 shows the typical arc test setup in the lab. An arc generator is used to generate reproducible arcs at different operating conditions. The relation between the arc gap voltage, which can be measured across the arc generator and string voltage is used as an indicator for an arc. This information is then used to label the data sampled by standard arc-detection signal chain. The labeled data then can be used to train an embedded AI model.

TIDA-010955 Block Diagram Arc Test Setup Figure 2-5 Block Diagram Arc Test Setup