The TMUX622x are complementary metal-oxide semiconductor (CMOS) switch in a
dual channel, 1:1 (SPST) configuration. The device works with a single supply
(4.5 V to 36 V), dual supplies (±4.5 V to ±18 V), or asymmetric supplies (such as VDD =
12 V, VSS = –5 V). The TMUX622x supports
bidirectional analog and digital signals on the source (Sx) and drain (D) pins
ranging from VSS to VDD.
The TMUX622x can be enabled or disabled by controlling the SEL pins,
turning on signal path 1 (S1 to D1) or signal path 2 (S2 to D2). All logic control
inputs support logic levels from 1.8 V to VDD, allowing for both TTL and
CMOS logic compatibility when operating in the valid supply voltage range. Fail-Safe Logic circuitry allows voltages on the control pins to be
applied before the supply pin, protecting the device from potential damage.
The TMUX622x is part of the precision switches and multiplexers family of
devices. These devices have very low on and off leakage currents, 50 pA, allowing
them to be used in high precision measurement applications.
The TMUX622x are complementary metal-oxide semiconductor (CMOS) switch in a
dual channel, 1:1 (SPST) configuration. The device works with a single supply
(4.5 V to 36 V), dual supplies (±4.5 V to ±18 V), or asymmetric supplies (such as VDD =
12 V, VSS = –5 V). The TMUX622x supports
bidirectional analog and digital signals on the source (Sx) and drain (D) pins
ranging from VSS to VDD.
The TMUX622x can be enabled or disabled by controlling the SEL pins,
turning on signal path 1 (S1 to D1) or signal path 2 (S2 to D2). All logic control
inputs support logic levels from 1.8 V to VDD, allowing for both TTL and
CMOS logic compatibility when operating in the valid supply voltage range. Fail-Safe Logic circuitry allows voltages on the control pins to be
applied before the supply pin, protecting the device from potential damage.
The TMUX622x is part of the precision switches and multiplexers family of
devices. These devices have very low on and off leakage currents, 50 pA, allowing
them to be used in high precision measurement applications.