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LM5066H

ACTIVO

Controlador avanzado de intercambio en caliente, 5.5 V a 90 V con monitoreo I/V/P e interfaz PMBu

Detalles del producto

Vabsmax_cont (V) 100 Vin (max) (V) 90 Vin (min) (V) 5.5 Features Adjustable OVLO, Adjustable current limit, Adjustable soft start, Current monitoring, Fault output, Overvoltage protection, PMBus, Power good signal, Short circuit protection, adjustable UVLO Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry, Latch-off Overvoltage response Cut-off Rating Catalog Soft start Adjustable Quiescent current (Iq) (typ) (A) 0.00436 Device type eFuses and hot swap controllers Operating temperature range (°C) -40 to 125
Vabsmax_cont (V) 100 Vin (max) (V) 90 Vin (min) (V) 5.5 Features Adjustable OVLO, Adjustable current limit, Adjustable soft start, Current monitoring, Fault output, Overvoltage protection, PMBus, Power good signal, Short circuit protection, adjustable UVLO Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry, Latch-off Overvoltage response Cut-off Rating Catalog Soft start Adjustable Quiescent current (Iq) (typ) (A) 0.00436 Device type eFuses and hot swap controllers Operating temperature range (°C) -40 to 125
HTSSOP (PWP) 28 62.08 mm² 9.7 x 6.4
  • Input operating voltage range: 5.5V to 90V
    • 100V absolute maximum rating
    • Withstands negative voltages up to –5V at output
  • Adjustable ILIM thresholds from 10mV to 50mV
  • Programmable FET SOA protection
  • Programmable overcurrent blanking with digital timer
  • Strong gate pull down (1.5A) for fast turn OFF
  • Robust short-circuit protection
    • Fast trip response (270ns)
    • Immune to supply line transients
  • LM5066H2 with additional features
    • Dual gate drive for high power applications
    • SYNC pin for parallel controller operation
    • Soft start capacitor disconnect
  • Failed FET detection
  • Programable UV, OV, tFAULT thresholds
  • External FET temperature sensing
  • Failed FET detection
  • PMBus® interface for telemetry, control, configuration and debug
    • On chip EEPROM nonvolatile memory for configuration
    • Precision VIN, VOUT, IIN, PIN, VAUX monitoring V (<±1%); I (<±1%); P (<±1.75%)
    • Power cycle with a single command
    • Blackbox fault recording of multiple events with relative time stamp stored in internal EEPROM
  • 12-bit ADC with 250kHz sampling rate
  • Supports energy monitoring via Read_EIN command
  • External FET temperature sensing
  • Input operating voltage range: 5.5V to 90V
    • 100V absolute maximum rating
    • Withstands negative voltages up to –5V at output
  • Adjustable ILIM thresholds from 10mV to 50mV
  • Programmable FET SOA protection
  • Programmable overcurrent blanking with digital timer
  • Strong gate pull down (1.5A) for fast turn OFF
  • Robust short-circuit protection
    • Fast trip response (270ns)
    • Immune to supply line transients
  • LM5066H2 with additional features
    • Dual gate drive for high power applications
    • SYNC pin for parallel controller operation
    • Soft start capacitor disconnect
  • Failed FET detection
  • Programable UV, OV, tFAULT thresholds
  • External FET temperature sensing
  • Failed FET detection
  • PMBus® interface for telemetry, control, configuration and debug
    • On chip EEPROM nonvolatile memory for configuration
    • Precision VIN, VOUT, IIN, PIN, VAUX monitoring V (<±1%); I (<±1%); P (<±1.75%)
    • Power cycle with a single command
    • Blackbox fault recording of multiple events with relative time stamp stored in internal EEPROM
  • 12-bit ADC with 250kHz sampling rate
  • Supports energy monitoring via Read_EIN command
  • External FET temperature sensing

The LM5066Hx provides robust protection and precision monitoring for 12V, 24V and 48V systems with programmable UV, OV, ILIM, and fast short-circuit protection for customized input power applications. Programmable power limit threshold along with adjustable fault timer (tFAULT) limits maximum power dissipation and ensures FET SOA protection under all conditions including startup and fault events. Two level overcurrent blanking with digital timers allows higher load transients to pass, enabling lower current limit settings and reducing requirements for strong SOA MOSFETs.

An integrated PMBus® interface enables remote monitoring, control, and configuration of the system in real time. Key parameters can be accessed remotely for telemetry, and various thresholds can be configured through PMBus or stored in internal EEPROM. The fast, accurate analog load current monitor supports predictive maintenance and dynamic power management including Intel PSYS and PROCHOT functionality to optimize server performance. A blackbox fault recording feature helps in debugging field failures.

The LM5066H2 features dual gate drive architecture which enables use of a single strong SOA FET to handle power stress during startup and fault conditions, combined with multiple small low RDS(ON) FETs for normal load current operation, reducing the total solution size. The devices are characterized for operation over a junction temperature range of –40°C to +125°C.

The LM5066Hx provides robust protection and precision monitoring for 12V, 24V and 48V systems with programmable UV, OV, ILIM, and fast short-circuit protection for customized input power applications. Programmable power limit threshold along with adjustable fault timer (tFAULT) limits maximum power dissipation and ensures FET SOA protection under all conditions including startup and fault events. Two level overcurrent blanking with digital timers allows higher load transients to pass, enabling lower current limit settings and reducing requirements for strong SOA MOSFETs.

An integrated PMBus® interface enables remote monitoring, control, and configuration of the system in real time. Key parameters can be accessed remotely for telemetry, and various thresholds can be configured through PMBus or stored in internal EEPROM. The fast, accurate analog load current monitor supports predictive maintenance and dynamic power management including Intel PSYS and PROCHOT functionality to optimize server performance. A blackbox fault recording feature helps in debugging field failures.

The LM5066H2 features dual gate drive architecture which enables use of a single strong SOA FET to handle power stress during startup and fault conditions, combined with multiple small low RDS(ON) FETs for normal load current operation, reducing the total solution size. The devices are characterized for operation over a junction temperature range of –40°C to +125°C.

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Documentación técnica

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Tipo Título Fecha
* Data sheet LM5066Hx 5.5V to 90V, Advanced Hotswap Controller With I/V/P Monitoring and PMBus® Interface datasheet (Rev. A) PDF | HTML 22 dic 2025

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

LM5066H1EVM — LM5066H1 evaluation module

This user’s guide describes the LM5066H1EVM. The LM5066H1EVM contains evaluation and reference circuitry for the LM5066H1 hot-swap controller. The LM5066H1 device combines a high-performance hot-swap controller with a PMBus interface to accurately measure, protect, and control the electrical (...)
Guía del usuario: PDF
GUI para el módulo de evaluación (EVM)

LM5066HXEVM-GUI LM5066Hx evaluation module GUI

The GUI allows the customer to configure, control, and view telemetry data from the LM5066H1 and LM5066H2 Hot-Swap controllers
Productos y hardware compatibles

Productos y hardware compatibles

Productos
Controladores de intercambio en caliente
LM5066H Controlador avanzado de intercambio en caliente, 5.5 V a 90 V con monitoreo I/V/P e interfaz PMBu
Desarrollo de hardware
Placa de evaluación
LM5066H1EVM LM5066H1 evaluation module
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® para TI es un entorno de diseño y simulación que ayuda a evaluar la funcionalidad de los circuitos analógicos. Esta completa suite de diseño y simulación utiliza un motor de análisis analógico de Cadence®. Disponible sin ningún costo, PSpice para TI incluye una de las bibliotecas de modelos (...)
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
HTSSOP (PWP) 28 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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