データシート
SN74AHC04-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of 55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree

- EPIC (Enhanced-Performance Implanted CMOS) Process
- Operating Range 2-V to 5.5-V VCC
- ESD Protection Exceeds 1500 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0)
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
EPIC is a trademark of Texas Instruments.
The SN74AHC04 contains six independent inverters. This device performs the Boolean function Y = A\.
技術資料
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| 上位の文書 | タイプ | タイトル | フォーマットオプション | 最新の英語版をダウンロード | 日付 | |
|---|---|---|---|---|---|---|
| * | データシート | SN74AHC04-EP データシート (Rev. A) | 2003/09/03 | |||
| * | VID | SN74AHC04-EP VID V6203646 | 2016/06/21 |