首頁 邏輯和電壓轉換 邏輯閘 AND 閘
首頁
邏輯和電壓轉換
邏輯閘
AND 閘

SN74AC08-EP

停產

增強型產品 4 通道、2 輸入、2V 至 6V 高速 (7 ns) 24mA 驅動強度 AND 閘

立即訂購
產品規格表

SN74AC08-EP

停產
產品規格表 立即訂購

產品詳細資料

Technology family AC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of −55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree†
  • 2-V to 6-V V CC Operation
  • Inputs Accept Voltages to 6 V
  • Max t pd of 7.5 ns at 5 V

(1)† Component qualification in accordance with JEDEC and industry standards to provide reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of −55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree†
  • 2-V to 6-V V CC Operation
  • Inputs Accept Voltages to 6 V
  • Max t pd of 7.5 ns at 5 V

(1)† Component qualification in accordance with JEDEC and industry standards to provide reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AC08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = A + B in positive logic.

The SN74AC08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = A + B in positive logic.
filter 尋找其它 AND 閘
下載

技術文件

找不到結果。請清除您的搜尋條件，然後再試一次。
檢視所有 3
重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN74AC08-EP Quadruple 2-Input Positive-and Gate datasheet (Rev. A) PDF | HTML 2023/6/28
* 輻射及可靠性報告 SN74AC08MDREP Reliability Report 2012/6/4
* VID SN74AC08-EP VID V6204615 2016/6/21

訂購與品質