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NAND 閘

SN74AHC00-EP

現行

增強型產品 4 通道、2 輸入、2-V 至 5.5-V NAND 閘

立即訂購
產品規格表

SN74AHC00-EP

現行
產品規格表 立即訂購

產品詳細資料

Technology family AHC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Input type Standard CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AHC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Input type Standard CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm) SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

The SN74AHC00 performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.

The SN74AHC00 performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.
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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 Quadruple 2-Input Positive-NAND Gate datasheet 2002/7/23
* 輻射及可靠性報告 SN74AHC00MDREP Reliability Report 2016/8/9
* VID SN74AHC00-EP VID V6203604 2016/6/21

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