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SN74AHC00-EP

現行

增強型產品 4 通道、2 輸入、2-V 至 5.5-V NAND 閘

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產品規格表

SN74AHC00-EP

現行
產品規格表 立即訂購

產品詳細資料

Technology family AHC Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Input type Standard CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AHC Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Input type Standard CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 14 51.9 mm² 8.65 x 6 TSSOP (PW) 14 32 mm² 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

The SN74AHC00 performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.

The SN74AHC00 performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.
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SN74LV4T00-EP 現行 具有整合式位準移位器的強化型產品四通道雙輸入 NAND 閘 Voltage range (1.65V to 5.5V), voltage translation capable

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類型 標題 日期
* Radiation & reliability report SN74AHC00MDREP Reliability Report 2016年 8月 9日
* Data sheet Quadruple 2-Input Positive-NAND Gate datasheet 2002年 7月 23日

訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點

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