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SN74HC02-EP

現行

強化型產品 4 通道、2 輸入、2V 至 6V NOR 閘

立即訂購
產品規格表

SN74HC02-EP

現行
產品規格表 立即訂購

產品詳細資料

Technology family HC Number of channels 4 Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Inputs per channel 2 IOL (max) (mA) 4 IOH (max) (mA) -4 Output type Push-Pull Input type Standard CMOS Features High speed (tpd 10- 50ns) Data rate (max) (Mbps) 28 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
Technology family HC Number of channels 4 Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Inputs per channel 2 IOL (max) (mA) 4 IOH (max) (mA) -4 Output type Push-Pull Input type Standard CMOS Features High speed (tpd 10- 50ns) Data rate (max) (Mbps) 28 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
TSSOP (PW) 14 32 mm² 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 20-µA Max ICC
  • Typical tpd = 8 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 20-µA Max ICC
  • Typical tpd = 8 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74HC02 contains four independent 2-input NOR gates. It performs the Boolean function Y = (A + B)\ or Y = A\ • B\ in positive logic.

The SN74HC02 contains four independent 2-input NOR gates. It performs the Boolean function Y = (A + B)\ or Y = A\ • B\ in positive logic.
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類型 標題 日期
* Radiation & reliability report SN74HC02QPWREP Reliability Report 2013年 9月 5日
* Data sheet SN74HC02-EP datasheet (Rev. A) 2004年 1月 6日

訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點

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