TPS7H3014-SP
- Radiation performance:
- Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100krad(Si)
- Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75MeV-cm2/mg
- Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75MeV-cm2/mg
- Wide supply IN voltage range (VIN): 3V to 14V
- Sequence and monitor up to 4 voltage rails with a single device
- Daisy chain capability for extended channel count
- Single resistor programmable global timers for:
- Sequence up and down delay
- Sequence up time to regulation
- Reverse order sequence down
- Precision threshold voltage and hysteresis current
- VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
- IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
- Push-Pull outputs with programmable pull-up voltage between 1.6V to 7V
- Global ENx pull-up domain (VPULL_UP1)
- Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
- FAULT open drain output for monitoring of state machine induced faults
- Available in military (–55°C to 125°C) temperature range
The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.
An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R23201VXC.
技術文件
| 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | TPS7H3014-SP Radiation-Hardness-Assured, 14V, 4-Channel Sequencer datasheet | PDF | HTML | 2024年 1月 17日 |
| * | Radiation & reliability report | TPS7H3014-SP Total Ionizing Dose (TID) Report | 2024年 4月 4日 | |
| * | Radiation & reliability report | TPS7H3014-SP Look Ahead Total Ionizing Dose (TID) Report | PDF | HTML | 2024年 2月 20日 |
| More literature | TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) | 2023年 8月 31日 | ||
| Application note | QML flow, its importance, and obtaining lot information (Rev. C) | 2023年 8月 30日 | ||
| Application note | Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) | PDF | HTML | 2022年 11月 17日 | |
| Selection guide | TI Space Products (Rev. I) | 2022年 3月 3日 | ||
| Application note | DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer | 2020年 8月 21日 | ||
| E-book | Radiation Handbook for Electronics (Rev. A) | 2019年 5月 21日 |
設計與開發
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TPS7H3014EVM-CVAL — TPS7H3014-SP 評估模組
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
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|---|---|---|
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訂購與品質
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