SLUSG35 August   2026 TPS12S24F-Q1

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 SPI Timing Requirements
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Power Supply Input
      2. 7.3.2 Charge Pump and Gate Driver Output (VS, GATEx, BSTx, SRCx)
      3. 7.3.3 Driving Capacitive, Resistive and Inductive Loads
        1. 7.3.3.1 Capacitive Load Driving
          1. 7.3.3.1.1 Using SCP Based Auto-Retry Method (GATEx):
          2. 7.3.3.1.2 Using Main Path Gate Slew Rate Control Method (GATEx, SRCx):
          3. 7.3.3.1.3 Using PWM Control Method (GATEx):
        2. 7.3.3.2 Resistive or Inductive Load Driving
      4. 7.3.4 Protection Mechanisms
        1. 7.3.4.1 I2T Based Overcurrent and Short-Circuit Protection
        2. 7.3.4.2 NTC-Based External FET Over-Temperature Protection
        3. 7.3.4.3 Device Junction Overtemperature Warning
        4. 7.3.4.4 Input Undervoltage and Overvoltage Protection
        5. 7.3.4.5 External FET Drain to Source Voltage (VDS) Overvoltage Protection
        6. 7.3.4.6 Bi-VDS Based Short-Circuit Protection
        7. 7.3.4.7 Reverse Polarity Protection
        8. 7.3.4.8 Loss of Ground
      5. 7.3.5 Diagnostic Mechanisms
        1. 7.3.5.1 ADC Sense Signals
        2. 7.3.5.2 Analog and Digital Current Monitor (VIMONx)
        3. 7.3.5.3 Input Supply Voltage Measurement
        4. 7.3.5.4 Output Voltage Measurement
        5. 7.3.5.5 External FET Temperature Measurement
        6. 7.3.5.6 External FET Bi-Directional Drain to Source (Bi-VDS) Measurement
        7. 7.3.5.7 Controller Temperature Measurement
        8. 7.3.5.8 VOUT Short-to-Battery or FET Short and Open-Load Detection
          1. 7.3.5.8.1 Measurement With Main FET (GATEx) Enabled
          2. 7.3.5.8.2 Detection With Main FET (GATEx) Disabled
        9. 7.3.5.9 VOUT Short-to-Battery or FET Short Detection For Power At All Times (PAAT) Loads
      6. 7.3.6 Fault Indication (FLT / WAKE)
      7. 7.3.7 Output Disable (OUT_DISx) Function
      8. 7.3.8 Brief Supply Interruptions Behaviour
      9. 7.3.9 SPI Mode Operation
    4. 7.4 Device Functional Modes
      1. 7.4.1 State Diagram
      2. 7.4.2 Power Down
      3. 7.4.3 Sleep Mode
      4. 7.4.4 Config or Active Mode (AM)
      5. 7.4.5 Low Power Mode (LPM)
      6. 7.4.6 Limphome Mode
    5. 7.5 TPS12S24F-Q1 Pre-Production Silicon Limitations
      1. 7.5.1 SDO Pin Tristate Discrete Workaround (Only for parallel SPI configuration not for daisy chain)
  9. 8 Register Maps
    1. 8.1 TPS12S24F-Q1 Registers
    2. 8.2 EEPROM (NVM) Overview
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Driving Power at All Times (PAAT) Loads With Automatic Load Wakeup and Output Bulk Capacitor Charging
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
    3. 9.3 System Examples
      1. 9.3.1 TPS12S24F-Q1 System Level Configurations
    4. 9.4 Power Supply Recommendations
      1. 9.4.1 Transient and EMI/EMC Recommendations
    5. 9.5 Layout
      1. 9.5.1 Layout Guidelines
      2. 9.5.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Receiving Notification of Documentation Updates
    2. 10.2 Support Resources
    3. 10.3 Trademarks
    4. 10.4 Electrostatic Discharge Caution
    5. 10.5 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Tape and Reel Information
    2. 12.2 Mechanical Data

7.3.4.3 Device Junction Overtemperature Warning

The device temperature is internally monitored and sensed temperature is stored in ADC_RESULT_TCONT. If the sensed controller temperature exceeds T(CONT_TSD_WRN) threshold then CHAN_OCP_I2T_TSD_OV and THERMAL_WRN_CHx is set '1' which can be read by MCU over SPI.