SLUSG35 August   2026 TPS12S24F-Q1

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 SPI Timing Requirements
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Power Supply Input
      2. 7.3.2 Charge Pump and Gate Driver Output (VS, GATEx, BSTx, SRCx)
      3. 7.3.3 Driving Capacitive, Resistive and Inductive Loads
        1. 7.3.3.1 Capacitive Load Driving
          1. 7.3.3.1.1 Using SCP Based Auto-Retry Method (GATEx):
          2. 7.3.3.1.2 Using Main Path Gate Slew Rate Control Method (GATEx, SRCx):
          3. 7.3.3.1.3 Using PWM Control Method (GATEx):
        2. 7.3.3.2 Resistive or Inductive Load Driving
      4. 7.3.4 Protection Mechanisms
        1. 7.3.4.1 I2T Based Overcurrent and Short-Circuit Protection
        2. 7.3.4.2 NTC-Based External FET Over-Temperature Protection
        3. 7.3.4.3 Device Junction Overtemperature Warning
        4. 7.3.4.4 Input Undervoltage and Overvoltage Protection
        5. 7.3.4.5 External FET Drain to Source Voltage (VDS) Overvoltage Protection
        6. 7.3.4.6 Bi-VDS Based Short-Circuit Protection
        7. 7.3.4.7 Reverse Polarity Protection
        8. 7.3.4.8 Loss of Ground
      5. 7.3.5 Diagnostic Mechanisms
        1. 7.3.5.1 ADC Sense Signals
        2. 7.3.5.2 Analog and Digital Current Monitor (VIMONx)
        3. 7.3.5.3 Input Supply Voltage Measurement
        4. 7.3.5.4 Output Voltage Measurement
        5. 7.3.5.5 External FET Temperature Measurement
        6. 7.3.5.6 External FET Bi-Directional Drain to Source (Bi-VDS) Measurement
        7. 7.3.5.7 Controller Temperature Measurement
        8. 7.3.5.8 VOUT Short-to-Battery or FET Short and Open-Load Detection
          1. 7.3.5.8.1 Measurement With Main FET (GATEx) Enabled
          2. 7.3.5.8.2 Detection With Main FET (GATEx) Disabled
        9. 7.3.5.9 VOUT Short-to-Battery or FET Short Detection For Power At All Times (PAAT) Loads
      6. 7.3.6 Fault Indication (FLT / WAKE)
      7. 7.3.7 Output Disable (OUT_DISx) Function
      8. 7.3.8 Brief Supply Interruptions Behaviour
      9. 7.3.9 SPI Mode Operation
    4. 7.4 Device Functional Modes
      1. 7.4.1 State Diagram
      2. 7.4.2 Power Down
      3. 7.4.3 Sleep Mode
      4. 7.4.4 Config or Active Mode (AM)
      5. 7.4.5 Low Power Mode (LPM)
      6. 7.4.6 Limphome Mode
    5. 7.5 TPS12S24F-Q1 Pre-Production Silicon Limitations
      1. 7.5.1 SDO Pin Tristate Discrete Workaround (Only for parallel SPI configuration not for daisy chain)
  9. 8 Register Maps
    1. 8.1 TPS12S24F-Q1 Registers
    2. 8.2 EEPROM (NVM) Overview
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Driving Power at All Times (PAAT) Loads With Automatic Load Wakeup and Output Bulk Capacitor Charging
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
    3. 9.3 System Examples
      1. 9.3.1 TPS12S24F-Q1 System Level Configurations
    4. 9.4 Power Supply Recommendations
      1. 9.4.1 Transient and EMI/EMC Recommendations
    5. 9.5 Layout
      1. 9.5.1 Layout Guidelines
      2. 9.5.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Receiving Notification of Documentation Updates
    2. 10.2 Support Resources
    3. 10.3 Trademarks
    4. 10.4 Electrostatic Discharge Caution
    5. 10.5 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Tape and Reel Information
    2. 12.2 Mechanical Data

Fault Indication (FLT / WAKE)

The device provides enhanced fault reporting through a FLT/WAKE status pin and fault status bits through SPI. The FLT/WAKE status pin allows the device to interrupt the system when a fault has occurred on the device. The FLT/WAKE status pin is an open drain output that asserts low when a fault occurs on the device. For faults which are read clear, the FLT/WAKE pin will go high if the fault no longer exists and the specific register to clear the fault is read. Indication on the FLT/WAKE pin can be masked for some faults through FAULT_MASK register. See the FAULT_MASK register for more details.

The device also provides fault information through SPI through a global fault register (FAULT_GLOBAL) and channel specific fault registers (FLT_STAT_CHx) to enable the system to quickly diagnose what caused the fault in the device. The device outputs the FAULT_GLOBAL [15:8] bits on the SDO header so these status bits can be continuously read in each SPI transaction.For more details on each of the individual fault status bits see the FAULT_GLOBAL and FLT_STAT_CHx registers in the register map.

When the device is in low power mode no fault information is available through the FLT/WAKE pin. If short circuit were to occur in LPM the device would protect itself then transition to ACTIVE mode and then will signal fault on the FLT/WAKE pin and in the fault status registers.

Table highlights how the device signals different events through the FLT/WAKE pin and the fault status bits.

Table 7-5 Fault Reporting

EVENT / FAULT

DETECTION

PROTECTION

(Gate drives turned OFF)

BIT FIELD NAME IN FAULT_GLOBAL REGISTER

BIT FIELD NAME IN FLT_STAT_CHx Register

OPTIONAL INDICATION ON FLT/WAKE PIN

BIT FIELD NAME IN

FAULT_MASK REGISTER

Input supply (VBB) UVLO

Yes

Yes

VBB_UVLO and GLOBAL_ERR_WRN

Yes unless masked

MASK_VBB_UVLO

Input supply (VBB) UVLO warning (V(CSx+) < 6V)

Yes

No

VBB_UV_WRN and GLOBAL_ERR_WRN

No

-

VDD UVLO

Yes

No

VDD_UVLO

-

Yes unless masked

MASK_VDD_UVLO

SPI Watchdog error

Yes

Transition to Limphome mode

WD_ERR

Yes unless masked

MASK_WD_ERR

SPI CRC/frame error

Yes

No

SPI_ERR

Yes unless masked

MASK_SPI_ERR

NVM CRC ERROR

Yes

Yes

NVM_CRC_ERR in BIST_RESULT register

Yes unless masked

MASK_NVM_CRC_ERR

POR

Yes

Yes

POR

Yes

Off state Open load fault

Yes

No

OL_SHRT_VBB_OFF_FLT and CHx_FLT

OL_OFF_CHx

Yes unless masked

MASK_OL_OFF

VOUT short to VBB fault

Yes

No

OL_SHRT_VBB_OFF_FLT and CHx_FLT

SHRT_VBB_CHx

Yes unless masked

MASK_SHRT_VBB

External FET Over-Temperature (TSD) Shutdown

Yes

Yes

CHAN_OCP_I2T_TSD_OV and CHx_FLT

THERMAL_SD_CHx

Yes unless masked

MASK_TSD

Bypass FET Over-Temperature Shutdown

Yes

Bypass FET turned OFF

Main FET turns ON

CHx_FLT

THERMAL_SD_BYP_CHx

Yes

-

Chip (controller) over temperature warning

Yes

No

THERMAL_WRN_CHx

Yes unless masked

TSD_CONT_FLT_EN bit in in DEV_CONFIG_2 register

Overvoltage on VBB

Yes

Yes

CHAN_OCP_I2T_TSD_OV

Yes unless masked

MASK_VBB_OVLO

VOUT shorted to ground (SCP)

Yes

Yes

CHAN_OCP_I2T_TSD_OV and CHx_FLT

OCP_CHx

Yes unless masked

MASK_OCP

I2T Protection

Yes

Yes

CHAN_OCP_I2T_TSD_OV and CHx_FLT

I2T_FLT_CHx

Yes unless masked

MASK_I2T_TRIP

Reverse battery (Reverse Polarity)

Yes

Yes

Yes unless masked

MASK_REV_POL_FLT

Charge pump undervoltage

Yes

Yes

CHx_FLT

CPUMP_UVLO_CHx

Yes unless masked

MASK_CPUMP_UVLO

Loss of device GND

Yes

Yes

No

No

-

Main FET (GATEx) ON/OFF after inrush duration

Yes

No

-

VOUT_ERR_CHx

No

-

Load wakeup

Yes

No

CHx_FLT

LPM_WAKE_CHx

Yes (Always available)

VOUT short to ground in LPM

Yes

Bypass FET turned OFF

Main FET turns ON

CHx_FLT

LPM_HS_CHx

Yes unless masked

MASK_LPM_HS

VDS overvoltage fault

Yes

Yes

CHx_FLT

VDS_FLT_CHx

Yes unless masked

MASK_VDS_FAULT

Main FET (GATEx) ON/OFF status

Yes

No

SW_STATE_M_CH1 in SW_STATE register

No

Limphome indication

Yes

Transition to Limphome mode

LIMPHOME_STAT

Yes unless masked

LIMPHOME_STAT_FLT_EN bit in DEV_CONFIG_3 register

OUT_DISx Indication

Yes

Yes

SW_STATE_M_CH1 in SW_STATE register

Yes

Load current change from forward to reverse direction indication

Yes

No

ISNS_POLARITY_CHx bit in ADC_RESULT_CHx_I

Yes unless masked

ISNS_POLARITY_FLT_EN bit in DEV_CONFIG_2 register

FAULT_GLOBAL [15:8] Bits:

The TPS12SxxF-Q1 device, outputs the FAULT_GLOBAL [15:8] bits on the SDO header so these status bits can be continuously read during each SPI transaction. The FAULT_GLOBAL [15:8] bits can be configured as read clear or real-time status bits based on the FLT_LTCH_DIS bit setting in the DEV_CONFIG register. The FLT_LTCH_DIS bit however does not apply to the LPM_STATUS bit.

If FLT_LTCH_DIS = 0, then the fault bits are latched and are cleared only when the associated register in the bit description is read and the fault no longer exists. Table below highlights which registers need to be read in order to clear each of the different fault bits if the fault no longer exists. This is also detailed in each of the bit descriptions in the register map.

Table 7-6 FAULT_GLOBAL[15:8] bits

BIT

BIT NAME

REGISTER WHICH NEEDS TO BE READ TO CLEAR THE FAULT BIT IF THE FAULT NO LONGER EXISTS

15

Reserved

N/A

14

VS_POR

FAULT_GLOBAL

13

CH2_FLT

FLT_STAT_CH2

12

CH1_FLT

FLT_STAT_CH1

11

LPM_STATUS

-

10

CHAN_OCP_I2T_TSD_OV

FLT_STAT_CHx

9

I2T_MOD

FLT_STAT_CHx

8

GLOBAL_ERR_WRN

FAULT_GLOBAL

If FLT_LTCH_DIS = 1, then the fault bits will not be latched and will clear when the fault no longer exists.