Radiation lot acceptance tested
(RLAT) to total ionizing dose (TID) of 50krad(Si)
Single-event transient (SET),
single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear
energy transfer (LET) = 43MeV-cm2/mg
Single-event transient (SET) and
single-event fault interrupt (SEFI) characterized up to (LET) =
43MeV-cm2/mg
200V e-mode GaN FET half bridge
15mΩRDS(ON) (typ)
100kHz to 2MHz operation
LGA package:
Thermally optimized 12mm × 9mm LGA
package with thermal pads
Integrated gate drive resistors
Low common source inductance
packaging
Electrically isolated high-side and
low-side
Flexible control for various half-bridge
and two switch power supply topologies
Low propagation delay
Two operational modes
Single PWM input with adjustable
dead time
Two independent inputs
Programmable dead time control
Selectable input interlock protection
in independent input mode