- Controlled baseline:
- One assembly
- One test site
- One fabrication site
- Extended temperature performance: –55°C to
+125°C
- Enhanced diminishing manufacturing sources (DMS)
support
- Enhanced product-change notification
- Qualification pedigree(1)
- Stable with no output capacitor or any value or
type of capacitor
- Input voltage range: 1.7V to 5.5V
- Ultra-low dropout voltage: 75mV typical
- Excellent load transient response (With or
without optional output capacitor)
- New NMOS topology delivers low reverse leakage
current
- Low noise: 30µVRMS typical (10Hz to 100kHz)
- Initial accuracy: 0.5%
- 1% Overall accuracy over line, load, and
temperature
- Less than 1µA max IQ in shutdown
mode
- Thermal shutdown and specified min/max current
limit protection
- Available in multiple output voltage versions:
- Fixed outputs: 1.2V to
3.3V
- Adjustable output: 1.2V
to 5.5V
- Custom outputs
available
(1)Component qualification in accordance with JEDEC and industry standards to
ensure reliable operation over an extended temperature range. This includes,
but is not limited to, Highly Accelerated Stress Test (HAST) or biased
85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification testing
should not be viewed as justifying use of this component beyond specified
performance and environmental limits.