SN54196

ACTIVO

Contadores/bloqueos binarios OR de década preajustables de 50 MHz, 30 MHz, 100 MHz

Detalles del producto

Technology family TTL Operating temperature range (°C) -55 to 125 Rating Military
Technology family TTL Operating temperature range (°C) -55 to 125 Rating Military
CDIP (J) 14 130.4652 mm² 19.56 x 6.67
  • Performs BCD, Bi-Quinary, or Binary Counting
  • Fully Programmable
  • Fully Independent Clear Input
  • Input Clamping Diodes Simplify System Design
  • Output QA Maintains Full Fan-out Capability In Addition to Driving Clock-2 Input

  • Performs BCD, Bi-Quinary, or Binary Counting
  • Fully Programmable
  • Fully Independent Clear Input
  • Input Clamping Diodes Simplify System Design
  • Output QA Maintains Full Fan-out Capability In Addition to Driving Clock-2 Input

These high-speed monolithic counters consist of four d-c coupled, master-slave flip-flops, which are internally interconnected to provide either a divide-by-two and a divide-by-five counter (’196, ’LS196, ’S196) or a divide-by-two and a divide-by-eight counter (’197, ’LS197, ’S197). These four counters are fully programmable; that is, the outputs may be preset to any state by placing a low on the count/load input and entering the desired data at the data inputs. The outputs will change to agree with the data inputs independent of the state of the clocks.

During the count operation, transfer of information to the outputs occurs on the negative-going edge of the clock pulse. These counters feature a direct clear which when taken low sets all outputs low regardless of the states of the clocks.

These counters may also be used as 4-bit latches by using the count/load input as the strobe and entering data at the data inputs. The outputs will directly follow the data inputs when the count/load is low, but will remain unchanged when the count/load is high and the clock inputs are inactive.

All inputs are diode-clamped to minimize transmission-line effects and simplify system design. These circuits are compatible with most TTL logic families. Series 54, 54LS, and 54S circuits are characterized for operation over the full military temperature range of -55°C to 125°C; Series 74, 74LS, and 74S circuits are characterized for operation from 0°C to 70°C.

These high-speed monolithic counters consist of four d-c coupled, master-slave flip-flops, which are internally interconnected to provide either a divide-by-two and a divide-by-five counter (’196, ’LS196, ’S196) or a divide-by-two and a divide-by-eight counter (’197, ’LS197, ’S197). These four counters are fully programmable; that is, the outputs may be preset to any state by placing a low on the count/load input and entering the desired data at the data inputs. The outputs will change to agree with the data inputs independent of the state of the clocks.

During the count operation, transfer of information to the outputs occurs on the negative-going edge of the clock pulse. These counters feature a direct clear which when taken low sets all outputs low regardless of the states of the clocks.

These counters may also be used as 4-bit latches by using the count/load input as the strobe and entering data at the data inputs. The outputs will directly follow the data inputs when the count/load is low, but will remain unchanged when the count/load is high and the clock inputs are inactive.

All inputs are diode-clamped to minimize transmission-line effects and simplify system design. These circuits are compatible with most TTL logic families. Series 54, 54LS, and 54S circuits are characterized for operation over the full military temperature range of -55°C to 125°C; Series 74, 74LS, and 74S circuits are characterized for operation from 0°C to 70°C.

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Documentación técnica

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Tipo Título Fecha
* Data sheet 50/30/100-MHz Presettable Decade Or Binary Counters/Latches datasheet (Rev. A) 14 may 2008

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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