產品詳細資料

Sample rate (max) (Msps) 3000 Resolution (Bits) 14 Number of input channels 2 Interface type JESD204B Analog input BW (MHz) 2300 Features High Dynamic Range, High Performance, Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 1.1 Power consumption (typ) (mW) 3500 SNR (dB) 65.5 ENOB (Bits) 10.5 SFDR (dB) 75 Operating temperature range (°C) -40 to 85 Input buffer No
Sample rate (max) (Msps) 3000 Resolution (Bits) 14 Number of input channels 2 Interface type JESD204B Analog input BW (MHz) 2300 Features High Dynamic Range, High Performance, Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 1.1 Power consumption (typ) (mW) 3500 SNR (dB) 65.5 ENOB (Bits) 10.5 SFDR (dB) 75 Operating temperature range (°C) -40 to 85 Input buffer No
VQFNP (RTD) 64 81 mm² 9 x 9
  • 14-Bit, dual channel 2.6 to 3-GSPS ADC
  • Noise spectral density:
    • NSD = -155.6 dBFS/Hz (no AVG)
    • NSD = -158.1 dBFS/Hz (2x AVG)
    • NSD = -160.4 dBFS/Hz (4x AVG)
  • Single core (non-interleaved) ADC architecture
  • Aperture jitter: 50 fs
  • Low close-in residual phase noise:
    • -127 dBc/Hz at 10 kHz offset
  • Spectral performance (f IN = 1 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 62.3 dBFS
    • SFDR HD2,3: 63 dBc
    • SFDR worst spur: 85 dBFS
  • Spectral performance (f IN = 1.8 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 63 dBFS
    • SFDR HD2,3: 68 dBc
    • SFDR worst spur: 86 dBFS
  • Input fullscale: 1.1 to 1.35 Vpp (2 to 3.5 dBm)
  • Code error rate (CER): 10 -15
  • Full power input bandwidth (-3 dB): 2.75 GHz
  • JESD204B serial data interface
    • Maximum lane rate: 13 Gbps
    • Supports subclass 1 deterministic latency
  • Digital down-converters
    • Up to four DDC per ADC channel
    • Complex output: 4x to 128x decimation
    • 48-bit NCO phase coherent frequency hopping
    • Fast frequency hopping: < 1 us
  • Power consumption: 2.6 W/channel (2x AVG)
  • Power supplies: 1.8 V, 1.2 V
  • 14-Bit, dual channel 2.6 to 3-GSPS ADC
  • Noise spectral density:
    • NSD = -155.6 dBFS/Hz (no AVG)
    • NSD = -158.1 dBFS/Hz (2x AVG)
    • NSD = -160.4 dBFS/Hz (4x AVG)
  • Single core (non-interleaved) ADC architecture
  • Aperture jitter: 50 fs
  • Low close-in residual phase noise:
    • -127 dBc/Hz at 10 kHz offset
  • Spectral performance (f IN = 1 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 62.3 dBFS
    • SFDR HD2,3: 63 dBc
    • SFDR worst spur: 85 dBFS
  • Spectral performance (f IN = 1.8 GHz, -4 dBFS):
    • 2x internal averaging
    • SNR: 63 dBFS
    • SFDR HD2,3: 68 dBc
    • SFDR worst spur: 86 dBFS
  • Input fullscale: 1.1 to 1.35 Vpp (2 to 3.5 dBm)
  • Code error rate (CER): 10 -15
  • Full power input bandwidth (-3 dB): 2.75 GHz
  • JESD204B serial data interface
    • Maximum lane rate: 13 Gbps
    • Supports subclass 1 deterministic latency
  • Digital down-converters
    • Up to four DDC per ADC channel
    • Complex output: 4x to 128x decimation
    • 48-bit NCO phase coherent frequency hopping
    • Fast frequency hopping: < 1 us
  • Power consumption: 2.6 W/channel (2x AVG)
  • Power supplies: 1.8 V, 1.2 V

The ADC32RF5x is a single core 14-bit, 2.6 GSPS to 3 GSPS, dual channel analog to digital converters (ADC) that supports RF sampling with input frequencies up to 3 GHz. The design maximizes signal-to-noise ratio (SNR) and delivers a noise spectral density of -155 dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -161 dBFS/Hz.

Each ADC channel can be connected to a quad-band digital down-converter (DDC) using a 48-bit NCO which supports phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1 µs.

The ADC32RF54 and ADC32RF55 supports the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13 Gbps.

The power efficient ADC architecture consumes 2.1 W/ch at 3 Gsps and provides power scaling with lower sampling rates.

The ADC32RF5x is a single core 14-bit, 2.6 GSPS to 3 GSPS, dual channel analog to digital converters (ADC) that supports RF sampling with input frequencies up to 3 GHz. The design maximizes signal-to-noise ratio (SNR) and delivers a noise spectral density of -155 dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -161 dBFS/Hz.

Each ADC channel can be connected to a quad-band digital down-converter (DDC) using a 48-bit NCO which supports phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1 µs.

The ADC32RF54 and ADC32RF55 supports the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13 Gbps.

The power efficient ADC architecture consumes 2.1 W/ch at 3 Gsps and provides power scaling with lower sampling rates.

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* Data sheet ADC32RF5x Dual Channel 14-bit 2.6 to 3-GSPS RF Sampling Data Converter datasheet (Rev. B) PDF | HTML 2023年 8月 21日
EVM User's guide TRF1305-ADC32RFEVM Evaluation Module User's Guide PDF | HTML 2024年 10月 15日
Analog Design Journal 探索 RF 取樣資料轉換器在測試與測量應用中的快速跳頻 PDF | HTML 2024年 9月 23日
Certificate TRF1305-ADC32RFEVM EU Declaration of Conformity (DoC) 2024年 9月 17日
Application brief Noise Spectral Density: A Better Way (Rev. A) PDF | HTML 2024年 5月 18日
Application note Improve SFDR Using Calibration in High-Speed ADCs PDF | HTML 2023年 6月 19日
Application note Getting the Most of Your Data Converter Clocking System Using LMX1204 PDF | HTML 2022年 6月 23日

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開發板

ADC32RF55EVM — 適用於具有低 NSD 的雙通道 14 位元 3-GSPS 射頻取樣 ADC 的 ADC32RF55 評估模組

ADC32RF55 評估模組 (EVM) 是一個展示 ADC32RF55 高速、JESD204B 介面類比轉數位轉換器 (ADC) 性能的平台。板載電壓穩壓、時鐘解決方案 (LMK04832)、變壓器耦合類比輸入及 USB 介面,可輕鬆評估 ADC32RF55。

透過現場可編程邏輯閘陣列 (FPGA) 夾層介面卡 (FMC) 連接器與 TSW14J58EVM (單獨出售) 接合,可以可使用高速數據轉換器專業軟體 (DATACONVERTERPRO-SW) 輕鬆評估及檢視 JESD204B 介面的數據擷取 (最高 1.5 GB)。

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