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SN74ALVC08-EP

現行

增強型產品 4 通道、2 輸入、1.65V 至 3.6V 超高速 (3 ns) AND 閘

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產品規格表

SN74ALVC08-EP

現行
產品規格表 立即訂購

產品詳細資料

Technology family ALVC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Ultra high speed (tpd <5ns) Data rate (max) (Mbps) 150 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
Technology family ALVC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Ultra high speed (tpd <5ns) Data rate (max) (Mbps) 150 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
  • Operates From 1.65 V to 3.6 V
  • Max tpd of 2.9 ns at 3.3 V
  • ±24-mA Output Drive at 3.3 V
  • Latch-Up Performance Exceeds 250 mA Per JESD 17

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
  • Operates From 1.65 V to 3.6 V
  • Max tpd of 2.9 ns at 3.3 V
  • ±24-mA Output Drive at 3.3 V
  • Latch-Up Performance Exceeds 250 mA Per JESD 17

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74ALVC08 quadruple 2-input positive-AND gate is designed for 1.65-V to 3.6-V VCC operation.

The device performs the Boolean function Y = A • B or Y (A\ + B\)\ in positive logic.

The SN74ALVC08 quadruple 2-input positive-AND gate is designed for 1.65-V to 3.6-V VCC operation.

The device performs the Boolean function Y = A • B or Y (A\ + B\)\ in positive logic.
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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN74ALVC08-EP datasheet (Rev. A) 2004/5/20
* VID SN74ALVC08-EP VID V6204686 2016/6/21

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