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SN74LVC02A-EP

現行

增強型產品 4 通道、2 輸入、2-V 至 3.6-V NOR 閘

立即訂購
產品規格表

SN74LVC02A-EP

現行
產品規格表 立即訂購

產品詳細資料

Technology family LVC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Output type Push-Pull Input type Standard CMOS Features Over-voltage tolerant inputs, Partial power down (Ioff), Ultra high speed (tpd <5ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family LVC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Output type Push-Pull Input type Standard CMOS Features Over-voltage tolerant inputs, Partial power down (Ioff), Ultra high speed (tpd <5ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm)
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Customer-Specific Configuration Control Can Be Supported Along With Major-Change Approval
  • Inputs Accept Voltages to 5.5 V
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Customer-Specific Configuration Control Can Be Supported Along With Major-Change Approval
  • Inputs Accept Voltages to 5.5 V
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The quadruple 2-input positive-NOR gate is designed for 2.7-V to 3.6-V VCC operation.

The SN74LVC02A performs the Boolean function Y = A + B or Y = A • B in positive logic.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.

The quadruple 2-input positive-NOR gate is designed for 2.7-V to 3.6-V VCC operation.

The SN74LVC02A performs the Boolean function Y = A + B or Y = A • B in positive logic.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.
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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN74LVC02A-EP datasheet 2007/3/14
* 輻射及可靠性報告 SN74LVC02AMPWREP Reliability Report 2016/2/16
* VID SN74LVC02A-EP VID V6206660 2016/6/21

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