SPRT759 October   2023 TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Overview of IEC 60730 and UL 1998 Classifications
    1. 2.1 C2000 Capability by Device Family
  6. 3C2000 Safety Collateral
    1. 3.1 Getting Started
    2. 3.2 Functional Safety Manuals
    3. 3.3 Software Collateral
  7. 4Implementing Acceptable Measures on C2000 Real-Time MCUs
    1. 4.1 Implementation Steps
    2. 4.2 Example Mapping
    3. 4.3 Additional Best Practices
  8. 5Mapping Acceptable Control Measures to C2000 Unique Identifiers
    1. 5.1 Unique Identifier Reference
    2. 5.2 CPU Related Faults
    3. 5.3 Interrupt Related Faults
    4. 5.4 Clock Related Faults
    5. 5.5 Memory Related Faults
    6. 5.6 Internal Data Path Faults
    7. 5.7 Input/Output Related Faults
    8. 5.8 Communication, Monitoring Devices, and Custom Chip Faults
  9. 6Glossary
  10. 7References

Input/Output Related Faults

Table 5-8 Input/Output Periphery Faults to Unique ID Mapping
Component Class B/1 (1) Class C/2 (1) Acceptable Measure (6) C2000 Unique IDs (3)
Definition Description F2837x
F2807x
F2838x F28004x F28002x F28003x
7.1 Digital I/O rq H.2.18.13
A7.1.17
Plausibility check GPIO4 GPIO4 GPIO4 GPIO4 GPIO4
rq H.2.18.8
A7.1.9
Input comparison GPIO5 GPIO5 GPIO5 GPIO5 GPIO5
H.2.18.11
A7.1.15
Multiple parallel outputs GPIO5 GPIO5 GPIO5 GPIO5 GPIO5
H.2.18.12
A7.1.16
Output verification GPIO4 GPIO4 GPIO4 GPIO4 GPIO4
7.2 Analog I/O
7.2.1 A/D and D/A converter
rq H.2.18.13
A7.1.17
Plausibility check ADC2 ADC2 ADC2 ADC2 ADC2
ADC8 ADC8 ADC8 ADC8 ADC8
rq H.2.18.8
A7.1.9
Input comparison ADC10 ADC10 ADC10 ADC10 ADC10
7.2 Analog I/O
7.2.2 Analog multiplexer
rq H.2.18.13
A7.1.17
Plausibility check ADC2 ADC2 ADC2 ADC2 ADC2
ADC8 ADC8 ADC8 ADC8 ADC8
rq H.2.18.15
A7.1.19
Input comparison ADC10 ADC10 ADC10 ADC10 ADC10
rq: coverage of the failure mode (refer to Table 2-2) is required by the standards for the indicated class. More than one acceptable measure may be available to choose from.
Refer to the IEC / UL specifications for a complete list of acceptable measures and their definitions.
Refer to the Functional Safety Manual for a description and implementation suggestions for each ID.