SPRT759 October   2023 TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Overview of IEC 60730 and UL 1998 Classifications
    1. 2.1 C2000 Capability by Device Family
  6. 3C2000 Safety Collateral
    1. 3.1 Getting Started
    2. 3.2 Functional Safety Manuals
    3. 3.3 Software Collateral
  7. 4Implementing Acceptable Measures on C2000 Real-Time MCUs
    1. 4.1 Implementation Steps
    2. 4.2 Example Mapping
    3. 4.3 Additional Best Practices
  8. 5Mapping Acceptable Control Measures to C2000 Unique Identifiers
    1. 5.1 Unique Identifier Reference
    2. 5.2 CPU Related Faults
    3. 5.3 Interrupt Related Faults
    4. 5.4 Clock Related Faults
    5. 5.5 Memory Related Faults
    6. 5.6 Internal Data Path Faults
    7. 5.7 Input/Output Related Faults
    8. 5.8 Communication, Monitoring Devices, and Custom Chip Faults
  9. 6Glossary
  10. 7References

6 Glossary

Table 6-1 Terms and Definitions
Terminology and Abbreviations Definition
A.x... Reference from the UL 1998 standard. For example: A.7.1.19 is a specific definition found in appendix A of the standard.
C28x A C2000 central processing unit.
CLA C2000 Control Law Accelerator: an independent 32-bit floating-point processor.
CLA PROM Program ROM for the CLA CPU
CLB C2000 Configurable Logic Block
Class B / 1 IEC 60730 Class B and UL 1998 Class 1. Class assigned based on a functional safety assessment. Refer to c.
Class C / 2 IEC 60730 Class C and UL 1998 Class 2: Class assigned based on a functional safety assessment. Refer to Table 2-1.
CLK Clock
CPU Central Processing Unit
CPU Timer C2000 general timer peripheral
CRC Cyclic Redundancy Check
DC fault (IEC/UL) Short circuits between signals.
DCC C2000 dual clock comparitors
DCSM C2000 dual code-security module
ECC Error correction code
E/E/PE (IEC/UL) Electrical/Electronic/Programmable Electronic
EMC (IEC/UL) Electromagnetic compatibility
ePIE C2000 enhanced peripheral interrupt expansion block. May also be referred to as PIE.
ePWM C2000 enhanced Pulse Width Modulation peripheral. May also be referred to as PWM.
FPU Floating-point Unit instruction set extension to the C28x CPU
FSM
  • This document uses FSM to indicate a Functional Safety Manual (Section 3.2).
  • (IEC/UL) FSM is used to indicate Functional Safety Management.
GPIO C2000 general purpose input/output pin
H.x... Reference from the IEC 60730 standard. For example: H.2.16.5 is a specific definition found in annex H of the standard.
HRPWM High-resolution feature of the C2000 ePWM module
HW Hardware (the microcontroller)
HWBIST C2000 hardware built-in self test
IEC International Electrotechnical Commission
IEC 60730 The terms "IEC 60730", "UL 1998", "IEC / UL standards", "60730" and "the standards" are used interchangeably to refer to both:
  • IEC60730-1 Edition 5.0 2013-11, Annex H and Table H.1 (H.11.12.7 of edition 3) – "Acceptable measures to address fault/errors"
  • The UL Standard for Safety for Software in Programmable Components, UL 1998, Third Edition, Dated December 18, 2013, Appendix A and Table A2.1 – "Coverage for microelectronic hardware failure modes"
IEC 61508 IEC 61508 Functional Safety of Electrical/Electronic/Programmable Electronic Safety-Related Systems, International Electrotechnical Commission, Edition 2.0 2010.
ISO 26262 ISO 26262–Road Vehicles-Functional Safety, International Standard ISO, vol. 26262, 2018.
IEC / UL Short for the standards or indicates something taken from the standards. Such as (IEC/UL) marked definitions in this list. See IEC 60730
MPOST Memory power-on self-test
PIE See ePIE.
PWM See ePWM.
PEST Periodic self-test
POST Power-on self-test
ROM Read only memory
SDL Software Diagnostic Library
SRAM Static random-access memory
STL Self-Test Library
Stuck-at (IEC/UL) An open circuit fault or non-varying signal level
SW Software
TI Texas Instruments Inc.
TMU Trigonometric Math Unit instruction set extension to the C28x CPU
UL Underwriters Laboratories Inc.
UL 1998 See IEC 60730
Unique ID A C2000 unique identifier assigned to a functional safety feature or diagnostic in the functional safety manual. For example CLK2 or GPIO4.
VCRC Refer to VCU
VCU Instruction set extension to the C28x CPU. Part of the added instructions are CRC calculation specific. The CRC instructions are supported on some devices as simply the "VCRC".