SPRT759 October   2023 TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Overview of IEC 60730 and UL 1998 Classifications
    1. 2.1 C2000 Capability by Device Family
  6. 3C2000 Safety Collateral
    1. 3.1 Getting Started
    2. 3.2 Functional Safety Manuals
    3. 3.3 Software Collateral
  7. 4Implementing Acceptable Measures on C2000 Real-Time MCUs
    1. 4.1 Implementation Steps
    2. 4.2 Example Mapping
    3. 4.3 Additional Best Practices
  8. 5Mapping Acceptable Control Measures to C2000 Unique Identifiers
    1. 5.1 Unique Identifier Reference
    2. 5.2 CPU Related Faults
    3. 5.3 Interrupt Related Faults
    4. 5.4 Clock Related Faults
    5. 5.5 Memory Related Faults
    6. 5.6 Internal Data Path Faults
    7. 5.7 Input/Output Related Faults
    8. 5.8 Communication, Monitoring Devices, and Custom Chip Faults
  9. 6Glossary
  10. 7References

5 Mapping Acceptable Control Measures to C2000 Unique Identifiers

The proposed mapping in this document is for reference. The system and equipment designer, or manufacturer, is responsible to ensure the end system meets the IEC 60730 / UL 1998 requirements.

Note: This section references IEC 60370 Annex H table H.1 and UL 1998 Appendix A table A.2 as they apply to microcontrollers. While these two tables are compatible, the exact wording may differ. For specific wording, clarifications, and definitions, see an original copy of the specifications.

The mapping is summarized the following tables:

Table 5-1 Acceptable Measure to Unique Identifier Mapping
Component Section
CPU Section 5.2
Interrupt related faults Section 5.3
Clock faults Section 5.4
Memory Section 5.5
Internal data path faults Section 5.6
Input and output periphery faults Section 5.7
Other faults: external communication, monitoring devices, and custom chip faults Section 5.8

When reviewing the acceptable measure to Unique ID tables, reference the following documentation:

IEC 60730 / UL 1998 specifications:
  • Specific definitions of acceptable control measures for each class.
  • Additional acceptable control measures not listed here.
  • Clarifications and other notes not included here.
 Device-specific Functional Safety Manual:
  • C2000 Unique ID definitions. Refer to the Summary of Safety Features and Diagnostics chapter for a short description and a link to a longer explanation with implementation guidance.
  • Supporting software.

Once done, do not forget to review the additional best practices described in Section 4.3.

Section 5.1 includes a summary of Unique IDs referenced in this section. For further details, see the device-specific Functional Safety Manual.