Startseite Energiemanagement Sequenzer
NEU

TPS7H3014-SEP

AKTIV

Strahlungstoleranter 4-kanaliger 14-V-Stromversorgungssequenzer

Produktdetails

Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Supply voltage (max) (V) 14 Supply voltage (min) (V) 3 Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Supply voltage (max) (V) 14 Supply voltage (min) (V) 3 Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
TSSOP (PW) 24 49.92 mm² 7.8 x 6.4
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

Herunterladen Video mit Transkript ansehen Video

Technische Dokumentation

star =Von TI ausgewählte Top-Empfehlungen für dieses Produkt
Keine Ergebnisse gefunden. Bitte geben Sie einen anderen Begriff ein und versuchen Sie es erneut.
Alle anzeigen 9
Typ Titel Datum
* Data sheet TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. D) PDF | HTML 27 Jul 2025
* VID TPS7H3014-SEP VID TPS7H3014-SEP VID V62-25644 27 Okt 2025
* Radiation & reliability report TPS7H3014-SEP Single-Event Effects (SEE) (Rev. A) PDF | HTML 21 Aug 2025
* Radiation & reliability report TPS7H3014-SEP Production Flow and Reliability Report PDF | HTML 21 Jul 2025
* Radiation & reliability report TPS7H3014-SEP Neutron Displacement Damage (NDD) Characterization Report 16 Jul 2025
* Radiation & reliability report TPS7H3014-SEP Total Ionizing Dose (TID) 16 Jul 2025
Selection guide TI Space Products (Rev. K) 04 Apr 2025
Application note Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML 15 Sep 2022
E-book Radiation Handbook for Electronics (Rev. A) 21 Mai 2019

Design und Entwicklung

Weitere Bedingungen oder erforderliche Ressourcen enthält gegebenenfalls die Detailseite, die Sie durch Klicken auf einen der unten stehenden Titel erreichen.

Evaluierungsplatine

TPS7H3014EVM — TPS7H3014-SEP – Evaluierungsmodul

Das TPS7H3014-Evaluationsmodul (EVM) demonstriert den Betrieb eines einzelnen TPS7H3014-SEP-Sequenzers. Die Platine umfasst Footprints, die mit zusätzlichen Komponenten bestückt werden können, um das Testen kundenspezifischer Konfigurationen zu ermöglichen, wie z. B. Sequenzer in Reihenschaltung.

Benutzerhandbuch: PDF | HTML
Simulationsmodell

TPS7H3014-SP and TPS7H3014-SEP PSpice Transient Model

SNVMCF1.ZIP (72 KB) - PSpice Model
Simulationstool

PSPICE-FOR-TI — PSpice® für TI Design-und Simulationstool

PSpice® für TI ist eine Design- und Simulationsumgebung, welche Sie dabei unterstützt, die Funktionalität analoger Schaltungen zu evaluieren. Diese Design- und Simulationssuite mit vollem Funktionsumfang verwendet eine analoge Analyse-Engine von Cadence®. PSpice für TI ist kostenlos erhältlich und (...)
Gehäuse Pins CAD-Symbole, Footprints und 3D-Modelle
TSSOP (PW) 24 Ultra Librarian

Bestellen & Qualität

Beinhaltete Information:
  • RoHS
  • REACH
  • Bausteinkennzeichnung
  • Blei-Finish/Ball-Material
  • MSL-Rating / Spitzenrückfluss
  • MTBF-/FIT-Schätzungen
  • Materialinhalt
  • Qualifikationszusammenfassung
  • Kontinuierliches Zuverlässigkeitsmonitoring
Beinhaltete Information:
  • Werksstandort
  • Montagestandort

Support und Schulungen

TI E2E™-Foren mit technischem Support von TI-Ingenieuren

Inhalte werden ohne Gewähr von TI und der Community bereitgestellt. Sie stellen keine Spezifikationen von TI dar. Siehe Nutzungsbedingungen.

Bei Fragen zu den Themen Qualität, Gehäuse oder Bestellung von TI-Produkten siehe TI-Support. ​​​​​​​​​​​​​​

Videos