GUI para el módulo de evaluación (EVM)
CDCE62005
Generador/limpiador de fluctuación de reloj de 5/10 salidas con dos VCO integrados
Hoja de datos
CDCE62005
- Superior Performance:
- Low Noise Clock Generator: 550 fs rms typical (10 kHz to 20 MHz Integration Bandwidth),
FC = 100 MHz - Low Noise Jitter Cleaner: 2.6 ps rms typical (10 kHz to 20 MHz Integration Bandwidth),
FC = 100 MHz
- Low Noise Clock Generator: 550 fs rms typical (10 kHz to 20 MHz Integration Bandwidth),
- Flexible Frequency Planning:
- 5 Fully Configurable Outputs: LVPECL, LVDS, LVCMOS and Special High Swing Output Modes
- Unique Dual-VCO Architecture Supports a Wide Tuning Range: 1.750 GHz to 2.356 GHz
- Output Frequency Ranges from 4.25 MHz to 1.175 GHz in Synthesizer Mode
- Output Frequency up to 1.5 GHz in Fan-Out Mode
- Independent Coarse Skew Control on all Outputs
- High Flexibility:
- Integrated EEPROM Determines Device Configuration at Power-up
- Smart Input Multiplexer Automatically Switches Between One of Three Reference Inputs
- 7-mm × 7-mm 48-Pin VQFN Package (RGZ)
- –40°C to +85°C Temperature Range
The CDCE62005 is a high performance clock generator and distributor featuring low output jitter, a high degree of configurability via a SPI interface, and programmable start up modes determined by on-chip EEPROM. Specifically tailored for clocking data converters and high-speed digital signals, the CDCE62005 achieves jitter performance well under 1 ps RMS (10 kHz to 20 MHz integration bandwidth).
The CDCE62005 incorporates a synthesizer block with partially integrated loop filter, a clock distribution block including programmable output formats, and an input block featuring an innovative smart multiplexer. The clock distribution block includes five individually programmable outputs that can be configured to provide different combinations of output formats (LVPECL, LVDS, LVCMOS). Each output can also be programmed to a unique output frequency (up to 1.5 GHz) and skew relationship via a programmable delay block (note that frequency range depends on operational mode and output format selected). If all outputs are configured in single-ended mode (for example, LVCMOS), the CDCE62005 supports up to ten outputs. Each output can select one of four clock sources to condition and distribute including any of the three clock inputs or the output of the frequency synthesizer. The input block includes two universal differential inputs which support frequencies in the range of 40 kHz to 500 MHz and an auxiliary input that can be configured to connect to an external crystal via an on chip oscillator block.
The smart input multiplexer has two modes of operation, manual and automatic. In manual mode, the user selects the synthesizer reference via the SPI interface. In automatic mode, the input multiplexer will automatically select between the highest priority input clock available.
Documentación técnica
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Ver todo 11 | Tipo | Título | Fecha | ||
|---|---|---|---|---|
| * | Data sheet | CDCE62005 3:5 Clock Generator, Jitter Cleaner with Integrated Dual VCOs datasheet (Rev. G) | PDF | HTML | 23 may 2016 |
| User guide | TSW6011EVM Quick Start Guide (Rev. D) | 17 ago 2016 | ||
| Application note | Clocking Design Guidelines: Unused Pins | 19 nov 2015 | ||
| Application note | Effects of Clock Spur on High Speed DAC Performance (Rev. A) | 18 may 2015 | ||
| Application note | Effects of Clock Noise on High Speed DAC Performance | 08 nov 2012 | ||
| Application note | Phase Noise Performance and Loop Bandwidth Optimization of CDCE62005 | 11 ago 2011 | ||
| Application note | CDCE62005 Application Report | 21 nov 2008 | ||
| Application note | LAN & WAN clock generation and muxing using the CDCE62005 | 19 nov 2008 | ||
| User guide | Low Phase Noise Clock Evaluation Module — up to 1.5 Ghz | 11 nov 2008 | ||
| Application note | CDCE62005 Phase Noise and Jitter Cleaning Performance | 05 sep 2008 | ||
| Application note | CDCE62005 as Clock Solution for High-Speed ADCs | 04 sep 2008 |
Diseño y desarrollo
Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.
Placa de evaluación
CDCE62005EVM — Módulo de evaluación CDCE62005EVM
The CDCE62005 is a high performance clock generator and distributor featuring low output jitter, a high degree of configurability via a SPI interface, and programmable start up modes determined by on-chip EEPROM. Specifically tailored for clocking data converters and high-speed digital signals, (...)
Guía del usuario: PDF
Placa de evaluación
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Placa de evaluación
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Placa de evaluación
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Placa de evaluación
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Guía del usuario: PDF
Placa de evaluación
DAC3484EVM — Módulo de evaluación del convertidor digital a analógico DAC3484 de cuatro canales, 16 bits y 1,25 G
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Guía del usuario: PDF
Placa de evaluación
DAC34H84EVM — Módulo de evaluación del convertidor digital a analógico DAC34H84 de cuatro canales, 16 bits y 1,25
The DAC34H84EVM is a circuit board that allows designers to evaluate the performance of Texas Instruments' four-channel, ultra-low power, 16-bit, 1.25 GSPS DAC34H84 digital-to-analog converter (DAC) with 32-bit wide DDR LVDS data input, integrated 2x/4x/8x/16x interpolation filters, 32-bit NCO and (...)
Guía del usuario: PDF
Placa de evaluación
DAC34SH84EVM — Módulo de evaluación del convertidor digital a analógico DAC34SH84 de cuatro canales, 16 bits y 1,5
The DAC34SH84EVM is a circuit board that allows designers to evaluate the performance of Texas Instruments' four-channel, ultra-low power, 16-bit, 1.5 GSPS DAC34SH84 digital-to-analog converter (DAC) with 32-bit wide DDR LVDS data input, integrated 2x/4x/8x/16x interpolation filters, 32-bit NCO and (...)
Guía del usuario: PDF
Soporte de software
SCAC105 — CDCE62005 EVM Control Software Installer
Productos y hardware compatibles
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| Paquete | Pasadores | Descargar |
|---|---|---|
| VQFN (RGZ) | 48 | Ver opciones |
Pedidos y calidad
Información incluida:
- RoHS
- REACH
- Marcado del dispositivo
- Acabado de plomo/material de la bola
- Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
- Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
- Contenido del material
- Resumen de calificaciones
- Monitoreo continuo de confiabilidad
Información incluida:
- Lugar de fabricación
- Lugar de ensamblaje
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