Inicio Lógica y traducción de voltaje Compuertas lógicas Compuertas AND
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Lógica y traducción de voltaje
Compuertas lógicas
Compuertas AND

SN74AC11-EP

ACTIVO

Puerta AND mejorada, 3 can./3 ent. de 2-6 V, de alta veloc. (7 ns), 24 mA potencia de accionam.

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SN74AC11-EP

ACTIVO
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Detalles del producto

Technology family AC Number of channels 3 Inputs per channel 3 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
Technology family AC Number of channels 3 Inputs per channel 3 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Inputs Accept Voltages to 6 V
  • Max tpd of 7.5 ns at 5 V

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Inputs Accept Voltages to 6 V
  • Max tpd of 7.5 ns at 5 V

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AC11 device contains three independent 3-input AND gates. This device performs the Boolean function Y = A • B • C or Y = (A\ + B\ + C\)\ in positive logic.

The SN74AC11 device contains three independent 3-input AND gates. This device performs the Boolean function Y = A • B • C or Y = (A\ + B\ + C\)\ in positive logic.
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Documentación técnica

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Documentación principal Tipo Título Opciones de formato Descargar la versión más reciente en inglés Fecha
* Hoja de datos SN74AC11-EP datasheet 6/01/2004
* VID SN74AC11-EP VID V6204701 21/06/2016

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