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SN74LV165A-EP

最終購入段階

エンハンスド製品、パラレル・ロード (並列読み込み)、8 ビット・シフト・レジスタ

SN74LV165A-EP は生産中止予定です
以下の代替品のいずれかをご検討ください。
open-in-new 代替品と比較
比較対象デバイスにアップグレード機能を搭載した、ドロップ・イン代替製品
新規 SN74LV165B-EP アクティブ エンハンスド製品、8 ビット、パラレル ロード (並列読み込み) シフト レジスタ Replacement

製品詳細

Configuration Parallel-in, Serial-out Bits (#) 8 Technology family LV-A Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 75 IOL (max) (mA) 12 IOH (max) (mA) -12 Supply current (max) (µA) 20 Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -55 to 125 Rating HiRel Enhanced Product
Configuration Parallel-in, Serial-out Bits (#) 8 Technology family LV-A Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 75 IOL (max) (mA) 12 IOH (max) (mA) -12 Supply current (max) (µA) 20 Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -55 to 125 Rating HiRel Enhanced Product
TSSOP (PW) 16 32 mm² 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55deg;C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 5.5-V VCC Operation
  • Max tpd of 10.5 ns at 5 V
  • Supports Mixed-Mode Voltage Operation on All Ports
  • Ioff Supports Partial-Power-Down Mode Operation
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified
performance and environmental limits.

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55deg;C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 5.5-V VCC Operation
  • Max tpd of 10.5 ns at 5 V
  • Supports Mixed-Mode Voltage Operation on All Ports
  • Ioff Supports Partial-Power-Down Mode Operation
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified
performance and environmental limits.

The SN74LV165A-EP is a parallel-load, 8-bit shift register designed for 2-V to 5.5-V VCC operation.

When the device is clocked, data is shifted toward the serial output QH. Parallel-in access to each stage is provided by eight individual direct data inputs that are enabled by a low level at the shift/load (SH/LD) input. The SN74LV165A-EP features a clock-inhibit function and a complemented serial output, QH.

Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD is held high and clock inhibit (CLK INH) is held low. The functions of CLK and CLK INH are interchangeable. Since a low CLK and a low-to-high transition of CLK INH accomplishes clocking, CLK INH should be changed to the high level only while CLK is high. Parallel loading is inhibited when SH/LD is held high. The parallel inputs to the register are enabled while SH/LD is held low, independently of the levels of CLK, CLK INH, or SER.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down.

The SN74LV165A-EP is a parallel-load, 8-bit shift register designed for 2-V to 5.5-V VCC operation.

When the device is clocked, data is shifted toward the serial output QH. Parallel-in access to each stage is provided by eight individual direct data inputs that are enabled by a low level at the shift/load (SH/LD) input. The SN74LV165A-EP features a clock-inhibit function and a complemented serial output, QH.

Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD is held high and clock inhibit (CLK INH) is held low. The functions of CLK and CLK INH are interchangeable. Since a low CLK and a low-to-high transition of CLK INH accomplishes clocking, CLK INH should be changed to the high level only while CLK is high. Parallel loading is inhibited when SH/LD is held high. The parallel inputs to the register are enabled while SH/LD is held low, independently of the levels of CLK, CLK INH, or SER.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down.

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種類 タイトル 最新の英語版をダウンロード 日付
* データシート SN74LV165A-EP データシート 2006年 1月 1日
* VID SN74LV165A-EP VID V6206603 2016年 6月 21日
アプリケーション・ノート Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 2022年 12月 15日

設計および開発

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パッケージ ピン数 CAD シンボル、フットプリント、および 3D モデル
TSSOP (PW) 16 Ultra Librarian

購入と品質

記載されている情報:
  • RoHS
  • REACH
  • デバイスのマーキング
  • リード端子の仕上げ / ボールの原材料
  • MSL 定格 / ピーク リフロー
  • MTBF/FIT 推定値
  • 使用原材料
  • 認定試験結果
  • 継続的な信頼性モニタ試験結果
記載されている情報:
  • ファブの拠点
  • 組み立てを実施した拠点

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