SN74LVC1G80-Q1
- Qualified for automotive applications
- AEC-Q100 qualified with the following results:
- ±4000V Human-Body Model (HBM) ESD classification level 3A
- ±1000V Charged-Device Model (CDM) ESD classification level C5
- Supports 5V VCC operation
- Inputs accept voltages to 5.5V
- Supports down translation to VCC
- Maximum tpd of 6ns at 3.3V
- Low power consumption, 10µA maximum ICC
- ±24mA output drive at 3.3V
- Ioff supports partial-power-down mode and back-drive protection
The SN74LVC1G80-Q1 device is an automotive AEC-Q100 qualified, single positive-edge-triggered D-type flip-flop that is designed for 1.65V to 5.5V VCC operation.
When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the level at the output.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs when the device is powered down. This inhibits current backflow into the device which prevents damage to the device.
技術資料
| 上位の文書 | タイプ | タイトル | フォーマットオプション | 最新の英語版をダウンロード | 日付 | |
|---|---|---|---|---|---|---|
| * | データシート | SN74LVC1G80 -Q1 Single Positive-Edge-Triggered D-Type Flip-Flop データシート (Rev. A) | PDF | HTML | 2026/08/14 |
設計と開発
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5-8-LOGIC-EVM — 5 ~ 8 ピンの DCK、DCT、DCU、DRL、DBV の各パッケージをサポートする汎用ロジックの評価基板 (EVM)
| パッケージ | ピン数 | CAD シンボル、フットプリント、および 3D モデル |
|---|---|---|
| SOT-SC70 (DCK) | 5 | Ultra Librarian |