SBASAE3 December   2025 ADS125H18

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagrams
    9. 5.9 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1  Offset Error Measurement
    2. 6.2  Offset Drift Measurement
    3. 6.3  Gain Error Measurement
    4. 6.4  Gain Drift Measurement
    5. 6.5  NMRR Measurement
    6. 6.6  CMRR Measurement
    7. 6.7  PSRR Measurement
    8. 6.8  SNR Measurement
    9. 6.9  INL Error Measurement
    10. 6.10 THD Measurement
    11. 6.11 SFDR Measurement
    12. 6.12 Noise Performance
    13. 6.13 TUE (Total Unadjusted Error) Measurement
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Voltage Divider and Input Multiplexer
      2. 7.3.2  Input Range
      3. 7.3.3  ADC Reference Voltage
      4. 7.3.4  Power Supplies
        1. 7.3.4.1 AVDD and AVSS
        2. 7.3.4.2 IOVDD
        3. 7.3.4.3 CAPA and CAPD
        4. 7.3.4.4 Power-On Reset (POR)
      5. 7.3.5  Clock Operation
        1. 7.3.5.1 Internal Oscillator
        2. 7.3.5.2 External Clock
      6. 7.3.6  Modulator
      7. 7.3.7  Digital Filter
        1. 7.3.7.1 Digital Filter Latency
        2. 7.3.7.2 Sinc3 and Sinc4 Filters
        3. 7.3.7.3 Sinc4 + Sinc1 Cascade Filter
        4. 7.3.7.4 50/60Hz Notch Filters
      8. 7.3.8  FIFO Buffer
        1. 7.3.8.1 FIFO Buffer Read and Write
        2. 7.3.8.2 FIFO Overflow and Underflow
        3. 7.3.8.3 FIFO Depth Indicator
        4. 7.3.8.4 FIFO Enable and Flush
        5. 7.3.8.5 FIFO Thresholds
      9. 7.3.9  Channel Auto-Sequencer
        1. 7.3.9.1 Auto-Sequencer: Basic Operation
        2. 7.3.9.2 Sequencer Modes
          1. 7.3.9.2.1 Single-Shot Mode
          2. 7.3.9.2.2 Single Step Continuous Conversion Mode
          3. 7.3.9.2.3 Single Sequence Mode
          4. 7.3.9.2.4 Continuous Sequence Mode
        3. 7.3.9.3 Configuring the Auto-Sequencer
        4. 7.3.9.4 Starting and Stopping the Sequencer
        5. 7.3.9.5 Auto-Sequencer and DRDY Behavior
      10. 7.3.10 Offset and Gain Calibration
      11. 7.3.11 Digital PGA
      12. 7.3.12 General Purpose IOs (GPIOs)
        1. 7.3.12.1 DRDY Output
        2. 7.3.12.2 FAULT Output
      13. 7.3.13 Open Wire Current Source (OWCS)
      14. 7.3.14 Open Wire Detection with ADC 0-code output
      15. 7.3.15 System Monitors
        1. 7.3.15.1 Internal Short (Offset Calibration)
        2. 7.3.15.2 Internal Temperature Sensor
        3. 7.3.15.3 External Reference Voltage Readback
        4. 7.3.15.4 Power-Supply Readback
        5. 7.3.15.5 Resistor Divider Supply Readback
      16. 7.3.16 Monitor Flags, Indicators and Counters
        1. 7.3.16.1  Reset (RESETn flag)
        2. 7.3.16.2  AVDD Undervoltage Monitor (AVDD_UVn flag)
        3. 7.3.16.3  Reference Undervoltage Monitor (REV_UVn flag)
        4. 7.3.16.4  Modulator Overrange Monitor (MOD_OVR_FAULTn flag)
        5. 7.3.16.5  Register Map CRC (REG_MAP_CRC_FAULTn flag)
        6. 7.3.16.6  Memory Map CRC (MEM_INTERNAL_FAULTn flag)
        7. 7.3.16.7  FIFO Overflow (FIFO_OFn flag) and FIFO Underflow (FIFO_UFn flag)
        8. 7.3.16.8  FIFO CRC Fault (FIFO_CRC_FAULTn flag)
        9. 7.3.16.9  GPIO Readback
        10. 7.3.16.10 SPI CRC Fault (SPI_CRC_FAULTn flag)
        11. 7.3.16.11 Register Write Fault (REG_WRITE_FAULTn flag)
        12. 7.3.16.12 DRDY Indicator (DRDY bit)
        13. 7.3.16.13 Sequencer Active Indicator (SEQ_ACTIVE bit)
        14. 7.3.16.14 Sequence Step Indicator (STEP_INDICATOR[4:0])
        15. 7.3.16.15 ADC Conversion Counter (CONV_COUNT[3:0])
        16. 7.3.16.16 FIFO Depth Indicator (FIFO_DEPTH[8:0])
        17. 7.3.16.17 Completed Sequence Counter (SEQ_COUNT[3:0])
      17. 7.3.17 Test DAC (TDAC)
      18. 7.3.18 Parallel Post Filters
        1. 7.3.18.1 Configuring the Parallel Post Filters
        2. 7.3.18.2 Frequency Response of the Parallel Post Filters
        3. 7.3.18.3 Settling Times and DRDY Behavior When Using the Post Filters
        4. 7.3.18.4 Examples of Recommended Post Filter Settings
      19. 7.3.19 Chip Select Forwarding
        1. 7.3.19.1 Configuring the CS forward feature
        2. 7.3.19.2 CS Forward Timeout
        3. 7.3.19.3 CS Forward Header, Frame, and State Diagram
        4. 7.3.19.4 Disabling the CS-FWD mode
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power-Scalable Speed Modes
      2. 7.4.2 Sequencer Functional Modes
      3. 7.4.3 Idle Mode and Standby Mode
      4. 7.4.4 Power-Down Mode
      5. 7.4.5 Reset
        1. 7.4.5.1 RESET Pin
        2. 7.4.5.2 Reset by SPI Register Write
        3. 7.4.5.3 Reset by SPI Input Pattern
      6. 7.4.6 Synchronization
      7. 7.4.7 Conversion-Start Delay Time
    5. 7.5 Programming
      1. 7.5.1  Serial Interface (SPI)
      2. 7.5.2  Serial Interface Signals
        1. 7.5.2.1 Chip Select (CS)
        2. 7.5.2.2 Serial Clock (SCLK)
        3. 7.5.2.3 Serial Data Input (SDI)
        4. 7.5.2.4 Serial Data Output/Data Ready (SDO/DRDY)
        5. 7.5.2.5 Data Ready (DRDY) Pin
      3. 7.5.3  Serial Interface Communication Structure
        1. 7.5.3.1 SPI Frame
        2. 7.5.3.2 STATUS Header
        3. 7.5.3.3 SPI CRC
      4. 7.5.4  Device Commands
        1. 7.5.4.1 No-Operation
        2. 7.5.4.2 Read Conversion Data
        3. 7.5.4.3 Read Register Command
        4. 7.5.4.4 Write Register Command
        5. 7.5.4.5 Read FIFO Buffer Command
      5. 7.5.5  Continuous Read Mode
        1. 7.5.5.1 Read Conversion Data in Continuous Read Mode
        2. 7.5.5.2 Read Registers in Continuous Read Mode
        3. 7.5.5.3 Read FIFO Buffer in Continuous Read Mode
      6. 7.5.6  SPI communication after POR or Reset
      7. 7.5.7  DRDY Pin Behavior
      8. 7.5.8  Daisy-Chain Operation
      9. 7.5.9  3-Wire SPI Mode
        1. 7.5.9.1 3-Wire SPI Mode Frame Re-Align
      10. 7.5.10 Conversion Data
      11. 7.5.11 Data Ready
        1. 7.5.11.1 DRDY Pin and SDO/DRDY Pin
        2. 7.5.11.2 DRDY Bit
        3. 7.5.11.3 Clock Counting
    6. 7.6 Register Map
      1. 7.6.1 ADS125H18 Status and General Configuration Page
      2. 7.6.2 ADS125H18 Step Configuration Page
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Serial Interface Connections
      2. 8.1.2 Interfacing with Multiple Devices
      3. 8.1.3 Unused Inputs and Outputs
      4. 8.1.4 Device Initialization
    2. 8.2 Typical Applications
      1. 8.2.1 2-Terminal V/I PLC Analog Input Module
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Performance Plots - Crosstalk
      2. 8.2.2 3-Terminal V/I PLC Analog Input Module
      3. 8.2.3 2 -Terminal V/I PLC Analog Input Module With Solid State Switch
      4. 8.2.4 2-Terminal, single ended V/I PLC Analog Input Module
      5. 8.2.5 2-Terminal, I-Input PLC Analog Input Module
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power Supplies
      2. 8.3.2 Power-Supply Sequencing
      3. 8.3.3 Power-Supply Decoupling
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

8.2.1.3 Application Performance Plots - Crosstalk

Figure 8-5 illustrates a setup for a common channel-to-channel crosstalk test procedure. Each even numbered input channel (examples: AIN0, AIN2, AIN4, and more) is driven by an individual voltage source. All odd numbered channels (examples: AIN1, AIN3, AIN5, and more) are shorted together to ground.

The test procedure is defined as follows: Apply 3V constant signal to the input channel under test (example: AIN0), and apply the "interference" pattern shown in Figure 8-6 to all remaining even numbered channels (examples: AIN2, AIN4, … AIN14). Measure the ADC output of the channel under test (example: AIN0) to determine transient deviations from a constant output code. Repeat this procedure for every even-numbered channel. Commonly, the variation in output code is desired to be ±1 LSB on the 16 bit level, or smaller.

ADS125H18 Crosstalk Test Setup Figure 8-5 Crosstalk Test Setup
ADS125H18 Crosstalk Stimulus Input Signal Figure 8-6 Crosstalk Stimulus Input Signal

Figure 8-7 and Figure 8-8 depict the measured results for the crosstalk test using the setup from Figure 8-5.

ADS125H18 Crosstalk Measurement for ADC Input AIN0Figure 8-7 Crosstalk Measurement for ADC Input AIN0
ADS125H18 Crosstalk Measurement for ADC Input AIN6Figure 8-8 Crosstalk Measurement for ADC Input AIN6

All inputs except the input channel "under test" undergo large transient voltage steps as described by the test procedure above. The impact on the channel under test, for example AIN0 in Figure 8-7, is visible in the zoomed plot for AIN0 output codes (see secondary y-axis). In all cases, the deviation from the ideal output is approximately 70 codes (LSBs) on the 24 bit level or less, which corresponds to 1LSB on the 18 bit level.

All other channels perform similar to AIN0 when undergoing the same test. As another example and to demonstrate the similarity between channels, the impact on channel AIN6 from crosstalk is also shown as seen in Figure 8-8. All other channels (AIN2, AIN4, AIN8, AIN10, AIN12, AIN14) are tested using the same procedure, and crosstalk in the order of 18 bit level or less is confirmed.