TIDUF82B August   2024  – May 2025 DRV8162 , INA241A , ISOM8710

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Reference Design Overview
    2. 1.2 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
      1. 2.2.1 Hardware Design
        1. 2.2.1.1 Power Stage Gate Driver
          1. 2.2.1.1.1 Gate Driver
          2. 2.2.1.1.2 Protection Features
          3. 2.2.1.1.3 VGVDD Definition
          4. 2.2.1.1.4 Strap Functions
        2. 2.2.1.2 Power Stage FETs
          1. 2.2.1.2.1 VGS versus RDS(ON)
        3. 2.2.1.3 Phase Current and Voltage Sensing
          1. 2.2.1.3.1 Phase A and Phase B Current Sensing
          2. 2.2.1.3.2 Phase C Current Sensing
          3. 2.2.1.3.3 Voltage Sensing
        4. 2.2.1.4 Host Processor Interface
        5. 2.2.1.5 Gate Drive Shutdown Path
        6. 2.2.1.6 System Diagnostic Measurements
          1. 2.2.1.6.1 Temperature Measurement
        7. 2.2.1.7 System Power Supply
          1. 2.2.1.7.1 12V Rail
          2. 2.2.1.7.2 3.3V Rail
      2. 2.2.2 Software Design
    3. 2.3 Highlighted Products
      1. 2.3.1 DRV8162L
      2. 2.3.2 INA241A
      3. 2.3.3 AMC0106M05
      4. 2.3.4 TPSM861253
      5. 2.3.5 LMR38010
      6. 2.3.6 TMP6131
      7. 2.3.7 ISOM8710
  9. 3Hardware, Software Test Requirements and Test Results
    1. 3.1 Hardware Requirements
      1. 3.1.1 PCB Overview
      2. 3.1.2 Hardware Configuration
        1. 3.1.2.1 Prerequisites
        2. 3.1.2.2 Default Resistor and Jumper Configuration
        3. 3.1.2.3 Connector
          1. 3.1.2.3.1 Host Processor Interface
    2. 3.2 Test Setup
    3. 3.3 Test Results
      1. 3.3.1 Power Management
        1. 3.3.1.1 Power Up
        2. 3.3.1.2 Power Down
      2. 3.3.2 Gate Voltage and Phase Voltage
        1. 3.3.2.1 20 VDC
        2. 3.3.2.2 48 VDC
        3. 3.3.2.3 60 VDC
      3. 3.3.3 Digital PWM and Gate Voltage
      4. 3.3.4 Phase-Current Measurements
      5. 3.3.5 System Test Results
        1. 3.3.5.1 Thermal Analysis
  10. 4Design and Documentation Support
    1. 4.1 Design Files
      1. 4.1.1 Schematics
      2. 4.1.2 BOM
    2. 4.2 Tools and Software
    3. 4.3 Documentation Support
    4. 4.4 Support Resources
    5. 4.5 Trademarks
  11. 5About the Authors
  12. 6Revision History

3.2 Test Setup

The equipment listed in Table 3-4 is used for the TIDA-010956 testing session.

Table 3-4 DRV8162L Settings
TEST EQUIPMENTPART NUMBER
OscilloscopeTektronix DPO3054
ProbesTektronix TPP0200
Current probeCYBERTEK CP8500A
PMSM MotorGLOBE6440
Power supplyAgilent 6030A, ITECH IT6724H

For the different tests some of the equipment is used as described in Table 3-4. Figure 3-2 shows a test setup used for the system.

TIDA-010956 TIDA-010956 System Test SetupFigure 3-2 TIDA-010956 System Test Setup

The DRV8162L chips are setup in a way shown in Table 3-5 during the tests, if not otherwise specified.

Table 3-5 DRV8162L Settings
IDRIVEP1024mAIDRIVE1 = LEVEL0 (VIDRIVE1 = 0kΩ) and
IDRIVE2 = LEVEL0 (VIDRIVE2 = 0kΩ)
IDRIVEN2048mA
VDSLVL

LEVEL1-0: 0.15V or LEVEL1-1: 0.2V

LEVEL1 (RVDSLVL = 2kΩ)
DEAD_TIME370ns dead timeLEVEL3 (RDT = 3.3kΩ)

In the tests, a C2000™ LaunchPad of LAUNCHXL-F280039C is used to control the system. The related MCU software settings are shown in Table 3-6.

Table 3-6 C2000 MCU Settings
PWM16kHzDead time200ns

Different setups are used in the tests and are described in the related test section.