JAJSFA9E November   2011  – April 2018 ADS5294

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     ブロック概略図
  4. 4 改訂履歴
  5. 5 概要（続き）
  6. 6 デバイス比較表
  7. 7 Pin Configuration and Functions
    1.     Pin Functions
  8. 8 Specifications
    1. 8.1  Absolute Maximum Ratings
    2. 8.2  ESD Ratings
    3. 8.3  Recommended Operating Conditions
    4. 8.4  Thermal Information
    5. 8.5  Electrical Characteristics Dynamic Performance
    6. 8.6  Digital Characteristics
    7. 8.7  Timing Requirements
    8. 8.8  LVDS Timing at Different Sampling Frequencies — 2-Wire Interface, 7x-Serialization, Digital Filter Disabled
    9. 8.9  LVDS Timing at Different Sampling Frequencies — 1-Wire Interface, 14x-Serialization, Digital Filter Disabled
    10. 8.10 Serial Interface Timing Requirements
    11. 8.11 Reset Timing
    12. 8.12 LVDS Timing at Different Sampling Frequencies — 1-Wire Interface, 14x-Serialization, Decimation by 2 Filter Enabled
    13. 8.13 LVDS Timing at Different Sampling Frequencies — 1-Wire Interface, 14x-Serialization, Decimation by 4 Filter Enabled
    14. 8.14 LVDS Timing at Different Sampling Frequencies — 1-Wire Interface, 14x-Serialization, Decimation by 8 Filter Enabled
    15. 8.15 Typical Characteristics
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Analog Input
      2. 9.3.2 Input Clock
      3. 9.3.3 Digital Highpass IIR Filter
      4. 9.3.4 Decimation Filter
      5. 9.3.5 Decimation Filter Equation
        1. 9.3.5.1 Pre-defined Coefficients
        2. 9.3.5.2 Custom Filter Coefficients
      6. 9.3.6 PLL Operation Versus LVDS Timing
        1. 9.3.6.1 Effect on Output Timings
    4. 9.4 Device Functional Modes
    5. 9.5 Programming
      1. 9.5.1 Serial Interface
        1. 9.5.1.1 Register Initialization
        2. 9.5.1.2 Serial Register Readout
        3. 9.5.1.3 Default States After Reset
    6. 9.6 Register Maps
      1. 9.6.1 Description Of Serial Registers
        1. 9.6.1.1  Power-Down Modes
          1. Table 1. Power-Down Mode Register
        2. 9.6.1.2  Low Frequency Noise Suppression Mode
          1. Table 2. Low Frequency Noise Suppression Mode Register
        3. 9.6.1.3  Analog Input Invert
          1. Table 3. Analog Input Invert Register
        4. 9.6.1.4  LVDS Test Patterns
          1. Table 4. LVDS Test Patterns
        5. 9.6.1.5  Bit-Byte-Word Wise Output
          1. Table 5. Bit-Byte-Word Wise Output
        6. 9.6.1.6  Digital Processing Blocks
        7. 9.6.1.7  Programmable Digital Gain
          1. Table 6. Programmable Digital Gain
        8. 9.6.1.8  Channel Averaging
          1. Table 7. Channel Averaging
        9. 9.6.1.9  Decimation Filter
          1. Table 8. Decimation Filter
        10. 9.6.1.10 Highpass Filter
          1. Table 9. Highpass Filter
        11. 9.6.1.11 Bit-Clock Programmability
          1. Table 10. Bit-Clock Programmability
        12. 9.6.1.12 Output Data Rate Control
          1. Table 11. Output Data Rate Control
        13. 9.6.1.13 Synchronization Pulse
          1. Table 12. Synchronization Pulse
        14. 9.6.1.14 External Reference Mode of Operation
        15. 9.6.1.15 Data Output Format Modes
          1. Table 13. Data Output Format Modes
        16. 9.6.1.16 Programmable Mapping Between Input Channels and Output Pins
          1. Table 14. Mapping Between Input Channels and Output Pins
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 Large and Small Signal Input Bandwidth
        2. 10.2.2.2 Drive Circuit
        3. 10.2.2.3 Clock Selection
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13デバイスおよびドキュメントのサポート
    1. 13.1 デバイス・サポート
      1. 13.1.1 デバイスの項目表記
        1. 13.1.1.1 仕様の定義
    2. 13.2 ドキュメントのサポート
      1. 13.2.1 関連資料
    3. 13.3 コミュニティ・リソース
    4. 13.4 商標
    5. 13.5 静電気放電に関する注意事項
    6. 13.6 Glossary
  14. 14メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

9.4 Device Functional Modes

ADC Output Resolution and LVDS Serialization Rate Modes: The LVDS serialization rate can be programmed as 10, 12, 14, or 16 bits by the EN_BIT_SER register bit.

Output Data Rate Modes: The density of output data payload can be set to 1X or 2X mode by using the EN_SDR register bit. The maximum data rate (in bits per sec) of the LVDS interface is limited. In addtion, the LVDS data can be distributed by one pair LVDS data lane or two pairs of LVDS data lanes. Please see the description of Registers 0x50 to 0x55 in the Programmable Mapping Between Input Channels and Output Pins section. When the decimation feature is used, the LVDS output rate can be reduced to 1/2, 1/4, and 1/8 of ADC sampling rate as Output Data Rate Control shows. The flexible output data rate modes give users a wide selection of different speed FPGAs.

Power Modes: The device can be configured via SPI or pin settings to a complete power-down mode and via pin settings to a partial power-down (standby mode). During these two modes (complete and partial power-down), different internal functions stay powered up, resulting in different power consumption and wake-up times. In the partial power-down mode, all LVDS data lanes are powered down. The bit clock and frame clock lanes remain enabled to save time to sync again on the receiver side. However, in the complete power-down mode all lanes are powered down and thus this mode requires more time to wake-up because the bit clock and frame clock lanes must sync again with the receiver device.

LVDS Test Pattern Mode: The ADC data coming out of the LVDS outputs can be replaced by different kinds of test patterns. Note that the test patterns replace the data streaming out of the ADCs. The different test patterns are described in LVDS Test Patterns.