SLASFM1A June   2025  – December 2025 AFE10004-EP

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagrams
    9. 5.9 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Digital-to-Analog Converter (DAC) Overview
        1. 6.3.1.1 DAC Resistor String
        2. 6.3.1.2 DAC Register Structure
        3. 6.3.1.3 DAC Buffer Amplifier
      2. 6.3.2 Output Switch Overview
      3. 6.3.3 Temperature Sensors
        1. 6.3.3.1 Temperature Data Format
          1. 6.3.3.1.1 Standard Binary-to-Decimal Temperature Data Calculation Example
          2. 6.3.3.1.2 Standard Decimal-to-Binary Temperature Data Calculation Example
        2. 6.3.3.2 Temperature Sensor Conversion Rate
        3. 6.3.3.3 Remote Temperature Sensor
          1. 6.3.3.3.1 Series Resistance Cancellation
          2. 6.3.3.3.2 Differential Input Capacitance
          3. 6.3.3.3.3 Filtering
          4. 6.3.3.3.4 Sensor Fault
          5. 6.3.3.3.5 η-Factor Correction
          6. 6.3.3.3.6 Remote Temperature Offset Register
        4. 6.3.3.4 Temperature Sensor Alarm Functions
      4. 6.3.4 Look-Up Table (LUT) and Arithmetic-Logic Unit (ALU)
        1. 6.3.4.1 LUT and ALU Organization
        2. 6.3.4.2 LUT Coefficient to Register Mapping
        3. 6.3.4.3 LUT Input and Output Ranges
      5. 6.3.5 Memory
        1. 6.3.5.1 Operating Memory Page Storage
        2. 6.3.5.2 EEPROM Storage
          1. 6.3.5.2.1 EEPROM Integrity Check
      6. 6.3.6 Device Sequence Control
        1. 6.3.6.1 Depletion-Mode Field-Effect Transistor (FET) Bias Requirements
        2. 6.3.6.2 Sequence Control
          1. 6.3.6.2.1 Start-Up Sequence
          2. 6.3.6.2.2 Power-Down Sequence
          3. 6.3.6.2.3 Alarm Event
    4. 6.4 Device Functional Modes
      1. 6.4.1 Autonomous Operating Mode
      2. 6.4.2 Manual Operating Mode
        1. 6.4.2.1 DAC Input Overwrite
        2. 6.4.2.2 Temperature Sensor Overwrite
        3. 6.4.2.3 ALU Bypass
      3. 6.4.3 Interrupt Mode
    5. 6.5 Programming
      1. 6.5.1 I2C Serial Interface
        1. 6.5.1.1 I2C Bus Overview
        2. 6.5.1.2 I2C Bus Definitions
        3. 6.5.1.3 I2C Target Address Selection
        4. 6.5.1.4 I2C Read and Write Operations
        5. 6.5.1.5 I2C Timeout Function
        6. 6.5.1.6 I2C General-Call Reset
      2. 6.5.2 Serial Peripheral Interface (SPI)
        1. 6.5.2.1 SPI Bus Overview
        2. 6.5.2.2 SPI Frame Error Check
  8. 7 Register Maps
    1. 7.1 I2C Register Maps
    2. 7.2 SPI Register Maps
    3. 7.3 Registers
      1. 7.3.1 I2C Registers
        1. 7.3.1.1 I2C Page 1: Device Configuration Register Information
          1. 7.3.1.1.1  Local Temperature High Byte Register (offset = 00h) [reset = N/A]
          2. 7.3.1.1.2  Local Temperature Low Byte Register (offset = 01h) [reset = N/A]
          3. 7.3.1.1.3  Remote Temperature High Byte Register (offset = 02h) [reset = N/A]
          4. 7.3.1.1.4  Remote Temperature Low Byte Register (offset = 03h) [reset = N/A]
          5. 7.3.1.1.5  Temperature Status Register (offset = 04h) [reset = N/A]
          6. 7.3.1.1.6  AMC Status Register (offset = 05h) [reset = N/A]
          7. 7.3.1.1.7  Software Reset Register (offset = 07h) [reset = 00h]
          8. 7.3.1.1.8  Configuration 1 Register (offset = 08h) [reset = 01h]
          9. 7.3.1.1.9  Configuration 2 Register (offset = 09h) [reset = 08h]
          10. 7.3.1.1.10 LUT Configuration Register (offset = 0Ah) [reset = 03h]
          11. 7.3.1.1.11 DAC Overwrite Enable Register (offset = 0Bh) [reset = 00h]
          12. 7.3.1.1.12 Drive Enable Register (offset: 0Ch) [reset = 00h]
          13. 7.3.1.1.13 Drive Enable Select Register (offset: 0Dh) [reset = 00h]
          14. 7.3.1.1.14 Alarm Configuration Register (offset: 0Eh) [reset = 4Fh]
          15. 7.3.1.1.15 Interrupt Mode Register (offset = 0Fh) [reset = 00h]
          16. 7.3.1.1.16 Local Temperature High Limit Register (offset = 10h) [reset = 7Fh]
          17. 7.3.1.1.17 Local Temperature Low Limit Register (offset = 11h) [reset = 80h]
          18. 7.3.1.1.18 Remote Temperature High Limit High Byte Register (offset = 12h) [reset = 7Fh]
          19. 7.3.1.1.19 Remote Temperature High Limit Low Byte Register (offset = 13h) [reset = F0h]
          20. 7.3.1.1.20 Remote Temperature Low Limit High Byte Register (offset = 14h) [reset = 80h]
          21. 7.3.1.1.21 Remote Temperature Low Limit Low Byte Register (offset = 15h) [reset = 00h]
          22. 7.3.1.1.22 Remote Temperature Offset High Byte Register (offset = 16h) [reset = 00h]
          23. 7.3.1.1.23 Remote Temperature Offset Low Byte Register (offset = 17h) [reset = 00h]
          24. 7.3.1.1.24 THERM Hysteresis Register (offset = 1Ah) [reset = 0Ah]
          25. 7.3.1.1.25 Consecutive ALERT Register (offset = 1Bh) [reset = 01h]
          26. 7.3.1.1.26 η-Factor Correction Register (offset = 1Ch) [reset = 00h]
          27. 7.3.1.1.27 Digital Filter Control Register (offset = 1Dh) [reset = 00h]
          28. 7.3.1.1.28 Version ID Register (offset = 1Eh) [reset = 00h]
          29. 7.3.1.1.29 Device ID Register (offset = 1Fh) [reset = A3h]
          30. 7.3.1.1.30 Temperature Overwrite High Byte Register (offset = 22h) [reset = 00h]
          31. 7.3.1.1.31 Temperature Overwrite Low Byte Register (offset = 23h) [reset = 00h]
          32. 7.3.1.1.32 Reset Status Register (offset = 24h) [reset = N/A]
          33. 7.3.1.1.33 One-Shot Temperature Register (offset = 28h) [reset = 00h]
          34. 7.3.1.1.34 Software Alarm Register (offset = 2Ah) [reset = 00h]
        2. 7.3.1.2 I2C Page 2: DAC Configuration Register Information
          1. 7.3.1.2.1  DAC0 Input Data Register (offset = 00h - 01h) [reset = 00h]
          2. 7.3.1.2.2  DAC1 Input Data Register (offset = 02h - 03h) [reset = 00h]
          3. 7.3.1.2.3  DAC2 Input Data Register (offset = 04h - 05h) [reset = 00h]
          4. 7.3.1.2.4  DAC3 Input Data Register (offset = 06h - 07h) [reset = 00h]
          5. 7.3.1.2.5  DAC0 Overwrite Register (offset = 08h - 09h) [reset = 00h]
          6. 7.3.1.2.6  DAC1 Overwrite Register (offset = 0Ah - 0Bh) [reset = 00h]
          7. 7.3.1.2.7  DAC2 Overwrite Register (offset = 0Ch - 0Dh) [reset = 00h]
          8. 7.3.1.2.8  DAC3 Overwrite Register (offset = 0Eh - 0Fh) [reset = 00h]
          9. 7.3.1.2.9  CLAMP1 Overwrite Register (offset: 10h - 11h) [reset = 00h]
          10. 7.3.1.2.10 CLAMP2 Overwrite Register (offset: 12h - 13h) [reset = 00h]
          11. 7.3.1.2.11 CLAMP1 Input Data Register (offset: 18h - 19h) [reset = 00h]
          12. 7.3.1.2.12 CLAMP2 Input Data Register (offset: 1Ah - 1Bh) [reset = 00h]
          13. 7.3.1.2.13 DAC0 LUT Data Register (offset = 20h - 21h) [reset = 00h]
          14. 7.3.1.2.14 DAC1 LUT Data Register (offset = 22h - 23h) [reset = 00h]
          15. 7.3.1.2.15 DAC2 LUT Data Register (offset = 24h - 25h) [reset = 00h]
          16. 7.3.1.2.16 DAC3 LUT Data Register (offset = 26h - 27h) [reset = 00h]
          17. 7.3.1.2.17 Broadcast Register (offset = 30h - 31h) [reset = 00h]
        3. 7.3.1.3 I2C Page 4: LUT0 and LUT1 Configuration Register Information
          1. 7.3.1.3.1 DELTA HAMM Registers (offset = 00h - 63h) [reset = 00h (even addresses), FFh (odd addresses)]
          2. 7.3.1.3.2 DAC0 BASE HAMM Registers (offset = 64h - 67h) [reset = 00h]
          3. 7.3.1.3.3 DAC1 BASE HAMM Registers (offset = 68h - 6Bh) [reset = 00h]
        4. 7.3.1.4 I2C Page 5: LUT2 and LUT3 Configuration Register Information
          1. 7.3.1.4.1 DELTA HAMM Registers (offset = 00h - 63h) [reset = 00h (even addresses, FFh (odd addresses)]
          2. 7.3.1.4.2 DAC2 BASE HAMM Registers (offset = 64h - 67h) [reset = 00h]
          3. 7.3.1.4.3 DAC3 BASE HAMM Registers (offset = 68h - 6Bh) [reset = 00h]
        5. 7.3.1.5 I2C Page 15: Notepad Register Information
          1. 7.3.1.5.1 Notepad Registers (offset = 00h to 13h) [reset = 00h]
          2. 7.3.1.5.2 EEPROM Burn Register (offset = 7Ch) [reset = 00h]
      2. 7.3.2 SPI Registers
        1. 7.3.2.1 SPI Page 1: Device Configuration Register Information
          1. 7.3.2.1.1  Local Temperature Register (offset = 00h) [reset = N/A]
          2. 7.3.2.1.2  Remote Temperature Register (offset = 02h) [reset = N/A]
          3. 7.3.2.1.3  Status Register (offset = 04h) [reset = N/A]
          4. 7.3.2.1.4  Software Reset Register (offset = 06h) [reset = 0000h]
          5. 7.3.2.1.5  Configuration Register (offset = 08h) [reset = 0108h]
          6. 7.3.2.1.6  LUT/DAC Configuration Register (offset = 0Ah) [reset = 0300h]
          7. 7.3.2.1.7  Drive Enable Configuration Register (offset: 0Ch) [reset = 0000h]
          8. 7.3.2.1.8  Alarm Configuration Register (offset: 0Eh) [reset = 4F00h]
          9. 7.3.2.1.9  Local Temperature Limit Register (offset = 10h) [reset = 7F80h]
          10. 7.3.2.1.10 Remote Temperature High Limit Register (offset = 12h) [reset = 7FF0h]
          11. 7.3.2.1.11 Remote Temperature Low Limit Register (offset = 14h) [reset = 8000h]
          12. 7.3.2.1.12 Remote Temperature Offset Register (offset = 16h) [reset = 0000h]
          13. 7.3.2.1.13 Temperature Configuration 1 Register (offset = 1Ah) [reset = 0A01h]
          14. 7.3.2.1.14 Temperature Configuration 2 Register (offset = 1Ch) [reset = 0000h]
          15. 7.3.2.1.15 Device ID Register (offset = 1Eh) [reset = 00A3h]
          16. 7.3.2.1.16 Temperature Overwrite Register (offset = 22h) [reset = 0000h]
          17. 7.3.2.1.17 Reset Status Register (offset = 24h) [reset = N/A]
          18. 7.3.2.1.18 One-Shot Temperature Register (offset = 28h) [reset = 0000h]
          19. 7.3.2.1.19 Software Alarm Register (offset = 2Ah) [reset = 0000h]
        2. 7.3.2.2 SPI Page 2: DAC Configuration Register Information
          1. 7.3.2.2.1  DAC0 Input Data Register (offset = 00h) [reset = 0000h]
          2. 7.3.2.2.2  DAC1 Input Data Register (offset = 02h) [reset = 0000h]
          3. 7.3.2.2.3  DAC2 Input Data Register (offset = 04h) [reset = 0000h]
          4. 7.3.2.2.4  DAC3 Input Data Register (offset = 06h) [reset = 0000h]
          5. 7.3.2.2.5  DAC0 Overwrite Register (offset = 08h) [reset = 0000h]
          6. 7.3.2.2.6  DAC1 Overwrite Register (offset = 0Ah) [reset = 0000h]
          7. 7.3.2.2.7  DAC2 Overwrite Register (offset = 0Ch) [reset = 0000h]
          8. 7.3.2.2.8  DAC3 Overwrite Register (offset = 0Eh) [reset = 0000h]
          9. 7.3.2.2.9  CLAMP1 Overwrite Register (offset: 10h) [reset = 0000h]
          10. 7.3.2.2.10 CLAMP2 Overwrite Register (offset: 12h) [reset = 0000h]
          11. 7.3.2.2.11 CLAMP1 Input Data Register (offset: 18h) [reset = 0000h]
          12. 7.3.2.2.12 CLAMP2 Input Data Register (offset: 1Ah) [reset = 0000h]
          13. 7.3.2.2.13 DAC0 LUT Data Register (offset = 20h) [reset = 0000h]
          14. 7.3.2.2.14 DAC1 LUT Data Register (offset = 22h) [reset = 0000h]
          15. 7.3.2.2.15 DAC2 LUT Data Register (offset = 24h) [reset = 0000h]
          16. 7.3.2.2.16 DAC3 LUT Data Register (offset = 26h) [reset = 0000h]
          17. 7.3.2.2.17 Broadcast Register (offset = 30h) [reset = 0000h]
        3. 7.3.2.3 SPI Page 4: LUT0 and LUT1 Configuration Register Information
          1. 7.3.2.3.1 DELTA Registers (offset = 00h - 62h) [reset = 00FFh]
          2. 7.3.2.3.2 DAC0 BASE Registers (offset = 64h - 66h) [reset = 0000h]
          3. 7.3.2.3.3 DAC1 BASE Registers (offset = 68h - 6Ah) [reset = 0000h]
        4. 7.3.2.4 SPI Page 5: LUT2 and LUT3 Configuration Register Information
          1. 7.3.2.4.1 DELTA Registers (offset = 00h - 62h) [reset = 00FFh]
          2. 7.3.2.4.2 DAC2 BASE Registers (offset = 64h - 66h) [reset = 0000h]
          3. 7.3.2.4.3 DAC3 BASE Registers (offset = 68h - 6Ah) [reset = 0000h]
        5. 7.3.2.5 SPI Page 15: Notepad Register Information
          1. 7.3.2.5.1 Notepad Registers (offset = 00h to 12h) [reset = 0000h]
          2. 7.3.2.5.2 EEPROM Burn Register (offset = 7Ch) [reset = 0000h]
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Output Switching Timing
    2. 8.2 Typical Applications
      1. 8.2.1 Temperature-Compensated Bias Generator for an LDMOS Power Amplifier (PA)
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Supply Voltage Selection
          2. 8.2.1.2.2 DAC Output Voltage Range
          3. 8.2.1.2.3 Temperature-Sensing Applications
          4. 8.2.1.2.4 PAVDD Isolation From the Power Amplifier
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Temperature-Compensated Bias Generator for a Gallium Nitride (GaN) Power Amplifier (PA)
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
          1. 8.2.2.2.1 Supply Voltage Selection
          2. 8.2.2.2.2 DAC Output Voltage Range
        3. 8.2.2.3 Application Curves
    3. 8.3 Initialization Setup
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
        1. 8.5.2.1 Positive Output Range Layout Example
        2. 8.5.2.2 Negative Output Range Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
6.3.5.2.1 EEPROM Integrity Check

Before completing the EEPROM load sequence, a CRC error-check is performed by the device. The CRC polynomial is x12 + x11 + x3 + x2 + x + 1. The CRC check result is reported through the EECRC bit. If a CRC error is detected, the operating memory values are compromised; reset the device or burn the EEPROM again for proper operation.

For added robustness, a single error correction and double error detection (SECDED) circuit based on the Hamming code is added to data in the LUT pages (Page 4 and Page 5). The SECDED circuit uses four Hamming code bits and a parity bit. The interleaved Hamming and LUT data are stored in EEPROM, and Table 6-10 shows these bits.

Table 6-10 Hamming Code and LUT Data Bits
DATA AND BIT POSITION 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
Data and Hamming code bits in operating memoryPH3H2H1H0XXXD7D6D5D4D3D2D1D0
Data and Hamming code interleaved bitsXXXD7D6D5D4H3D3D2D1H2D0H1H0P

The SECDED circuit checks the data integrity on every LUT register access. The parity bit (P) and four Hamming code bits (H[3:0]) in the HAMM registers equal all zeros if no error is present in the associated LUT data register. If P = 1 then a single error has been detected and corrected. The value in the H[3:0] bits represents the position of the bit error with respect to the interleaved bits. For example, if P = 1 and H[3:0] = 0x5, an error is detected and corrected in D1.

If P = 0 and H[3:0] ≠ 0, then a double error has been detected. No correction is done in this case.

Table 6-11 summarizes the device EEPROM integrity checks.

Table 6-11 Status of EEPROM Access
STATUS BIT NAMEDESCRIPTION
EECRC0 = No CRC error detected.
1 = A CRC error is detected during a EEPROM load. The operating memory data are compromised.
EERDY0 = The EEPROM burn is in progress.
1 = The EEPROM burn is complete.
DED0 = No double-bit error detected.
1 = A double-bit error is detected when accessing a LUT register in the operating memory. The error is not corrected.
SED0 = No single-bit error detected.
1 = A single-bit error is detected when accessing a LUT register in the operating memory. The error is corrected.