STDA033 October   2026 MSPM0G3105-Q1 , MSPM0G3106-Q1 , MSPM0G3107-Q1 , MSPM0G3505-Q1 , MSPM0G3506-Q1 , MSPM0G3507-Q1 , MSPM0L1227-Q1 , MSPM0L1228-Q1 , MSPM0L2227-Q1 , MSPM0L2228-Q1 , MSPM33C321A

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1.     How Does an Electromagnetic Field Start in a Circuit?
    2.     Near-Field and Far-Field Electromagnetic Fields
  5. 2Common Sources of EMI in Electronic Designs
    1. 2.1 Resistors
      1. 2.1.1 Equivalent Series Inductance (ESL)
      2. 2.1.2 Shunt Capacitance
      3. 2.1.3 Parasitic Capacitance to Ground
    2. 2.2 Capacitors
      1. 2.2.1 Equivalent Series Resistance (ESR)
      2. 2.2.2 Equivalent Series Inductance (ESL)
      3. 2.2.3 Leakage Resistance
      4. 2.2.4 Dielectric Absorption (Soakage)
    3. 2.3 Inductors
      1. 2.3.1 Direct Current Resistance (DCR)
      2. 2.3.2 Parasitic Capacitance
      3. 2.3.3 Core Losses (Magnetic Parasitics)
    4. 2.4 Summary of Discrete Component EMI Considerations
    5. 2.5 Design Deficiencies
    6. 2.6 Sources Specific to MCUs
      1. 2.6.1 Clock Circuits and Oscillators
    7. 2.7 Other Common Sources
      1. 2.7.1 High-Speed Digital Buses
      2. 2.7.2 I/O Output Transitions
      3. 2.7.3 Floating Components
      4. 2.7.4 External Environmental Sources
  6. 3Mitigation Techniques to Minimize EMI and Optimize Board Performance
    1. 3.1 Power Supply Capacitor Selection and Placement
    2. 3.2 Capacitor Placement
    3. 3.3 Layer Stack-Up Optimization
      1. 3.3.1 Good Stack-Up Traits
      2. 3.3.2 Stitching and Shielding Optimization Techniques
    4. 3.4 Trace Routing
    5. 3.5 Passive Pi Filtering
    6. 3.6 Shielding, Grounding, and Cable Boundaries
    7. 3.7 Transient and ESD Current Paths
  7. 4EMC Verification and Troubleshooting
    1. 4.1 Emissions and Immunity as Port Problems
    2. 4.2 Pre-Compliance Measurement Toolkit
    3. 4.3 A Frequency-to-Structure Debug Method
    4. 4.4 Interpreting Common Spectral Signatures
    5. 4.5 Integrated Design Review Checklist
  8. 5Conclusion

Good Stack-Up Traits

  • At least one uninterrupted ground plane for four or more layers.
  • High-speed outer-layer microstrips referenced to the nearest solid ground plane.
  • High-speed inner-layer striplines sandwiched between reference planes when emissions must be minimized.
  • Thin dielectric between signal and reference plane for tighter field coupling and lower loop inductance.
  • Power planes adjacent to ground planes so plane capacitance and decoupling work together.
  • No routing over ground-plane slots, large voids, anti-pad fields, or split boundaries.

Plane splitting is often overused. Separating analog and digital copper can make sense for low-level measurement regions, but cutting the reference under a fast signal is typically worse than sharing a continuous plane with disciplined placement. The safer pattern is often a single solid ground plane, physical partitioning of noisy and quiet circuits, and controlled single-point or boundary treatment only where current paths are understood.

Another stack up and layer setup method to remove “fringing fields” is often referred to as the 20-H Rule. The 20-H rule proposes recessing a power plane from a ground-plane edge by roughly twenty times the dielectric separation H to reduce edge fringing. The rule can be a useful geometric heuristic when plane-pair edge radiation is a known contributor. The 20-H rule is not a substitute for a close plane pair, local decoupling, continuous references, or control of cable common-mode current. Modern boards must validate the benefit against stack-up, power distribution, and manufacturing constraints rather than apply the rule automatically.

MSPM0 MSPM33 Example of Fringe
                    Electromagnetic Emission Fields Figure 3-7 Example of Fringe Electromagnetic Emission Fields