LOG114
- Advantages:
- Tiny for high density systems
- Precision on one supply
- Fast over eight decades
- Fully-tested function
- Two scaling amplifiers
- Wide input dynamic range: eight decades, 100pA to 10mA
- 2.5V reference
- Stable over temperature
- Low quiescent current: 10mA
- Dual or single supply: ±5V, 5V
- Package: Small QFN-16 (4mm × 4mm)
- Specified temperature range: −5°C to 75°C
The LOG114 is specifically designed for measuring low-level and wide dynamic range currents in communications, lasers, medical, and industrial systems. The device computes the logarithm or log-ratio of an input current or voltage relative to a reference current or voltage (logarithmic transimpedance amplifier).
High precision is verified over a wide dynamic range of input signals on either bipolar (±5V) or single (5V) supply. Special temperature drift compensation circuitry is included on-chip. In log-ratio applications, the signal current can be from a high impedance source such as a photodiode or resistor in series with a low impedance voltage source. The reference current is provided by a resistor in series with a precision internal voltage reference, photo diode, or active current source.
The output signal at VLOGOUT has a scale factor of 0.375V/decade of input current, which limits the output so that the output fits within a 5V or 10V range. The output can be scaled and offset with one of the available additional amplifiers, so the output matches a wide variety of ADC input ranges. Stable DC performance allows accurate measurement of low-level signals over a wide temperature range. The LOG114 is specified over a −5°C to 75°C temperature range and can operate from −40°C to 85°C.
기술 자료
| 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | LOG114 Single-Supply, High-Speed, Precision Logarithmic Amplifier datasheet (Rev. C) | PDF | HTML | 2025/12/10 |
| EVM User's guide | LOG114EVM User Guide | 2011/09/29 |
설계 및 개발
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| 패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
|---|---|---|
| VQFN (RGV) | 16 | Ultra Librarian |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치