The LMG3522R030-Q1
GaN FET with integrated driver and protections is targeting switch-mode power converters and
enables designers to achieve new levels of power density and efficiency.
The LMG3522R030-Q1
integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated
precision gate bias results in higher switching SOA compared to discrete silicon gate
drivers. This integration, combined with TIs low-inductance package, delivers clean
switching and minimal ringing in hard-switching power supply topologies. Adjustable gate
drive strength allows control of the slew rate from 20V/ns to
150V/ns, which can be used to actively control EMI and optimize switching performance.
Advanced power management features include
digital temperature reporting and fault
detection.
The temperature of the GaN FET is reported through a variable duty cycle PWM output, which
simplifies managing device loading. Faults reported include overtemperature, overcurrent,
and UVLO monitoring.
The LMG3522R030-Q1
GaN FET with integrated driver and protections is targeting switch-mode power converters and
enables designers to achieve new levels of power density and efficiency.
The LMG3522R030-Q1
integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated
precision gate bias results in higher switching SOA compared to discrete silicon gate
drivers. This integration, combined with TIs low-inductance package, delivers clean
switching and minimal ringing in hard-switching power supply topologies. Adjustable gate
drive strength allows control of the slew rate from 20V/ns to
150V/ns, which can be used to actively control EMI and optimize switching performance.
Advanced power management features include
digital temperature reporting and fault
detection.
The temperature of the GaN FET is reported through a variable duty cycle PWM output, which
simplifies managing device loading. Faults reported include overtemperature, overcurrent,
and UVLO monitoring.