Aerospace & defense – Technical documents
Radiation handbook for electronics
Our radiation handbook for electronics is your comprehensive guide to radiation effects for electronics. Building on decades of knowledge from TI’s expert teams, this 100+ page e-book features the latest design considerations for engineers who work on space, industrial and/or terrestrial applications. Regardless of your design experience, you will:
- Learn about radiation environments, their effects on IC devices and how to mitigate them
- Discover testing, procedures and requirements needed for radiation qualification
- Understand the benefits of using Texas Instruments’ portfolio of space-grade integrated circuits
Still deciding if it's right for you? Preview the radiation handbook now.
Radiation handbook for electronics
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About the authors
Robert Baumann, TI fellow (emeritus), chief technologist
Robert discovered reaction of 10B with low-energy cosmic neutrons in specific IC layers was a dominant reliability risk and developed mitigation schemes directly reducing product failure rates ten-fold. He drove several radiation-effects breakthroughs in the industry, was responsible for development of international standards and changing U.S. export control laws, and a technical leader in various TI Dallas and TI Japan groups during his 29 years at TI. Robert was elected TI and IEEE Fellow, coauthored / presented > 90 papers, two book chapters, and has fifteen U.S. patents. Robert retired from TI in 2018.
Kirby Kruckmeyer, senior member of technical staff
In his nearly 40 years at National Semiconductor/Texas Instruments, Kirby has gained experience in a wide range of semiconductor technology disciplines that have led to his expertise in radiation effects in electronics. His involvement and contributions include wafer processing, semiconductor physics, rad hard processing, ELDRS-free processing, radiation hardness by design and innovative radiation testing techniques.
Additional supporting literature
Product guides
- TI Space Products (Rev. G) (PDF, 5596KB)
- Enhanced Product Selection Guide (Rev. B) (PDF, 531KB)
Getting started
- Understanding quality levels for high reliability-rated components (Rev. A) (PDF, 596KB)
- High Reliability Part Numbering System (Rev. A) (PDF, 326KB)
- DSCC Class Q & V Certification (PDF, 492KB)
- QML flow, its importance, and obtaining lot information (Rev. B) (PDF, 959KB)
- TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (PDF, 613KB)
Application notes
- TI Space Rated Power Solution for Microsemi® RTG4™ FPGA (Rev. A) (PDF, 796KB)
- Use of an LDO as a Load Switch for Space Applications (PDF, 415KB)
- 16 MB Radiation-Hardened SRAM with EDAC to Mitigate Soft Errors (Rev. A) (PDF, 348KB)
- Measuring Die Temperature with Remote Diode Sensing in Space (PDF, 669KB)
- Rad-hardened FDA as Clock Buffer in Communication and Radar Payloads (Rev. A) (PDF, 3779KB)
- Reduce the risk in NewSpace with Space Enhanced Plastic products (PDF, 37KB)
Application note
Showing 3 of 72 results View All 72 Results
| Title | Type | Size (KB) | Date |
|---|---|---|---|
| Precision Current Measurements on High-Voltage Power-Supply Rails (Rev. D) | 412 | 29 Dec 2020 | |
| Powering Sensitive Noise ADC Designs with the TPS62913 Low-Noise Buck Converter | 2758 | 30 Sep 2020 | |
| DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer | 454 | 21 Aug 2020 |
Selection guide
Showing 2 of 2 results
| Title | Type | Size (KB) | Date |
|---|---|---|---|
| Enhanced Product Selection Guide (Rev. B) | 531 | 11 Oct 2019 | |
| TI Space Products (Rev. G) | 5596 | 15 May 2019 |
Radiation & reliability report
Showing 3 of 521 results View Top 100 Results
| Title | Type | Size (KB) | Date |
|---|---|---|---|
| TMP461-SP Total Ionizing Dose (TID) Report (Rev. C) | 1313 | 04 Jan 2021 | |
| Single-Event Effects Test Report for TMP461-SP High-Accuracy Remote and Local (Rev. B) | 3461 | 04 Jan 2021 | |
| LM239A-EP quad differential comparator reliability report (Rev. B) | 587 | 20 Apr 2020 |