Aerospace & defense – Technical documents

Radiation handbook for electronics

Our radiation handbook for electronics is your comprehensive guide to radiation effects for electronics. Building on decades of knowledge from TI’s expert teams, this 100+ page e-book features the latest design considerations for engineers who work on space, industrial and/or terrestrial applications.Regardless of your design experience, you will:

  • Learn about radiation environments, their effects on IC devices and how to mitigate them
  • Discover testing, procedures and requirements needed for radiation qualification
  • Understand the benefits of using Texas Instruments’ portfolio of space-grade integrated circuit 

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Radiation handbook for electronics

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About the authors

Robert Baumann, TI fellow (emeritus), chief technologist

Robert discovered reaction of 10B with low-energy cosmic neutrons in specific IC layers was a dominant reliability risk and developed mitigation schemes directly reducing product failure rates ten-fold. He drove several radiation-effects breakthroughs in the industry, was responsible for development of international standards and changing U.S. export control laws, and a technical leader in various TI Dallas and TI Japan groups during his 29 years at TI. Robert was elected TI and IEEE Fellow, coauthored / presented >  90 papers, two book chapters, and has fifteen U.S. patents. Robert retired from TI in 2018.

Robert Baumann

Kirby Kruckmeyer, senior member of technical staff

In his nearly 40 years at National Semiconductor/Texas Instruments, Kirby has gained experience in a wide range of semiconductor technology disciplines that have led to his expertise in radiation effects in electronics.  His involvement and contributions include wafer processing, semiconductor physics, rad hard processing, ELDRS-free processing, radiation hardness by design and innovative radiation testing techniques.

Kirby Kruckmeyer

Additional supporting literature

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Application notes

Showing 3 of 71 results     View All 71 Results   

Size (KB)
DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer PDF 454 21 Aug 2020
LDO Noise Demystified (Rev. B) PDF 845 18 Aug 2020
Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form PDF 386 18 May 2020

Selection guides

Showing 2 of 2 results    

Size (KB)
Enhanced Product Selection Guide (Rev. B) PDF 531 11 Oct 2019
TI Space Products (Rev. G) PDF 5596 15 May 2019

Radiation & Reliability reports

Showing 3 of 521 results     View Top 100 Results   

Size (KB)
LM239A-EP quad differential comparator reliability report (Rev. B) PDF 587 20 Apr 2020
Single-Event Effects Test Report for TMP461-SP High-Accuracy Remote and Local (Rev. A) PDF 3128 12 Feb 2020
SN74LVC1G04MDBVREP Reliability Report (Rev. A) PDF 89 28 Jan 2020