DLP7000UV

ACTIVO

DMD tipo A UV 2xLVDS XGA 0.7 DLP®

Detalles del producto

Illumination wavelength (min) (nm) 363 Illumination wavelength (max) (nm) 420 Micromirror array size 1024 x 768 Chipset family DLP7000UV, DLPA200, DLPC410, DLPLCR70UVEVM, DLPLCRC410EVM, DLPR410 Pattern rate, binary (max) (Hz) 32552 Pixel data rate (max) (Gbpp) 25.2 Micromirror pitch (mm) 0.0136 Component type DMD Rating Catalog Display resolution (max) 1024 x 768 (XGA) Pattern rate, 8-bit (max) (Hz) 4069 Micromirror array orientation Orthogonal Micromirror driver support External Thermal dissipation (°C/W) 0.9 Operating temperature range (°C) 20 to 30
Illumination wavelength (min) (nm) 363 Illumination wavelength (max) (nm) 420 Micromirror array size 1024 x 768 Chipset family DLP7000UV, DLPA200, DLPC410, DLPLCR70UVEVM, DLPLCRC410EVM, DLPR410 Pattern rate, binary (max) (Hz) 32552 Pixel data rate (max) (Gbpp) 25.2 Micromirror pitch (mm) 0.0136 Component type DMD Rating Catalog Display resolution (max) 1024 x 768 (XGA) Pattern rate, 8-bit (max) (Hz) 4069 Micromirror array orientation Orthogonal Micromirror driver support External Thermal dissipation (°C/W) 0.9 Operating temperature range (°C) 20 to 30
DLP-TYPEA.7 (FLP) 203 1290.32 mm² 40.64 x 31.75
  • 0.7-inch diagonal micromirror array
    • 1024 × 768 array of aluminum, micrometer-sized mirrors
    • 13.68-µm micromirror pitch
    • ±12° micromirror tilt angle (Relative to Flat State)
    • Designed for corner illumination
  • Designed for use with UV light (363 to 420 nm):
    • Window transmission 98% (single pass, through two window surfaces)
    • Micromirror reflectivity 88%
    • Array diffraction efficiency 85%
    • Array fill factor 92% (nominal)
  • Two 16-bit, low-voltage Differential Signaling (LVDS) double data rate (DDR) input data buses
  • Up to 400-MHz input data clock rate
  • 40.64-mm by 31.75-mm by 6.0-mm package footprint
  • Hermetic package
  • 0.7-inch diagonal micromirror array
    • 1024 × 768 array of aluminum, micrometer-sized mirrors
    • 13.68-µm micromirror pitch
    • ±12° micromirror tilt angle (Relative to Flat State)
    • Designed for corner illumination
  • Designed for use with UV light (363 to 420 nm):
    • Window transmission 98% (single pass, through two window surfaces)
    • Micromirror reflectivity 88%
    • Array diffraction efficiency 85%
    • Array fill factor 92% (nominal)
  • Two 16-bit, low-voltage Differential Signaling (LVDS) double data rate (DDR) input data buses
  • Up to 400-MHz input data clock rate
  • 40.64-mm by 31.75-mm by 6.0-mm package footprint
  • Hermetic package

DLP7000UV is a digitally controlled MEMS (micro-electromechanical system) spatial light modulator (SLM). When coupled to an appropriate optical system, the DLP7000UV can be used to modulate the amplitude, direction, and/or phase of incoming light.

The DLP7000UV digital micromirror device (DMD) is an addition to the DLP Discovery™ 4100 platform, which enables very fast pattern rates combined with high performance spatial light modulation operating beyond the visible spectrum into the UVA spectrum (363 nm to 420 nm). The DLP7000UV DMD is designed with a special window that is optimized for UV transmission. The DLP Discovery 4100 platform also provides the highest level of individual micromirror control with the option for random row addressing. Combined with a hermetic package, the unique capability and value offered by DLP7000UV makes it well suited to support a wide variety of industrial, medical, and advanced display applications.

The DLP7000UV DMD with a hermetic package is sold with a dedicated DLPC410 controller for high speed pattern rates of >32000 Hz (1-bit binary) and >1900 Hz (8-bit gray), one DLPR410 (DLP Discovery 4100 Configuration PROM), and one DLPA200 (DMD micromirror driver).

DLP7000UV is a digitally controlled MEMS (micro-electromechanical system) spatial light modulator (SLM). When coupled to an appropriate optical system, the DLP7000UV can be used to modulate the amplitude, direction, and/or phase of incoming light.

The DLP7000UV digital micromirror device (DMD) is an addition to the DLP Discovery™ 4100 platform, which enables very fast pattern rates combined with high performance spatial light modulation operating beyond the visible spectrum into the UVA spectrum (363 nm to 420 nm). The DLP7000UV DMD is designed with a special window that is optimized for UV transmission. The DLP Discovery 4100 platform also provides the highest level of individual micromirror control with the option for random row addressing. Combined with a hermetic package, the unique capability and value offered by DLP7000UV makes it well suited to support a wide variety of industrial, medical, and advanced display applications.

The DLP7000UV DMD with a hermetic package is sold with a dedicated DLPC410 controller for high speed pattern rates of >32000 Hz (1-bit binary) and >1900 Hz (8-bit gray), one DLPR410 (DLP Discovery 4100 Configuration PROM), and one DLPA200 (DMD micromirror driver).

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Documentación técnica

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Tipo Título Fecha
* Data sheet DLP7000UV 0.7XGA 2xLVDS UV Type A DMD datasheet (Rev. E) 18 feb 2021
* Errata DLP® Products Advisory for the DLPR410 and DLPR910 Devices PDF | HTML 16 feb 2023
Application note Digital Micromirror Device Thermal Considerations Including Pulsed Optical Sources (Rev. B) PDF | HTML 04 abr 2024
Application note DMD Optical Efficiency for Visible Wavelengths (Rev. B) PDF | HTML 10 abr 2023
Application note Wavelength Transmittance Considerations for DLP DMD Windows (Rev. E) 17 dic 2019
Application note System Design Considerations Using TI DLP® Technology in UVA (363 – 420 nm) (Rev. A) 02 oct 2019
Application note Mounting Hardware and Quick Reference Guide for DLP® Advanced Light Control DMDs (Rev. A) 27 nov 2018
Application note DMD 101: Introduction to Digital Micromirror Device (DMD) Technology (Rev. B) 23 feb 2018
Solution guide TI DLP Technology for 3D Printing (Rev. E) 08 abr 2016
More literature TI DLP Technology for Lithography (Rev. E) 16 mar 2016
Technical article Printing up the future of innovation with direct imaging lithography PDF | HTML 29 dic 2015
Technical article From 3D Printing to Lithography, TI DLP® Ultraviolet Chipsets Provide Flexible Sol PDF | HTML 27 ago 2015
White paper Using Lasers With DLP DMD Technology 13 jun 2013
Application note DLP System Optics Application Note 20 jul 2010

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

DLPLCR70UVEVM — Placa de evaluación DLP7000UV de DMD

This DLP evaluation module (EVM) houses DLP7000UV, a 0.7 UV XGA 2xLVDS Type A DMD intended for applications using 363 – 420 nm ultraviolet (UV) illumination sources.
Guía del usuario: PDF | HTML
Placa de evaluación

DLPLCRC410EVM — Módulo de evaluación DLPLCRC410

The DLPLCRC410EVM, paired with one of five other DMD-based EVMs, is an evaluation platform exhibiting advanced light control for applications like lithography, 3D Printing (SLS and SLA), Machine Vision, and Marking and Coding. This EVM enables evaluations of new customer illumination sources, (...)
Guía del usuario: PDF | HTML
Placa de evaluación

DLI-3P-DLI41XX — Kits de desarrollo DLi D4100, D4120 y D4130 para chipsets DLP Discovery

DLi kits for DLP® Discovery™ chipsets (DLPC410 with DLP7000, DLP7000UV, DLP9500 or DLP9500UV DMDs) support custom interface development for industrial and medical systems and instrumentation. Choose among kit options based on desired hardware and software support. DLi4120 kits include (...)
Guía del usuario: PDF | HTML
Placa de evaluación

VIALUX-3P-SUPER-410 — Módulos V ViALUX SuperSpeed para DLPC410

ViALUX’ SuperSpeed V-Modules provide complete subsystems containing a controller board for DLPC410, a digital micromirror device (DLP650LNIR, DLP7000, DLP7000UV, DLP9500, DLP9500UV or .96 WUXGA DMD) and ALP-4 controller suite software. The industrial grade modules support high-performance (...)

Desde: ViALUX
Placa de evaluación

WDST-3P-W4100 — Kit de desarrollo de alta velocidad Wintech W4100

The Wintech W4100 development kit provides users with an alternative to Texas Instruments DLP® Discovery™ 4100 development platform. It utilizes the same FPGA platform and same data interfaces for frame rates up to 32,552 Hz and grayscale operation. The W4100 is compatible with the (...)
Módulo óptico

DLP-OMM-SEARCH — Herramientas de búsqueda de productos de terceros DLP®

To best meet your design needs and accelerate your time-to-market, DLP® Products works with a variety of third parties to help with everything from optical modules and hardware design to specialty software and other production services. Download one or both search tools listed below to quickly (...)

Software de aplicación y estructura

VIALUX-3P-ALP-4 — Paquete de software de controlador ViALUX ALP-4.1 para módulo de evaluación DLPLCRC410

ViALUX’ ALP-4.1 is an accessory software package compatible with the DLPLCRC410 evaluation module from Texas Instruments. It supports the built-in hardware components and contains the corresponding driver and controller firmware as well as ViALUX’ FPGA logic design for the EVM board. (...)
Desde: ViALUX
Modelo de simulación

DLP7000 IBIS Model

DLPC062.ZIP (32 KB) - IBIS Model
Herramienta de diseño

DLI-3P-ACCESSORIES — Accesorios y conjuntos DLi para productos DLP®

Digital Light Innovations (DLi) offers accessories, boards, and assemblies for development and production with DLP® Products. Examples include DMD controller boards, DMD board assemblies, flex cables, DMD mounting hardware assemblies, LED driver boards, and LED & fiber illumination assemblies.
  • (...)
Herramienta de simulación

DLPR410-IBIS — Modelo IBIS DLPR410

IBIS file for the DLPR410 PROM device which supports the DLPC410, DLP650LNIR, DLP7000, DLP7000UV, DLP9500 and DLP9500UV.
Desde: Xilinx
Paquete Pasadores Descargar
DLP-TYPEA.7 (FLP) 203 Ver opciones

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

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