Wireline test (LAN, DSL, cable)

Test & measurement se wireline test (LAN, DSL, cable) integrated circuits and reference designsintegrated circuits and reference designs


Wide bandwidth, high dynamic range frontend with low-noise clock is critical for analyzing the amplitude and timing of the local area network (LAN) / wide area network (WAN) signals. Our integrated circuits and reference designs help you design high-performance data acquisition and arbitrary waveform generation frontend for LAN/WAN test equipment.

    High-performing wireline test (LAN, digital subscriber line (DSL), cable) equipment often requires:

  • High-speed data converters that help with timing and noise margin measurement.
  • Low-phase noise clocks for improved timing margins and jitter measurement.
  • Efficient power supply that minimizes board area and improves thermal performance.
  • Low external machine interface (EMI) power architecture that improves system sensitivity and dynamic range.
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Technical documentation

Application notes & user guides

Application Notes (2)

Title Type Size (KB) Date
PDF 6.09 MB 08 Aug 2017
PDF 70 KB 26 Apr 2013

User Guides (1)

Title Type Size (KB) Date
pdf 1.96 MB 20 Sep 2018

Technical articles

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