It is recommended to perform thermal simulations at the system level
with the worst case device power consumption.
| NO. |
PARAMETER |
DESCRIPTION |
ANB PACKAGE °C/W(1)(2) |
AIR FLOW (m/s)(3) |
| T1 |
RΘJC |
Junction-to-case |
5.2 |
N/A |
| T2 |
RΘJB |
Junction-to-board |
9.4 |
N/A |
| T3 |
RΘJA |
Junction-to-free
air |
22.2 |
0 |
| T4 |
Junction-to-moving air |
17.4 |
1 |
| T5 |
16.3 |
2 |
| T6 |
15.6 |
3 |
| T7 |
ΨJT |
Junction-to-package top |
0.09 |
0 |
| T8 |
0.18 |
1 |
| T9 |
0.24 |
2 |
| T10 |
0.28 |
3 |
| T11 |
ΨJB |
Junction-to-board |
9.3 |
0 |
| T12 |
8.8 |
1 |
| T13 |
8.6 |
2 |
| T14 |
8.5 |
3 |
(1) °C/W = degrees Celsius per watt.
(2) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/JEDEC standards:
- JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
- JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
- JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-9, Test Boards for Area Array Surface Mount Packages
(3) m/s = meters per second.