SPRUI30H November 2015 – May 2024 DRA745 , DRA746 , DRA750 , DRA756
Test registers are available to comply with the SD Host Controller Specification. This feature is useful to generate interrupts manually for driver debugging.
The force event register (MMCHS_FE) is used to control the error status and error interrupt status for Auto CMD12 and Auto CMD23.
The system test register (MMCHS_SYSTEST) is used to control the signals that connect to I/O pins when the module is configured in the system test mode (the MMCHS_CON[4] MODE bit = 1) for boundary connectivity verification.
The MMCHS_HCTL[7] CDSS and MMCHS_HCTL[6] CDTL bits enable manual control of MMCHS_PSTATE[16] CINS and interrupt generating indicated in MMCHS_STAT[7] CREM and MMCHS_STAT[6] CINS.