TIDUA05B June   2015  – March 2025

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1 System Description
    1. 1.1 Design Overview
    2. 1.2 Analog Sin/Cos Incremental Encoder
      1. 1.2.1 Sin/Cos Encoder Output Signals
      2. 1.2.2 Sin/Cos Encoder Electrical Parameter Examples
    3. 1.3 Method to Calculate High-Resolution Position With Sin/Cos Encoders
      1. 1.3.1 Theoretical Approach
        1. 1.3.1.1 Overview
        2. 1.3.1.2 Coarse Resolution Angle Calculation
        3. 1.3.1.3 Fine Resolution Angle Calculation
        4. 1.3.1.4 Interpolated High-Resolution Angle Calculation
        5. 1.3.1.5 Practical Implementaion for Non-Ideal Synchronization
        6. 1.3.1.6 Resolution, Accuracy, and Speed Considerations
    4. 1.4 Sin/Cos Encoder Parameters Impact on Analog Circuit Specification
      1. 1.4.1 Analog Signal Chain Design Consideration for Phase Interpolation
      2. 1.4.2 Comparator Function System Design for Incremental Count
  8. 2 Design Features
    1. 2.1 Sin/Cos Encoder Interface
    2. 2.2 Host Processor Interface
    3. 2.3 Evaluation Firmware
    4. 2.4 Power Management
    5. 2.5 EMC Immunity
  9. 3 Block Diagram
  10. 4 Circuit Design and Component Selection
    1. 4.1 Analog Signal Chain
      1. 4.1.1 High-Resolution Signal Path With 16-Bit Dual Sampling ADC
        1. 4.1.1.1 Component Selection
        2. 4.1.1.2 Input Signal Termination and Protection
        3. 4.1.1.3 Differential Amplifier THS4531A and 16-Bit ADC ADS8354
      2. 4.1.2 Analog Signal Path With Single-Ended Output for MCU With Embedded ADC
      3. 4.1.3 Comparator Subsystem for Digital Signals A, B, and R
        1. 4.1.3.1 Non-Inverting Comparator With Hysteresis
    2. 4.2 Power Management
      1. 4.2.1 24-V Input to 6-V Intermediate Rail
      2. 4.2.2 Encoder Supply
      3. 4.2.3 Signal Chain Power Supply 5 V and 3.3 V
    3. 4.3 Host Processor Interface
      1. 4.3.1 Signal Description
      2. 4.3.2 High-Resolution Path Using 16-Bit Dual ADC ADS8354 With Serial Output
        1. 4.3.2.1 ADS8354 Input Full Scale Range Output Data Format
        2. 4.3.2.2 ADS8354 Serial Interface
        3. 4.3.2.3 ADS8354 Conversion Data Read
        4. 4.3.2.4 ADS8354 Register Configuration
    4. 4.4 Encoder Connector
    5. 4.5 Design Upgrades
  11. 5 Software Design
    1. 5.1 Overview
    2. 5.2 C2000 Piccolo Firmware
    3. 5.3 User Interface
  12. 6 Getting Started
    1. 6.1 TIDA-00176 PCB Overview
    2. 6.2 Connectors and Jumper Settings
      1. 6.2.1 Connector and Jumpers Overview
      2. 6.2.2 Default Jumper Configuration
    3. 6.3 Design Evaluation
      1. 6.3.1 Prerequisites
      2. 6.3.2 Hardware Setup
      3. 6.3.3 Software Setup
      4. 6.3.4 User Interface
  13. 7 Test Results
    1. 7.1 Analog Performance Tests
      1. 7.1.1 High-Resolution Signal Path
        1. 7.1.1.1 Bode Plot of Analog Path from Encoder Connector to ADS8354 Input
        2. 7.1.1.2 Performance Plots (DFT) for Entire High-Resulation Signal Path
        3. 7.1.1.3 Background on AC Performance Definitions With ADCs
      2. 7.1.2 Differential to Single-Ended Analog Signal Path
      3. 7.1.3 Comparator Subsystem With Digital Output Signals ATTL, BTTL, and RTTL
    2. 7.2 Power Supply Tests
      1. 7.2.1 24-V DC/DC Input Supply
        1. 7.2.1.1 Load-Line Regulation
        2. 7.2.1.2 Output Voltage Ripple
        3. 7.2.1.3 Switching Node and Switching Frequency
        4. 7.2.1.4 Efficiency
        5. 7.2.1.5 Bode Plot
        6. 7.2.1.6 Thermal Plot
      2. 7.2.2 Encoder Power Supply Output Voltage
      3. 7.2.3 5-V and 3.3-V Point-of-Load
    3. 7.3 System Performance
      1. 7.3.1 Sin/Cos Encoder Output Signal Emulation
        1. 7.3.1.1 One Period (Incremental Phase) Test
        2. 7.3.1.2 One Mechanical Revolution Test at Maximum Speed
    4. 7.4 Sin/Cos Encoder System Tests
      1. 7.4.1 Zero Index Marker R
      2. 7.4.2 Functional System Tests
    5. 7.5 EMC Test Result
      1. 7.5.1 Test Setup
      2. 7.5.2 IEC-61000-4-2 ESD Test Results
      3. 7.5.3 IEC-61000-4-4 EFT Test Results
      4. 7.5.4 IEC-61000-4-5 Surge Test Results
  14. 8 Design Files
    1. 8.1 Schematics
    2. 8.2 Bill of Materials
    3. 8.3 PCB Layout Guidelines
      1. 8.3.1 PCB Layer Plots
    4. 8.4 Altium Project
    5. 8.5 Gerber Files
    6. 8.6 Software Files
  15. 9 References
  16. 10About the Author
    1.     Recognition
  17. 11Revision History

7.1.2 Differential to Single-Ended Analog Signal Path

Using the dual channel signal generator two coupled sine waves (same amplitude, same frequency, with a 90-degree phase shift among them) are generated and applied to the analog differential signals A+, A– and B+, B– using the J9 connector. Two differential probes are used to acquire the differential signals applied in input, while two single-ended probes are connected to the single-ended analog outputs A and B of the analog path, on connector J6, pin 18 and pin 20, respectively.

The amplitude of the outputs versus the inputs are measured in this way; at the same time, the phase shift between the differential inputs and the respective single ended output are measured. In this way, a Bode plot of the analog signal conditioning path could be calculated.

TIDA-00176 Transfer Function of Differential to Single-Ended Analog Signal Path — Channel A and BFigure 7-11 Transfer Function of Differential to Single-Ended Analog Signal Path — Channel A and B

The same measurements have been performed on the marker signal (R+/R–). Note that the phase of the R signal is less than the equivalent for A and B since the output has been measured at the input to the comparator. The decoupling filter here has a five times higher cut-off frequency (R = 20 Ω, C = 2.2 nF) versus the output filter for A and B (R = 100 Ω, C = 2.2 nF).

TIDA-00176 Transfer Function of Differential to Single-Ended Index Marker RFigure 7-12 Transfer Function of Differential to Single-Ended Index Marker R