TIDUA05B June   2015  – March 2025

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1 System Description
    1. 1.1 Design Overview
    2. 1.2 Analog Sin/Cos Incremental Encoder
      1. 1.2.1 Sin/Cos Encoder Output Signals
      2. 1.2.2 Sin/Cos Encoder Electrical Parameter Examples
    3. 1.3 Method to Calculate High-Resolution Position With Sin/Cos Encoders
      1. 1.3.1 Theoretical Approach
        1. 1.3.1.1 Overview
        2. 1.3.1.2 Coarse Resolution Angle Calculation
        3. 1.3.1.3 Fine Resolution Angle Calculation
        4. 1.3.1.4 Interpolated High-Resolution Angle Calculation
        5. 1.3.1.5 Practical Implementaion for Non-Ideal Synchronization
        6. 1.3.1.6 Resolution, Accuracy, and Speed Considerations
    4. 1.4 Sin/Cos Encoder Parameters Impact on Analog Circuit Specification
      1. 1.4.1 Analog Signal Chain Design Consideration for Phase Interpolation
      2. 1.4.2 Comparator Function System Design for Incremental Count
  8. 2 Design Features
    1. 2.1 Sin/Cos Encoder Interface
    2. 2.2 Host Processor Interface
    3. 2.3 Evaluation Firmware
    4. 2.4 Power Management
    5. 2.5 EMC Immunity
  9. 3 Block Diagram
  10. 4 Circuit Design and Component Selection
    1. 4.1 Analog Signal Chain
      1. 4.1.1 High-Resolution Signal Path With 16-Bit Dual Sampling ADC
        1. 4.1.1.1 Component Selection
        2. 4.1.1.2 Input Signal Termination and Protection
        3. 4.1.1.3 Differential Amplifier THS4531A and 16-Bit ADC ADS8354
      2. 4.1.2 Analog Signal Path With Single-Ended Output for MCU With Embedded ADC
      3. 4.1.3 Comparator Subsystem for Digital Signals A, B, and R
        1. 4.1.3.1 Non-Inverting Comparator With Hysteresis
    2. 4.2 Power Management
      1. 4.2.1 24-V Input to 6-V Intermediate Rail
      2. 4.2.2 Encoder Supply
      3. 4.2.3 Signal Chain Power Supply 5 V and 3.3 V
    3. 4.3 Host Processor Interface
      1. 4.3.1 Signal Description
      2. 4.3.2 High-Resolution Path Using 16-Bit Dual ADC ADS8354 With Serial Output
        1. 4.3.2.1 ADS8354 Input Full Scale Range Output Data Format
        2. 4.3.2.2 ADS8354 Serial Interface
        3. 4.3.2.3 ADS8354 Conversion Data Read
        4. 4.3.2.4 ADS8354 Register Configuration
    4. 4.4 Encoder Connector
    5. 4.5 Design Upgrades
  11. 5 Software Design
    1. 5.1 Overview
    2. 5.2 C2000 Piccolo Firmware
    3. 5.3 User Interface
  12. 6 Getting Started
    1. 6.1 TIDA-00176 PCB Overview
    2. 6.2 Connectors and Jumper Settings
      1. 6.2.1 Connector and Jumpers Overview
      2. 6.2.2 Default Jumper Configuration
    3. 6.3 Design Evaluation
      1. 6.3.1 Prerequisites
      2. 6.3.2 Hardware Setup
      3. 6.3.3 Software Setup
      4. 6.3.4 User Interface
  13. 7 Test Results
    1. 7.1 Analog Performance Tests
      1. 7.1.1 High-Resolution Signal Path
        1. 7.1.1.1 Bode Plot of Analog Path from Encoder Connector to ADS8354 Input
        2. 7.1.1.2 Performance Plots (DFT) for Entire High-Resulation Signal Path
        3. 7.1.1.3 Background on AC Performance Definitions With ADCs
      2. 7.1.2 Differential to Single-Ended Analog Signal Path
      3. 7.1.3 Comparator Subsystem With Digital Output Signals ATTL, BTTL, and RTTL
    2. 7.2 Power Supply Tests
      1. 7.2.1 24-V DC/DC Input Supply
        1. 7.2.1.1 Load-Line Regulation
        2. 7.2.1.2 Output Voltage Ripple
        3. 7.2.1.3 Switching Node and Switching Frequency
        4. 7.2.1.4 Efficiency
        5. 7.2.1.5 Bode Plot
        6. 7.2.1.6 Thermal Plot
      2. 7.2.2 Encoder Power Supply Output Voltage
      3. 7.2.3 5-V and 3.3-V Point-of-Load
    3. 7.3 System Performance
      1. 7.3.1 Sin/Cos Encoder Output Signal Emulation
        1. 7.3.1.1 One Period (Incremental Phase) Test
        2. 7.3.1.2 One Mechanical Revolution Test at Maximum Speed
    4. 7.4 Sin/Cos Encoder System Tests
      1. 7.4.1 Zero Index Marker R
      2. 7.4.2 Functional System Tests
    5. 7.5 EMC Test Result
      1. 7.5.1 Test Setup
      2. 7.5.2 IEC-61000-4-2 ESD Test Results
      3. 7.5.3 IEC-61000-4-4 EFT Test Results
      4. 7.5.4 IEC-61000-4-5 Surge Test Results
  14. 8 Design Files
    1. 8.1 Schematics
    2. 8.2 Bill of Materials
    3. 8.3 PCB Layout Guidelines
      1. 8.3.1 PCB Layer Plots
    4. 8.4 Altium Project
    5. 8.5 Gerber Files
    6. 8.6 Software Files
  15. 9 References
  16. 10About the Author
    1.     Recognition
  17. 11Revision History

2.2 Host Processor Interface

The high-resolution path for signals A+, A– and B+, B– features a high-speed, high-resolution dual 16-bit simultaneous sampling ADC with differential input and SPI output. The main features of this functional block are outlined in Table 2-2.

Table 2-2 16-Bit High-Resolution Channel With ADC and SPI Output
PARAMETERTYPICAL VALUECOMMENT
Gain A, B5.0 (0.1%)Matched single package gain setting registers (0.1%)
Gain drift A, B2 ppm//°CMatched single package resistors
Offset, A, B< 10 LSB (@ 16-bit)Uncalibrated
Offset drift, A, B< 0.15 LSB/°C
Bandwidth (–3 dB)≥500 kHz
Quantization16-bitFSR = ±5 V (ADS8354)
Drop-in compatible 14- or 12-bit versions available
Sampling frequencyUp to 700 kSPS
Data output format A, B16-bit two’s complementary
Serial interface (SPI slave)3.3 V, up to 24-Mhz SPI clockDual 16-bit data per SPI frame

The parallel, second path for the signals A+, A– and B+ offers a single-ended analog output for A and B with a 1.65-V bias voltage to interface to an external dual S/H ADC, which is for example embedded in microcontrollers like a C2000 Piccolo.

Table 2-3 Analog Channel With Single-Ended Analog Output
PARAMETERTYPICAL VALUECOMMENT
Single ended analog output A and B0-3.3 V, 1.65-V bias voltage [50 ppm/K]Drop-in compatible 1.5-V reference available to match ADC with 0-3-V input and 1.5-V bias.
Gain (A,B)1.66 (0.1%)Adjustable, 0.1% resistors recommended
Offset (A,B)< 1 mVUncalibrated
Offset drift (A,B)< 2 µV/°C
Bandwidth (–3 dB)~ 500 kHzAdjustable LP filter for bandwidth adjustment

The comparator block features high-speed, low-propagation delay comparators with an adjustable 100-mV hysteresis for better noise immunity to converts the analog signals A, B, and R to 3.3-V TTL.

Table 2-4 Comparators
PARAMETERTYPICAL VALUECOMMENT
Digital output signals A, B, and R3.3-V TTL
Hysteresis~160 mV (±80 mV)For increased noise immunity, adjustable through feedback resistor change
Propagation delay~ 40 nsLow propagation delay
Maximum phase delay (propagation delay and hysteresis)< 60°at 0.3 VPP, 500-kHz input