TIDUA05B June   2015  – March 2025

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1 System Description
    1. 1.1 Design Overview
    2. 1.2 Analog Sin/Cos Incremental Encoder
      1. 1.2.1 Sin/Cos Encoder Output Signals
      2. 1.2.2 Sin/Cos Encoder Electrical Parameter Examples
    3. 1.3 Method to Calculate High-Resolution Position With Sin/Cos Encoders
      1. 1.3.1 Theoretical Approach
        1. 1.3.1.1 Overview
        2. 1.3.1.2 Coarse Resolution Angle Calculation
        3. 1.3.1.3 Fine Resolution Angle Calculation
        4. 1.3.1.4 Interpolated High-Resolution Angle Calculation
        5. 1.3.1.5 Practical Implementaion for Non-Ideal Synchronization
        6. 1.3.1.6 Resolution, Accuracy, and Speed Considerations
    4. 1.4 Sin/Cos Encoder Parameters Impact on Analog Circuit Specification
      1. 1.4.1 Analog Signal Chain Design Consideration for Phase Interpolation
      2. 1.4.2 Comparator Function System Design for Incremental Count
  8. 2 Design Features
    1. 2.1 Sin/Cos Encoder Interface
    2. 2.2 Host Processor Interface
    3. 2.3 Evaluation Firmware
    4. 2.4 Power Management
    5. 2.5 EMC Immunity
  9. 3 Block Diagram
  10. 4 Circuit Design and Component Selection
    1. 4.1 Analog Signal Chain
      1. 4.1.1 High-Resolution Signal Path With 16-Bit Dual Sampling ADC
        1. 4.1.1.1 Component Selection
        2. 4.1.1.2 Input Signal Termination and Protection
        3. 4.1.1.3 Differential Amplifier THS4531A and 16-Bit ADC ADS8354
      2. 4.1.2 Analog Signal Path With Single-Ended Output for MCU With Embedded ADC
      3. 4.1.3 Comparator Subsystem for Digital Signals A, B, and R
        1. 4.1.3.1 Non-Inverting Comparator With Hysteresis
    2. 4.2 Power Management
      1. 4.2.1 24-V Input to 6-V Intermediate Rail
      2. 4.2.2 Encoder Supply
      3. 4.2.3 Signal Chain Power Supply 5 V and 3.3 V
    3. 4.3 Host Processor Interface
      1. 4.3.1 Signal Description
      2. 4.3.2 High-Resolution Path Using 16-Bit Dual ADC ADS8354 With Serial Output
        1. 4.3.2.1 ADS8354 Input Full Scale Range Output Data Format
        2. 4.3.2.2 ADS8354 Serial Interface
        3. 4.3.2.3 ADS8354 Conversion Data Read
        4. 4.3.2.4 ADS8354 Register Configuration
    4. 4.4 Encoder Connector
    5. 4.5 Design Upgrades
  11. 5 Software Design
    1. 5.1 Overview
    2. 5.2 C2000 Piccolo Firmware
    3. 5.3 User Interface
  12. 6 Getting Started
    1. 6.1 TIDA-00176 PCB Overview
    2. 6.2 Connectors and Jumper Settings
      1. 6.2.1 Connector and Jumpers Overview
      2. 6.2.2 Default Jumper Configuration
    3. 6.3 Design Evaluation
      1. 6.3.1 Prerequisites
      2. 6.3.2 Hardware Setup
      3. 6.3.3 Software Setup
      4. 6.3.4 User Interface
  13. 7 Test Results
    1. 7.1 Analog Performance Tests
      1. 7.1.1 High-Resolution Signal Path
        1. 7.1.1.1 Bode Plot of Analog Path from Encoder Connector to ADS8354 Input
        2. 7.1.1.2 Performance Plots (DFT) for Entire High-Resulation Signal Path
        3. 7.1.1.3 Background on AC Performance Definitions With ADCs
      2. 7.1.2 Differential to Single-Ended Analog Signal Path
      3. 7.1.3 Comparator Subsystem With Digital Output Signals ATTL, BTTL, and RTTL
    2. 7.2 Power Supply Tests
      1. 7.2.1 24-V DC/DC Input Supply
        1. 7.2.1.1 Load-Line Regulation
        2. 7.2.1.2 Output Voltage Ripple
        3. 7.2.1.3 Switching Node and Switching Frequency
        4. 7.2.1.4 Efficiency
        5. 7.2.1.5 Bode Plot
        6. 7.2.1.6 Thermal Plot
      2. 7.2.2 Encoder Power Supply Output Voltage
      3. 7.2.3 5-V and 3.3-V Point-of-Load
    3. 7.3 System Performance
      1. 7.3.1 Sin/Cos Encoder Output Signal Emulation
        1. 7.3.1.1 One Period (Incremental Phase) Test
        2. 7.3.1.2 One Mechanical Revolution Test at Maximum Speed
    4. 7.4 Sin/Cos Encoder System Tests
      1. 7.4.1 Zero Index Marker R
      2. 7.4.2 Functional System Tests
    5. 7.5 EMC Test Result
      1. 7.5.1 Test Setup
      2. 7.5.2 IEC-61000-4-2 ESD Test Results
      3. 7.5.3 IEC-61000-4-4 EFT Test Results
      4. 7.5.4 IEC-61000-4-5 Surge Test Results
  14. 8 Design Files
    1. 8.1 Schematics
    2. 8.2 Bill of Materials
    3. 8.3 PCB Layout Guidelines
      1. 8.3.1 PCB Layer Plots
    4. 8.4 Altium Project
    5. 8.5 Gerber Files
    6. 8.6 Software Files
  15. 9 References
  16. 10About the Author
    1.     Recognition
  17. 11Revision History

7.5.2 IEC-61000-4-2 ESD Test Results

Figure 7-38 shows the ESD test setup. The ESD strike was applied to the SubD-15 female connector’s shield. The shield was also connected to Earth and the Sin/Cos encoder was connected through a 1-m shielded twisted pairs cable.

TIDA-00176 IEC61000-4-2 ESD Test Setup for TIDA-00176Figure 7-38 IEC61000-4-2 ESD Test Setup for TIDA-00176

Table 7-10 shows the complete ESD test results for contact and air discharge at voltage levels, which also exceed the requirements per IEC618000-3. This is marked accordingly.

Table 7-10 IEC-61000-4-2 ESD Test Results for TIDA-00176
PHENOMENONBASIC STANDARDLEVELTIDA-00176 CONNECTORACHIEVED PERFORMANCE CRITERION(1)COMMENT
ESDIEC61000-4-2±4-kV contact dischargeSubD-15B
ESDIEC61000-4-2±6-kV contact dischargeSubD-15BNot required per IEC61800-3
ESDIEC61000-4-2±8-kV contact dischargeSubD-15BNot required per IEC61800-3
ESDIEC61000-4-2±8-kV air dischargeSubD-15B
ESDIEC61000-4-2±15-kV air dischargeSubD-15BNot required per IEC61800-3
(1) At least Class B was achieved because any angle measured during the ESD test did not deviate more than 0.1 degrees from the reference angle. This was smaller than the incremental line count resolution. The angle errors within each range are listed in Table 7-9. For class A, see Table 7-7, note 1.
Table 7-11 IEC-61000-4-2 ESD Angle Error Distribution During Entire Test
ERROR COUNTERANGULAR ERROR RANGE (DEGREE)OCCURRENCE
@ 4-kV CD		OCCURRENCE
@ 6-kV CD		OCCURRENCE
@ 8-kV CD
Error Range 1>1.0000
Error Range 20.18 ≤ Error < 1.0000
Error Range 30.1 ≤ Error < 0.18000
Error Range 40.01 ≤ Error < 0.1123
Error Range 50.001 ≤ Error < 0.010131878

The angle before and after the ESD tests did not differ more than 0.0005 degrees, which was within normal distribution at a fixed angle. For example, the angle was 80.0272 degree prior to the 6-kV CD ESD test and 80.0274 degrees after the ESD test, which was within standard distribution at fixed angle.