TIDUA05B June 2015 – March 2025
Figure 4-1 provides and overview on the analog signal chain sub-system and the comparator subsystem. For the analog signal chain, two paths are implemented:
The dual analog path offers the option to either test the design with the onboard 16-bit dual ADC as part of the high-resolution path, or use the analog differential to single-ended path with an MCU with embedded ADC. Additionally the analog path, since decoupled through a buffer from the high-resolution path, ensures an ideal decoupling of the comparator path. This avoids x-talk into the high-resolution analog path when switching the output level during sine and cosine zero crossing.
Another use case would use both paths. One path would have improved noise immunity with a reduced bandwidth to filter out HF noise, while the other path would have offer standard bandwidth up to maximum speed. The lower bandwidth with improved noise immunity would be dedicated to the high-resolution
16-bit ADC, while the other path with standard bandwidth would be connected to the MCU with embedded ADC. The interpolated phase (arc tangent) would then be taken from the high-resolution path when the motor speed is low (below the configured cut-off frequency), while at higher speed the interpolated phase from the other path would be used. The host processor will decide which angle to use pending motor speed.
The comparator sub-system will generate TTL level outputs for signals A, B, and R, at a very low-propagation delay. Each sub-system is explained in the following sections.
Figure 4-1 Analog Signal Chain