TIDUA05B June   2015  – March 2025

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1 System Description
    1. 1.1 Design Overview
    2. 1.2 Analog Sin/Cos Incremental Encoder
      1. 1.2.1 Sin/Cos Encoder Output Signals
      2. 1.2.2 Sin/Cos Encoder Electrical Parameter Examples
    3. 1.3 Method to Calculate High-Resolution Position With Sin/Cos Encoders
      1. 1.3.1 Theoretical Approach
        1. 1.3.1.1 Overview
        2. 1.3.1.2 Coarse Resolution Angle Calculation
        3. 1.3.1.3 Fine Resolution Angle Calculation
        4. 1.3.1.4 Interpolated High-Resolution Angle Calculation
        5. 1.3.1.5 Practical Implementaion for Non-Ideal Synchronization
        6. 1.3.1.6 Resolution, Accuracy, and Speed Considerations
    4. 1.4 Sin/Cos Encoder Parameters Impact on Analog Circuit Specification
      1. 1.4.1 Analog Signal Chain Design Consideration for Phase Interpolation
      2. 1.4.2 Comparator Function System Design for Incremental Count
  8. 2 Design Features
    1. 2.1 Sin/Cos Encoder Interface
    2. 2.2 Host Processor Interface
    3. 2.3 Evaluation Firmware
    4. 2.4 Power Management
    5. 2.5 EMC Immunity
  9. 3 Block Diagram
  10. 4 Circuit Design and Component Selection
    1. 4.1 Analog Signal Chain
      1. 4.1.1 High-Resolution Signal Path With 16-Bit Dual Sampling ADC
        1. 4.1.1.1 Component Selection
        2. 4.1.1.2 Input Signal Termination and Protection
        3. 4.1.1.3 Differential Amplifier THS4531A and 16-Bit ADC ADS8354
      2. 4.1.2 Analog Signal Path With Single-Ended Output for MCU With Embedded ADC
      3. 4.1.3 Comparator Subsystem for Digital Signals A, B, and R
        1. 4.1.3.1 Non-Inverting Comparator With Hysteresis
    2. 4.2 Power Management
      1. 4.2.1 24-V Input to 6-V Intermediate Rail
      2. 4.2.2 Encoder Supply
      3. 4.2.3 Signal Chain Power Supply 5 V and 3.3 V
    3. 4.3 Host Processor Interface
      1. 4.3.1 Signal Description
      2. 4.3.2 High-Resolution Path Using 16-Bit Dual ADC ADS8354 With Serial Output
        1. 4.3.2.1 ADS8354 Input Full Scale Range Output Data Format
        2. 4.3.2.2 ADS8354 Serial Interface
        3. 4.3.2.3 ADS8354 Conversion Data Read
        4. 4.3.2.4 ADS8354 Register Configuration
    4. 4.4 Encoder Connector
    5. 4.5 Design Upgrades
  11. 5 Software Design
    1. 5.1 Overview
    2. 5.2 C2000 Piccolo Firmware
    3. 5.3 User Interface
  12. 6 Getting Started
    1. 6.1 TIDA-00176 PCB Overview
    2. 6.2 Connectors and Jumper Settings
      1. 6.2.1 Connector and Jumpers Overview
      2. 6.2.2 Default Jumper Configuration
    3. 6.3 Design Evaluation
      1. 6.3.1 Prerequisites
      2. 6.3.2 Hardware Setup
      3. 6.3.3 Software Setup
      4. 6.3.4 User Interface
  13. 7 Test Results
    1. 7.1 Analog Performance Tests
      1. 7.1.1 High-Resolution Signal Path
        1. 7.1.1.1 Bode Plot of Analog Path from Encoder Connector to ADS8354 Input
        2. 7.1.1.2 Performance Plots (DFT) for Entire High-Resulation Signal Path
        3. 7.1.1.3 Background on AC Performance Definitions With ADCs
      2. 7.1.2 Differential to Single-Ended Analog Signal Path
      3. 7.1.3 Comparator Subsystem With Digital Output Signals ATTL, BTTL, and RTTL
    2. 7.2 Power Supply Tests
      1. 7.2.1 24-V DC/DC Input Supply
        1. 7.2.1.1 Load-Line Regulation
        2. 7.2.1.2 Output Voltage Ripple
        3. 7.2.1.3 Switching Node and Switching Frequency
        4. 7.2.1.4 Efficiency
        5. 7.2.1.5 Bode Plot
        6. 7.2.1.6 Thermal Plot
      2. 7.2.2 Encoder Power Supply Output Voltage
      3. 7.2.3 5-V and 3.3-V Point-of-Load
    3. 7.3 System Performance
      1. 7.3.1 Sin/Cos Encoder Output Signal Emulation
        1. 7.3.1.1 One Period (Incremental Phase) Test
        2. 7.3.1.2 One Mechanical Revolution Test at Maximum Speed
    4. 7.4 Sin/Cos Encoder System Tests
      1. 7.4.1 Zero Index Marker R
      2. 7.4.2 Functional System Tests
    5. 7.5 EMC Test Result
      1. 7.5.1 Test Setup
      2. 7.5.2 IEC-61000-4-2 ESD Test Results
      3. 7.5.3 IEC-61000-4-4 EFT Test Results
      4. 7.5.4 IEC-61000-4-5 Surge Test Results
  14. 8 Design Files
    1. 8.1 Schematics
    2. 8.2 Bill of Materials
    3. 8.3 PCB Layout Guidelines
      1. 8.3.1 PCB Layer Plots
    4. 8.4 Altium Project
    5. 8.5 Gerber Files
    6. 8.6 Software Files
  15. 9 References
  16. 10About the Author
    1.     Recognition
  17. 11Revision History

7.5 EMC Test Result

The TIDA-00176 TI design has been tested for tested for IEC61000-4-2, 4-4, and 4-5 (ESD, EFT, and Surge) with test levels and performance criterion specified in the standard IEC 61800-3 "EMC immunity requirements and specific test methods applicable in adjustable speed, electrical-power drive systems".

The design is compliant to these standards and exceeds the voltage requirements according to
IEC61800-3 EMC immunity requirements. A summary is shown in the below tables and more details in the following chapters.

The performance criterion A is often customer specific and the expected accuracy is depending system requirements. Refer to Section 7.5.1 for details on test specification details.

Table 7-7 IEC618000-3 EMC Immunity Requirements for Second Environment and Measured Voltage Levels and Class
REQUIREMENTSTIDA-00176 MEASUREMENTS
PORTPHENOMENONBASIC STANDARDLEVELPERFORMANCE
(ACCEPTANCE) CRITERION		LEVELPERFORMANCE
(ACHIEVED) CRITERION(1)		TEST
Enclosure portsESDIEC61000-4-2±4-kV CD or 8-kV AD, if CD not possibleB±8-kV CDBPASS
(EXCEED)
Ports for control lines and DC auxiliary supplies <60 VFast transient Burst (EFT)IEC61000-4-4±2-kV/5-kHz capacitive clampB±4 kVBPASS
(EXCEED)
Surge 1,2/50 µs, 8/20 µsIEC61000-4-5±1 kV. Since shielded cable >20 m, direct coupling to shield (2 Ω/500 A)B±1 kVBPASS
(1) Class A is considered when the difference between the measured angle and the initial mechanical reference position during the EMC event was always less than the incremental angle accuracy. The incremental line accuracy is 360/N degrees. For test a Sin/Cos encoder with 2000 line counts was used (HEIDENHAIN ROD480), where the incremental resolution equals
0.18 degrees.

The performance (acceptance) criterion is defined, as follows:

Table 7-8 Performance Criterion
PERFORMANCE (ACCEPTANCE) CRITERIONDESCRIPTION
AThe module shall continue to operate as intended. No loss of function or performance even during the test.
BTemporary degradation of performance is accepted. After the test, the module shall continue to operate as intended without manual intervention.
CDuring the test, loss of functions accepted, but no destruction of hardware or software. After the test, the module shall continue to operate as intended automatically, after manual restart, or power off, or power on.