SLYY234 December   2024 AMC0106M05 , AMC0106M25 , AMC0136 , AMC0311D , AMC0311S , AMC0386 , AMC0386-Q1 , AMC1100 , AMC1106M05 , AMC1200 , AMC1200-Q1 , AMC1202 , AMC1203 , AMC1204 , AMC1211-Q1 , AMC1300 , AMC1300B-Q1 , AMC1301 , AMC1301-Q1 , AMC1302-Q1 , AMC1303M2510 , AMC1304L25 , AMC1304M25 , AMC1305M25 , AMC1305M25-Q1 , AMC1306M05 , AMC1306M25 , AMC1311 , AMC1311-Q1 , AMC131M03 , AMC1336 , AMC1336-Q1 , AMC1350 , AMC1350-Q1 , AMC23C12 , AMC3301 , AMC3330 , AMC3330-Q1

 

  1.   1
  2.   Introduction
  3.   Introduction to Isolated Signal Chain
    1.     Comparing Isolated Amplifiers and Isolated Modulators
      1.      Abstract
      2.      Introduction to Isolated Amplifiers
      3.      Introduction to Isolated Modulators
      4.      Performance Comparison Between Isolated Amplifiers and Isolated Modulators
      5.      Isolated Modulators in Traction Inverters
      6.      Isolated Amplifier and Modulator Recommendations
      7.      Conclusion
    2.     TI’s First Isolated Amplifiers With Ultra-Wide Creepage and Clearance
      1.      Application Brief
  4.   Selection Trees
  5.   Current Sensing
    1.     Shunt Resistor Selection for Isolated Data Converters
      1.      17
    2.     Design considerations for isolated current sensing
      1.      19
      2.      Conclusion
      3.      References
      4.      Related Websites
    3.     Isolated Current-Sensing Circuit With ±50-mV Input and Single-Ended Output
      1.      24
    4.     Isolated Current-Sensing Circuit With ±50-mV Input and Differential Output
      1.      26
    5.     Isolated Current-Sensing Circuit With ±250-mV Input Range and Single-Ended Output Voltage
      1.      Design Goals
      2.      Design Description
      3.      Design Notes
      4.      Design Steps
      5.      Design Simulations
      6.      DC Simulation Results
      7.      Closed-Loop AC Simulation Results
      8.      Transient Simulation Results
      9.      Design References
      10.      Design Featured Isolated Amplifier
      11.      Design Alternate Isolated Amplifier
    6.     Isolated current-measurement circuit with ±250-mV input and differential output
      1.      Design Goals
      2.      Design Description
      3.      Design Notes
      4.      Design Steps
      5.      Design Simulations
      6.      DC Simulation Results
      7.      Closed Loop AC Simulation Results
      8.      Transient Simulation Results
      9.      Design References
      10.      Design Featured Op Amp
      11.      Design Alternate Op Amp
    7.     Isolated Overcurrent Protection Circuit
      1.      52
    8.     Interfacing a Differential-Output (Isolated) Amp to a Single-Ended Input ADC
      1.      54
    9.     Utilizing AMC3311 to Power AMC23C11 for Isolated Sensing and Fault Detection
      1.      Application Brief
    10.     Isolated Current-Sensing Circuit With Front-End Gain Stage
      1.      58
    11.     Accuracy Comparison of Isolated Shunt and Closed-Loop Current Sensing
      1.      60
  6.   Voltage Sensing
    1.     Maximizing Power Conversion and Motor Control Efficiency With Isolated Voltage Sensing
      1.      63
      2.      Solutions for high-voltage sensing
      3.      Integrated resistor devices
      4.      Single-ended output devices
      5.      Integrated isolated voltage-sensing use cases
      6.      Conclusion
      7.      Additional resources
    2.     Increased Accuracy and Performance with Integrated High Voltage Resistor Isolated Amplifiers and Modulators
      1.      Abstract
      2.      Introduction
      3.      High Voltage Resistor Isolated Amplifiers and Modulators Advantages
        1.       Space Savings
        2.       Improved Temperature and Lifetime Drift of Integrated HV Resistors
        3.       Accuracy Results
        4.       Fully Integrated Resistors vs. Additional External Resistor Example
        5.       Device Selection Tree and AC/DC Common Use Cases
      4.      Summary
      5.      References
    3.     Isolated Amplifiers With Differential, Single-Ended Fixed Gain and Ratiometric Outputs for Voltage Sensing Applications
      1.      Abstract
      2.      Introduction
      3.      Overview of Differential, Single-Ended Fixed Gain and Ratiometric Outputs
        1.       Isolated Amplifiers with Differential Output
        2.       Isolated Amplifiers With Single-Ended, Fixed-Gain Output
        3.       Isolated Amplifiers With Single-Ended, Ratiometric Output
      4.      Application Examples
        1.       Product Selection Tree
      5.      Summary
      6.      References
    4.     Isolated Voltage-Measurement Circuit With ±250-mV Input and Differential Output
      1.      93
    5.     Split-Tap Connection for Line-to-Line Isolated Voltage Measurement Using AMC3330
      1.      95
    6.     ±12V Voltage Sensing Circuit With an Isolated Amplifier and Pseudo-Differential Input SAR ADC
      1.      97
    7.     ±12-V voltage sensing circuit with an isolated amplifier and differential input SAR ADC
      1.      99
    8.     Isolated Undervoltage and Overvoltage Detection Circuit
      1.      101
    9.     Isolated Zero-Cross Detection Circuit
      1.      103
    10.     ±480V Isolated Voltage-Sensing Circuit With Differential Output
      1.      105
  7.   EMI Performance
    1.     Best in Class Radiated Emissions EMI Performance with Isolated Amplifiers
      1.      Best in Class Radiated Emissions EMI Performance with Isolated Amplifiers
      2.      Introduction
      3.      Current Generation of Texas Instruments Isolated Amplifiers Radiated Emissions Performance
      4.      Previous Generations of Texas Instruments Isolated Amplifiers Radiated Emissions Performance
      5.      Conclusion
      6.      References
    2.     Best Practices to Attenuate AMC3301 Family Radiated Emissions EMI
      1.      Abstract
      2.      Introduction
      3.      Effects of Input Connections on AMC3301 Family Radiated Emissions
      4.      Attenuating AMC3301 Family Radiated Emissions
        1.       Ferrite Beads and Common Mode Chokes
        2.       PCB Schematics and Layout Best Practices for AMC3301 Family
      5.      Using Multiple AMC3301 Devices
        1.       Device Orientation
        2.       PCB Layout Best Practices for Multiple AMC3301
      6.      Conclusion
      7.      AMC3301 Family Table
  8.   End Equipment
    1.     Comparing Shunt- and Hall-Based Isolated Current-Sensing Solutions in HEV/EV
      1.      128
    2.     Design Considerations for Current Sensing in DC EV Charging Applications
      1.      Abstract
      2.      Introduction
        1.       DC Charging Station for Electric Vehicles
        2.       Current-Sensing Technology Selection and Equivalent Model
          1.        Sensing of the Current With Shunt-Based Solution
          2.        Equivalent Model of the Sensing Technology
      3.      Current Sensing in AC/DC Converters
        1.       Basic Hardware and Control Description of AC/DC
          1.        AC Current Control Loops
          2.        DC Voltage Control Loop
        2.       Point A and B – AC/DC AC Phase-Current Sensing
          1.        Impact of Bandwidth
            1.         Steady State Analysis: Fundamental and Zero Crossing Currents
            2.         Transient Analysis: Step Power and Voltage Sag Response
          2.        Impact of Latency
            1.         Fault Analysis: Grid Short-Circuit
          3.        Impact of Gain Error
            1.         Power Disturbance in AC/DC Caused by Gain Error
            2.         AC/DC Response to Power Disturbance Caused by Gain Error
          4.        Impact of Offset
        3.       Point C and D – AC/DC DC Link Current Sensing
          1.        Impact of Bandwidth on Feedforward Performance
          2.        Impact of Latency on Power Switch Protection
          3.        Impact of Gain Error on Power Measurement
            1.         Transient Analysis: Feedforward in Point D
          4.        Impact of Offset
        4.       Summary of Positives and Negatives at Point A, B, C1/2 and D1/2 and Product Suggestions
      4.      Current Sensing in DC/DC Converters
        1.       Basic Operation Principle of Isolated DC/DC Converter With Phase-Shift Control
        2.       Point E, F - DC/DC Current Sensing
          1.        Impact of Bandwidth
          2.        Impact of Gain Error
          3.        Impact of Offset Error
        3.       Point G - DC/DC Tank Current Sensing
        4.       Summary of Sensing Points E, F, and G and Product Suggestions
      5.      Conclusion
      6.      References
    3.     Using isolated comparators for fault detection in electric motor drives
      1.      Introduction
      2.      Introduction to electric motor drives
      3.      Understanding fault events in electric motor drives
      4.      Achieving reliable detection and protection in electric motor drives
      5.      Use case No. 1: Bidirectional in-phase overcurrent detection
      6.      Use case No. 2: DC+ overcurrent detection
      7.      Use case No. 3: DC– overcurrent or short-circuit detection
      8.      Use case No. 4: DC-link (DC+ to DC–) overvoltage and undervoltage detection
      9.      Use case No. 5: IGBT module overtemperature detection
    4.     Discrete DESAT for Opto-Compatible Isolated Gate Driver UCC23513 in Motor Drives
      1.      Abstract
      2.      Introduction
      3.      System Challenge on Isolated Gate Drivers With Integrated DESAT
      4.      System Approach With UCC23513 and AMC23C11
        1.       System Overview and Key Specification
        2.       Schematic Design
          1.        Circuit Schematic
          2.        Configure VCE(DESAT) Threshold and DESAT Bias Current
          3.        DESAT Blanking Time
          4.        DESAT Deglitch Filter
        3.       Reference PCB Layout
      5.      Simulation and Test Results
        1.       Simulation Circuit and Results
          1.        Simulation Circuit
          2.        Simulation Results
        2.       Test Results With 3-Phase IGBT Inverter
          1.        Brake IGBT Test
          2.        Test Results on a 3-Phase Inverter With Phase to Phase Short
      6.      Summary
      7.      References
    5.     Isolated voltage sensing in AC motor drives
      1.      Introduction
      2.      Conclusion
      3.      References
    6.     Achieving High-Performance Isolated Current and Voltage Sensing in Server PSUs
      1.      Application Brief
  9.   Additional Reference Designs/Circuits
    1.     Designing a Bootstrap Charge-Pump Power Supply for an Isolated Amplifier
      1.      Abstract
      2.      Introduction
      3.      Bootstrap Power Supply Design
        1.       Selection of Charge Pump Capacitor
        2.       Simulation in TINA-TI
        3.       Hardware Test with AMC1311-Q1
      4.      Summary
      5.      Reference
    2.     Clock Edge Delay Compensation With Isolated Modulators Digital Interface to MCUs
      1.      Abstract
      2.      Introduction
      3.      Design Challenge With Digital Interface Timing Specifications
      4.      Design Approach With Clock Edge Delay Compensation
        1.       Clock Signal Compensation With Software Configurable Phase Delay
        2.       Clock Signal Compensation With Hardware Configurable Phase Delay
        3.       Clock Signal Compensation by Clock Return
        4.       Clock Signal Compensation by Clock Inversion at the MCU
      5.      Test and Validation
        1.       Test Equipment and Software
        2.       Testing of Clock Signal Compensation With Software Configurable Phase Delay
          1.        Test Setup
          2.        Test Measurement Results
        3.       Testing of Clock Signal Compensation by Clock Inversion at MCU
          1.        Test Setup
          2.        Test Measurement Results
            1.         Test Result – No Clock Inversion of Clock Input at GPIO123
            2.         Test Result – Clock Inversion of Clock Input at GPIO123
        4.       Digital Interface Timing Validation by Calculation Tool
          1.        Digital Interface With No Compensation Method
          2.        Commonly Used Method - Reduction of the Clock Frequency
          3.        Clock Edge Compensation With Software Configurable Phase Delay
      6.      Conclusion
      7.      References
    3.     Utilizing AMC3311 to Power AMC23C11 for Isolated Sensing and Fault Detection
      1.      Application Brief

Design Challenge With Digital Interface Timing Specifications

Isolated Delta-Sigma modulators offer interface options for both an externally and internally generated clock signal with either a CMOS interface or a LVDS interface. For devices with externally-provided clock source, for example AMC1306M25 with CMOS interface or AMC1305L25 with LVDS interface the clock signal is routed from the MCU to the Delta-Sigma modulator’s clock input, whereas for devices with an internally-provided clock source, the output bit-stream is synchronized to the internally generated clock, for exampleAMC1303M2520. There are also isolated Delta-Sigma modulator devices with Manchester coded output bit stream that support single-wire data and clock transfer, for example AMC1306E25. For all isolated Delta-Sigma modulators, the data output of the modulator provides a bit stream of digital ones and zeros that is shifted out synchronous to the clock edge.

Figure 145 shows a simplified example of CMOS interface with 3.3V I/O between the isolated Delta-Sigma modulator AMC1306M25 and a C2000 MCU TMS320F28379D. As the AMC1306M25 requires an externally-provided clock source, the clock signal is generated by the MCU TMS320F28379D and is provided to the Delta-Sigma modulators clock input, CLKIN. In parallel, the generated clock signal is also routed to the clock input to the MCUs Sigma-Delta Filter Module (SDFM) SD1_C1 (GPIO123). Depending on the system design there can be a clock buffer included in the clock interface between the MCU and the isolated Delta-Sigma modulator. The isolated data output DOUT of the Delta-Sigma modulator is directly connected to the MCUs Sigma-Delta Filter Module (SDFM) data input SD1_D1 (GPIO122).

 Simplified AMC1306M25 Digital Interface to TMS320F28379DFigure 145 Simplified AMC1306M25 Digital Interface to TMS320F28379D

Valid communication between the isolated Delta-Sigma modulator and the MCU is described in the respective device data sheets by the setup and hold timing requirements. The setup time is the amount of time that the data signal must be valid and stable prior to a clock signal transition to capture the data signal in the MCU. Hold time is the amount of time that a signal must be held valid and stable after a clock signal transition occurs. Meeting the MCUs setup and hold time requirements is crucial as any violation can cause incorrect data to be captured. Incompatibility between the digital interface setup and hold timing requirements of the isolated Delta-Sigma modulator and the MCU can present a design challenge.

Figure 146 outlines the digital interface timing for setup and hold time of the AMC1306x which supports a recommended clock frequency (CLKIN) from 5 MHz to 21 MHz with a data hold time th(MIN) = 3.5 ns and a data delay time td (MAX) = 15 ns.

 AMC1306x Digital Interface TimingFigure 146 AMC1306x Digital Interface Timing

Figure 147 outlines the timing diagram, of the TMS320F28379D Sigma-Delta Filter Module (SDFM) for Mode 0. The data input at SDx_Dy needs to meet the minimum setup time tsu(SDDV-SDCH)M0 and minimum hold time th(SDCH-SDD)M0 with reference to the rising clock edge of the SDx_Cy signal in the SDFM module.

 TMS320F28379D SDFM Timing Diagram – Mode 0Figure 147 TMS320F28379D SDFM Timing Diagram – Mode 0

For the TMS320F28379D SDFM module in Mode 0, we recommend to use the SDFM operation with qualified GPIO (3-sample window). This mode provides protection against random noise glitches with the input clock signal (SDx_Cy) and data input (SDx_Dy) to avoid false comparator over-current trip and false Sinc filter output. The minimum setup and hold times for a 200 MHz system clock with TMD320F28379D are both 10 ns: tsu (SDDV-SDCH)M0 (MIN) = 10 ns and th(SDCH-SDD)M0 (MIN) = 10 ns.

This creates a design challenge as the AMC1306M25 minimum hold time th(MIN) is 3.5 ns, but 10 ns is required for the SDFM module to maintain correct acquisition at the data input SDx_Dy with reference to the rising clock edge of the SDx_Cy signal.

An additional challenge is that the propagation delay of additional components in the signal chain with the digital interface such as a clock buffer as well as the propagation delay of the clock and data signals introduced by the trace length on the PCB have an impact on the timings between SDx_Cy and SDx_Dy inputs and complicate the correct acquisition timing of the data input.

The same applies to Delta-Sigma modulators with a LVDS interface, such as the AMC1305L25. The only difference to AMC1306M25 Delta-Sigma modulators with CMOS interface type is that additional components like a LVDS driver and receiver are required with the digital signal chain to a MCU with CMOS interface, which contribute to further propagation delays. Figure 148 shows a simplified digital interface between the isolated Delta-Sigma modulator AMC1305L25 with LVDS interface and the MCU TMS320F28379D with CMOS interface.

 AMC1305L25 Digital Interface to TMS320F28379DFigure 148 AMC1305L25 Digital Interface to TMS320F28379D

Figure 149 shows a simplified digital interface of an isolated Delta-Sigma modulator with internally-created clock source AMC1303Mx with CMOS interface to TMS320F28379D with CMOS interface. The internally generated clock signal CLKOUT of the AMC1303Mx is input to the MCUs Sigma-Delta Filter Module (SDFM) SD1_C1 (GPIO123). The isolated data output DOUT of the Delta-Sigma Modulator is directly connected to MCUs data input SD1_D1 (GPIO122) of the SDFM.

 AMC1303M2520 3.3-V CMOS Digital Interface to TMS320F28379DFigure 149 AMC1303M2520 3.3-V CMOS Digital Interface to TMS320F28379D

When using an isolated modulator with an internal clock, the digital interface challenge is limited to the different timing specifications of the isolated Delta-Sigma modulator and the MCUs setup and hold times. The propagation delay of clock and data signals introduced by the trace length on the PCB can be neglected if the clock and data signals are routed at the same length. Typically, the modulator is directly interfaced to the MCU and there’s no need for a buffer or level-shifter, which adds additional propagation delay.

The AMC1303Mx hold time th(MIN) is 7 ns and the delay time td (MAX) is 15 ns for the 10 MHz and 20 MHz clock versions. The challenge is that the AMC1303Mx minimum hold th(MIN) is 7 ns, but 10 ns is required by the SDFM module for correct acquisition of the data input at SDx_Dy without any setup and hold time violations.

For isolated Delta-Sigma modulators with a Manchester encoded bitstream output, e.g. AMC1306E25, data and clock are transferred through a single-wire. So that the setup and hold time requirements of the receiving device versus the modulator clock do not have to be considered.

A commonly used method and compromise to meet the MCUs setup and hold time requirements is to reduce the clock frequency. However, reducing the clock frequency is also reducing the data output rate of the isolated Delta-Sigma modulator and increases the latency of the current measurement. A more suitable method is to use clock edge delay compensation which enables moving the clock edge of the clock signal to an ideal sample point of the data signal to meet the setup and hold timing requirements. By using this method, the clock frequency limitations are eliminated which allows the isolated Delta-Sigma modulator and the system to operate at full performance.