SLYY234 December 2024 AMC0106M05 , AMC0106M25 , AMC0136 , AMC0311D , AMC0311S , AMC0386 , AMC0386-Q1 , AMC1100 , AMC1106M05 , AMC1200 , AMC1200-Q1 , AMC1202 , AMC1203 , AMC1204 , AMC1211-Q1 , AMC1300 , AMC1300B-Q1 , AMC1301 , AMC1301-Q1 , AMC1302-Q1 , AMC1303M2510 , AMC1304L25 , AMC1304M25 , AMC1305M25 , AMC1305M25-Q1 , AMC1306M05 , AMC1306M25 , AMC1311 , AMC1311-Q1 , AMC131M03 , AMC1336 , AMC1336-Q1 , AMC1350 , AMC1350-Q1 , AMC23C12 , AMC3301 , AMC3330 , AMC3330-Q1
The test setup for clock signal compensation by clock inversion at the MCU using the C2000 TMS320F28379D Launchpad is shown in Figure 160. For this measurement two test signals are created by the MCU. One signal is connected to the clock input, SD1_C1, (GPIO123) of the MCUs SDFM and the other signal is connected to the data input, SD1_D1, (GPIO122) of the SDFM.