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THS1206-EP

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Verbessertes Produkt – ADC, 12 Bit, 6 MSPS, vier Kan. (Konfig.), Dsp/Up If, Integ. 16x-Fifo

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THS1206-EP

AKTIV
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Produktdetails

Resolution (Bits) 12 Sample rate (max) (ksps) 6000 Number of input channels 4 Interface type Parallel Architecture Pipeline Input type Differential, Single-ended Multichannel configuration Simultaneous Sampling Rating HiRel Enhanced Product Reference mode External, Internal Input voltage range (max) (V) 4 Input voltage range (min) (V) 1.4 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 186 Analog supply voltage (min) (V) 4.75 Analog supply voltage (max) (V) 5.25 SNR (dB) 69 Digital supply (min) (V) 3 Digital supply (max) (V) 5.25
Resolution (Bits) 12 Sample rate (max) (ksps) 6000 Number of input channels 4 Interface type Parallel Architecture Pipeline Input type Differential, Single-ended Multichannel configuration Simultaneous Sampling Rating HiRel Enhanced Product Reference mode External, Internal Input voltage range (max) (V) 4 Input voltage range (min) (V) 1.4 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 186 Analog supply voltage (min) (V) 4.75 Analog supply voltage (max) (V) 5.25 SNR (dB) 69 Digital supply (min) (V) 3 Digital supply (max) (V) 5.25
TSSOP (DA) 32 89.1 mm² 11 x 8.1
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • High-Speed 6 MSPS ADC
  • 4 Single-Ended or 2 Differential Inputs
  • Simultaneous Sampling of 4 Single-Ended Signals or 2 Differential Signals or Combination of Both
  • Differential Nonlinearity Error: ±1 LSB
  • Integral Nonlinearity Error: ±1.8 LSB
  • Signal-to-Noise and Distortion Ratio: 68 dB at fI = 2 MHz
  • Auto-Scan Mode for 2, 3, or 4 Inputs
  • 3-V or 5-V Digital Interface Compatible
  • Low Power: 216 mW Max
  • 5-V Analog Single Supply Operation
  • Internal Voltage References . . . 50 PPM/°C and ±5% Accuracy
  • Glueless DSP Interface
  • Parallel µC/DSP Interface
  • Integrated FIFO
  • Available in TSSOP Package
  • applications
    • Radar Applications
    • Communications
    • Control Applications
    • High-Speed DSP Front-End
    • Selected Military Applications

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • High-Speed 6 MSPS ADC
  • 4 Single-Ended or 2 Differential Inputs
  • Simultaneous Sampling of 4 Single-Ended Signals or 2 Differential Signals or Combination of Both
  • Differential Nonlinearity Error: ±1 LSB
  • Integral Nonlinearity Error: ±1.8 LSB
  • Signal-to-Noise and Distortion Ratio: 68 dB at fI = 2 MHz
  • Auto-Scan Mode for 2, 3, or 4 Inputs
  • 3-V or 5-V Digital Interface Compatible
  • Low Power: 216 mW Max
  • 5-V Analog Single Supply Operation
  • Internal Voltage References . . . 50 PPM/°C and ±5% Accuracy
  • Glueless DSP Interface
  • Parallel µC/DSP Interface
  • Integrated FIFO
  • Available in TSSOP Package
  • applications
    • Radar Applications
    • Communications
    • Control Applications
    • High-Speed DSP Front-End
    • Selected Military Applications

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The THS1206 is a CMOS, low-power, 12-bit, 6 MSPS analog-to-digital converter (ADC). The speed, resolution, bandwidth, and single-supply operation are suited for applications in radar, imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error correction logic provides for no missing codes over the full operating temperature range. Internal control registers are used to program the ADC into the desired mode. The THS1206 consists of four analog inputs, which are sampled simultaneously. These inputs can be selected individually and configured to single-ended or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to take the load off of the processor connected to the ADC. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.

An external reference can also be chosen to suit the dc accuracy and temperature drift requirements of the application. Two different conversion modes can be selected. In single conversion mode, a single and simultaneous conversion of up to four inputs can be initiated by using the single conversion start signal (CONVST)\. The conversion clock in single conversion mode is generated internally using a clock oscillator circuit. In continuous conversion mode, an external clock signal is applied to the CONV_CLK input of the THS1206. The internal clock oscillator is switched off in continuous conversion mode.

The THS1206 is a CMOS, low-power, 12-bit, 6 MSPS analog-to-digital converter (ADC). The speed, resolution, bandwidth, and single-supply operation are suited for applications in radar, imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error correction logic provides for no missing codes over the full operating temperature range. Internal control registers are used to program the ADC into the desired mode. The THS1206 consists of four analog inputs, which are sampled simultaneously. These inputs can be selected individually and configured to single-ended or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to take the load off of the processor connected to the ADC. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.

An external reference can also be chosen to suit the dc accuracy and temperature drift requirements of the application. Two different conversion modes can be selected. In single conversion mode, a single and simultaneous conversion of up to four inputs can be initiated by using the single conversion start signal (CONVST)\. The conversion clock in single conversion mode is generated internally using a clock oscillator circuit. In continuous conversion mode, an external clock signal is applied to the CONV_CLK input of the THS1206. The internal clock oscillator is switched off in continuous conversion mode.
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Technische Dokumentation

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Top-Dokumentation Typ Titel Format-Optionen Datum
* Data sheet 12-Bit 6 MSPS, Simultaneous Sampling Analog-to-Digital Converters datasheet (Rev. A) 19 Feb 2003
* VID THS1206-EP VID V6203609 21 Jun 2016
* Radiation & reliability report THS1206MDAREP Reliability Report 07 Jan 2013
Application note Noise Analysis for High Speed Op Amps (Rev. A) 17 Jan 2005

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