ADC12DJ3200QML-SP

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Product details

Sample rate (Max) (MSPS) 3200, 6400 Resolution (Bits) 12 Number of input channels 2, 1 Interface type JESD204B Analog input BW (MHz) 7300 Features Ultra High Speed Rating Space Input range (Vp-p) 0.8 Power consumption (Typ) (mW) 3000 Architecture Folding Interpolating SNR (dB) 57.2 ENOB (Bits) 8.9 SFDR (dB) 76 Operating temperature range (C) -55 to 125, 25 to 25 Input buffer Yes
Sample rate (Max) (MSPS) 3200, 6400 Resolution (Bits) 12 Number of input channels 2, 1 Interface type JESD204B Analog input BW (MHz) 7300 Features Ultra High Speed Rating Space Input range (Vp-p) 0.8 Power consumption (Typ) (mW) 3000 Architecture Folding Interpolating SNR (dB) 57.2 ENOB (Bits) 8.9 SFDR (dB) 76 Operating temperature range (C) -55 to 125, 25 to 25 Input buffer Yes
CCGA (NWE) 196 225 mm² 15 x 15 CLGA (ZMX) 196 225 mm² 15 x 15
  • ADC core:
    • 12-Bit resolution
    • Up to 6.4 GSPS in single-channel mode
    • Up to 3.2 GSPS in dual-channel mode
  • Noise floor (no signal, VFS = 1 VPP-DIFF):
    • Dual-channel mode: –149.5 dBFS/Hz
    • Single-channel mode: –152.4 dBFS/Hz
  • Peak noise power ratio (NPR): 45.4 dB
  • Buffered analog inputs with VCMI of 0 V:
    • Analog input bandwidth (–3 dB): 7 GHz
    • Usable input frequency range: >10 GHz
    • Full-scale input voltage (VFS, default): 0.8 VPP
  • Noiseless aperture delay (tAD) adjustment:
    • Precise sampling control: 19-fs step size
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • JESD204B subclass-1 compliant interface:
    • Maximum lane rate: 12.8 Gbps
    • Up to 16 lanes allows reduced lane rate
  • Digital down-converters in dual-channel mode:
    • Real output: DDC bypass or 2x decimation
    • Complex output: 4x, 8x, or 16x decimation
  • Radiation performance:
    • Total Ionizing Dose (TID): 300 krad (Si)
    • Single Event Latchup (SEL): 120 MeV-cm2/mg
    • Single Event Upset (SEU) immune registers
  • Power consumption: 3 W
  • ADC core:
    • 12-Bit resolution
    • Up to 6.4 GSPS in single-channel mode
    • Up to 3.2 GSPS in dual-channel mode
  • Noise floor (no signal, VFS = 1 VPP-DIFF):
    • Dual-channel mode: –149.5 dBFS/Hz
    • Single-channel mode: –152.4 dBFS/Hz
  • Peak noise power ratio (NPR): 45.4 dB
  • Buffered analog inputs with VCMI of 0 V:
    • Analog input bandwidth (–3 dB): 7 GHz
    • Usable input frequency range: >10 GHz
    • Full-scale input voltage (VFS, default): 0.8 VPP
  • Noiseless aperture delay (tAD) adjustment:
    • Precise sampling control: 19-fs step size
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • JESD204B subclass-1 compliant interface:
    • Maximum lane rate: 12.8 Gbps
    • Up to 16 lanes allows reduced lane rate
  • Digital down-converters in dual-channel mode:
    • Real output: DDC bypass or 2x decimation
    • Complex output: 4x, 8x, or 16x decimation
  • Radiation performance:
    • Total Ionizing Dose (TID): 300 krad (Si)
    • Single Event Latchup (SEL): 120 MeV-cm2/mg
    • Single Event Upset (SEU) immune registers
  • Power consumption: 3 W

The ADC12DJ3200QML-SP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from dc to above 10 GHz. In dual-channel mode, the ADC12DJ3200QML-SP can sample up to 3200 MSPS. In single-channel mode, the device can sample up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 7 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ3200QML-SP uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multidevice synchronization. The serial output lanes support up to 12.8 Gbps, and can be configured to trade off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (tAD) adjustment and SYSREF windowing, simplify system design for synthetic aperture radar (SAR) and phased-array MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

The ADC12DJ3200QML-SP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from dc to above 10 GHz. In dual-channel mode, the ADC12DJ3200QML-SP can sample up to 3200 MSPS. In single-channel mode, the device can sample up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 7 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ3200QML-SP uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multidevice synchronization. The serial output lanes support up to 12.8 Gbps, and can be configured to trade off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (tAD) adjustment and SYSREF windowing, simplify system design for synthetic aperture radar (SAR) and phased-array MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

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Technical documentation

Design & development

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Evaluation board

ADC12DJ3200EVM — ADC12DJ3200 12-bit, dual 3.2-GSPS or single 6.4-GSPS, RF-sampling ADC evaluation module

The ADC12DJ3200 evaluation module (EVM) allows for the evaluation of device ADC12DJ3200. The ADC12DJ3200 is a low-power, 12-bit, dual 3.2-GSPS/single 6.4-GSPS, RF-sampling analog-to-digital converter (ADC) with a buffered analog input, integrated digital down converter with programmable NCO and (...)

User guide: PDF
Not available on TI.com
Firmware

TI-JESD204-IP — JESD204 Rapid Design IP for FPGAs connected to TI high-speed data converters

The JESD204 rapid design IP has been designed to enable FPGA engineers to achieve an accelerated path to a working JESD204 system. The IP has been architected in a way that downstream digital processing and other application logic are isolated from most of the performance- and timing-critical (...)
Support software

Xilinx AlphaData Demo (Rev. A)

SLVC806A.ZIP (5958 KB)
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Simulation model

ADC12DJ3200 and ADC12DJ3200QML-SP IBIS and IBIS-AMI Model

SLVMDV3.ZIP (47828 KB) - IBIS-AMI Model
Simulation model

ADC12DJ3200QML-SP S-Parameter Model

SLVMDU7.ZIP (9 KB) - S-Parameter Model
Assembly drawing

ADC12DJ3200QML-EVM Assembly Package

SLVRBF5.ZIP (4838 KB)
Gerber file

ADC12DJ3200EVMCVAL Design Files

SLVC819.ZIP (4838 KB)
Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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CCGA (NWE) 196 View options
CLGA (ZMX) 196 View options

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