The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel,
analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to
4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the
ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic
range and channel isolation over a large input frequency range. The buffered analog input with
on-chip termination provides uniform input impedance across a wide frequency range and minimizes
sample-and-hold glitch energy.
Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to
three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent
frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors
and alarm functions to support external automatic gain control (AGC) algorithms.
The ADC32RF45 supports the JESD204B serial interface with subclass
1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The
device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature
range (–40°C to +85°C).