SPRUJD3A July 2025 – October 2025 F28E120SB , F28E120SC
Table 3-194 lists the memory-mapped registers for the TEST_ERROR_REGS registers. All register offset addresses not listed in Table 3-194 should be considered as reserved locations and the register contents should not be modified.
| Offset | Acronym | Register Name | Write Protection |
|---|---|---|---|
| 0h | CPU_RAM_TEST_ERROR_STS | Ram Test: Error Status Register | |
| 2h | CPU_RAM_TEST_ERROR_STS_CLR | Ram Test: Error Status Clear Register | |
| 4h | CPU_RAM_TEST_ERROR_ADDR | Ram Test: Error address register |
Complex bit access types are encoded to fit into small table cells. Table 3-195 shows the codes that are used for access types in this section.
| Access Type | Code | Description |
|---|---|---|
| Read Type | ||
| R | R | Read |
| R-0 | R -0 | Read Returns 0s |
| Write Type | ||
| W1C | W 1C | Write 1 to clear |
| Reset or Default Value | ||
| -n | Value after reset or the default value | |
| Register Array Variables | ||
| i,j,k,l,m,n | When these variables are used in a register name, an offset, or an address, they refer to the value of a register array where the register is part of a group of repeating registers. The register groups form a hierarchical structure and the array is represented with a formula. | |
| y | When this variable is used in a register name, an offset, or an address it refers to the value of a register array. | |
CPU_RAM_TEST_ERROR_STS is shown in Figure 3-164 and described in Table 3-196.
Return to the Summary Table.
Ram Test: Error Status Register
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
| RESERVED | |||||||
| R-0-0h | |||||||
| 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
| RESERVED | |||||||
| R-0-0h | |||||||
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
| RESERVED | |||||||
| R-0-0h | |||||||
| 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| RESERVED | UNC_ERROR | RESERVED | |||||
| R-0-0h | R-0h | R-0-0h | |||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-2 | RESERVED | R-0 | 0h | Reserved |
| 1 | UNC_ERROR | R | 0h | 0: Indicates that there were no 'un-correctable errors' generated in the RAM/ROM test mode. 1: Indicates that 'un-correctable errors' wer generated in the RAM/ROM test mode. Reset type: SYSRSn |
| 0 | RESERVED | R-0 | 0h | Reserved |
CPU_RAM_TEST_ERROR_STS_CLR is shown in Figure 3-165 and described in Table 3-197.
Return to the Summary Table.
Ram Test: Error Status Clear Register
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
| RESERVED | |||||||
| R-0-0h | |||||||
| 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
| RESERVED | |||||||
| R-0-0h | |||||||
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
| RESERVED | |||||||
| R-0-0h | |||||||
| 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| RESERVED | UNC_ERROR | RESERVED | |||||
| R-0-0h | R-0/W1C-0h | R-0-0h | |||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-2 | RESERVED | R-0 | 0h | Reserved |
| 1 | UNC_ERROR | R-0/W1C | 0h | 0: No effect. 1: Clears the corresponding bit in CPU_RAM_TEST_ERROR_STS register. Reset type: SYSRSn |
| 0 | RESERVED | R-0 | 0h | Reserved |
CPU_RAM_TEST_ERROR_ADDR is shown in Figure 3-166 and described in Table 3-198.
Return to the Summary Table.
Ram Test: Error address register
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| ADDR | |||||||||||||||||||||||||||||||
| R-0h | |||||||||||||||||||||||||||||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-0 | ADDR | R | 0h | Address of the location where error was detected in RAM/ROM test modes. Reset type: SYSRSn |