ADS6122

ACTIVO

Convertidor analógico a digital (ADC) de 12 bits y 65 MSPS

Detalles del producto

Sample rate (max) (Msps) 65 Resolution (Bits) 12 Number of input channels 1 Interface type DDR LVDS, Parallel CMOS Analog input BW (MHz) 500 Features Low Power Rating Catalog Peak-to-peak input voltage range (V) 2 Power consumption (typ) (mW) 285 Architecture Pipeline SNR (dB) 71.8 ENOB (Bits) 11.56 SFDR (dB) 95 Operating temperature range (°C) -40 to 85 Input buffer No
Sample rate (max) (Msps) 65 Resolution (Bits) 12 Number of input channels 1 Interface type DDR LVDS, Parallel CMOS Analog input BW (MHz) 500 Features Low Power Rating Catalog Peak-to-peak input voltage range (V) 2 Power consumption (typ) (mW) 285 Architecture Pipeline SNR (dB) 71.8 ENOB (Bits) 11.56 SFDR (dB) 95 Operating temperature range (°C) -40 to 85 Input buffer No
VQFN (RHB) 32 25 mm² 5 x 5
  • Maximum Sample Rate: 125 MSPS
  • 12-Bit Resolution with No Missing Codes
  • 3.5 dB Coarse Gain and up to 6 dB Programmable Fine Gain for SNR/SFDR Trade-Off
  • Parallel CMOS and Double Data Rate (DDR) LVDS Output Options
  • Supports Sine, LVCMOS, LVPECL, LVDS Clock Inputs and Clock Amplitude Down to 400 mVPP
  • Clock Duty Cycle Stabilizer
  • Internal Reference with Support for External Reference
  • No External Decoupling Required for References
  • Programmable Output Clock Position and Drive Strength to Ease Data Capture
  • 3.3 V Analog and 1.8 V to 3.3 V Digital Supply
  • 32-QFN Package (5 mm × 5 mm)
  • Pin Compatible 12-Bit Family (ADS612X)
  • APPLICATIONS
    • Wireless Communications Infrastructure
    • Software Defined Radio
    • Power Amplifier Linearization
    • 802.16d/e
    • Test and Measurement Instrumentation
    • High Definition Video
    • Medical Imaging
    • Radar Systems
  • Maximum Sample Rate: 125 MSPS
  • 12-Bit Resolution with No Missing Codes
  • 3.5 dB Coarse Gain and up to 6 dB Programmable Fine Gain for SNR/SFDR Trade-Off
  • Parallel CMOS and Double Data Rate (DDR) LVDS Output Options
  • Supports Sine, LVCMOS, LVPECL, LVDS Clock Inputs and Clock Amplitude Down to 400 mVPP
  • Clock Duty Cycle Stabilizer
  • Internal Reference with Support for External Reference
  • No External Decoupling Required for References
  • Programmable Output Clock Position and Drive Strength to Ease Data Capture
  • 3.3 V Analog and 1.8 V to 3.3 V Digital Supply
  • 32-QFN Package (5 mm × 5 mm)
  • Pin Compatible 12-Bit Family (ADS612X)
  • APPLICATIONS
    • Wireless Communications Infrastructure
    • Software Defined Radio
    • Power Amplifier Linearization
    • 802.16d/e
    • Test and Measurement Instrumentation
    • High Definition Video
    • Medical Imaging
    • Radar Systems

ADS6125/ADS6124/ADS6123/ADS6122 (ADS612X) is a family of 12-bit A/D converters with sampling frequencies up to 125 MSPS. It combines high performance and low power consumption in a compact 32 QFN package. Using an internal high bandwidth sample and hold and a low jitter clock buffer helps to achieve high SNR and high SFDR even at high input frequencies.

It features coarse and fine gain options that are used to improve SFDR performance at lower full-scale analog input ranges.

The digital data outputs are either parallel CMOS or DDR LVDS (Double Data Rate). Several features exist to ease data capture such as — controls for output clock position and output buffer drive strength, and LVDS current and internal termination programmability.

The output interface type, gain, and other functions are programmed using a 3-wire serial interface. Alternatively, some of these functions are configured using dedicated parallel pins so that the device comes up in the desired state after power-up.

ADS612X includes internal references, while eliminating the traditional reference pins and associated external decoupling. External reference mode is also supported.

The devices are specified over the industrial temperature range (-40°C to 85°C).

ADS6125/ADS6124/ADS6123/ADS6122 (ADS612X) is a family of 12-bit A/D converters with sampling frequencies up to 125 MSPS. It combines high performance and low power consumption in a compact 32 QFN package. Using an internal high bandwidth sample and hold and a low jitter clock buffer helps to achieve high SNR and high SFDR even at high input frequencies.

It features coarse and fine gain options that are used to improve SFDR performance at lower full-scale analog input ranges.

The digital data outputs are either parallel CMOS or DDR LVDS (Double Data Rate). Several features exist to ease data capture such as — controls for output clock position and output buffer drive strength, and LVDS current and internal termination programmability.

The output interface type, gain, and other functions are programmed using a 3-wire serial interface. Alternatively, some of these functions are configured using dedicated parallel pins so that the device comes up in the desired state after power-up.

ADS612X includes internal references, while eliminating the traditional reference pins and associated external decoupling. External reference mode is also supported.

The devices are specified over the industrial temperature range (-40°C to 85°C).

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Documentación técnica

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Documentación principal Tipo Título Opciones de formato Fecha
* Data sheet 12-BITS, 125/105/80/65 MSPS ADC WITH DDR LVDS and CMOS OUTPUTS datasheet (Rev. A) 04 dic 2007
Application note Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A) 22 may 2015
Application note Why Use Oversampling when Undersampling Can Do the Job? (Rev. A) 19 jul 2013
Application note Band-Pass Filter Design Techniques for High-Speed ADCs 27 feb 2012
Application note Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A) 10 sep 2010
Application note Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio 28 abr 2009
Application note CDCE62005 as Clock Solution for High-Speed ADCs 04 sep 2008
Application note CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters 08 jun 2008
Application note Phase Noise Performance and Jitter Cleaning Ability of CDCE72010 02 jun 2008
Application note QFN Layout Guidelines 28 jul 2006

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

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Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL)/reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

Si tiene alguna pregunta sobre calidad, encapsulados o pedido de productos de TI, consulte el servicio de asistencia de TI. ​​​​​​​​​​​​​​

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